Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer
2000
|
| Schriftenreihe: | Frontiers in electronic testing
17 |
| Schlagworte: | |
| Beschreibung: | XVIII, 690 S. graph. Darst. |
| ISBN: | 0792379918 |
Internformat
MARC
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| 100 | 1 | |a Bushnell, Michael L. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |c Michael L. Bushnell ; Vishwani D. Agrawal |
| 264 | 1 | |a New York, NY |b Springer |c 2000 | |
| 300 | |a XVIII, 690 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-018583560 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
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| author | Bushnell, Michael L. Agrawal, Vishwani D. |
| author_facet | Bushnell, Michael L. Agrawal, Vishwani D. |
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| bvnumber | BV024610824 |
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| ctrlnum | (OCoLC)255206774 (DE-599)BVBBV024610824 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV024610824 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:02:59Z |
| institution | BVB |
| isbn | 0792379918 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018583560 |
| oclc_num | 255206774 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XVIII, 690 S. graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Springer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Bushnell, Michael L. Verfasser aut Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal New York, NY Springer 2000 XVIII, 690 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 17 Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 s VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Agrawal, Vishwani D. Verfasser aut Frontiers in electronic testing 17 (DE-604)BV010836129 17 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Bushnell, Michael L. Agrawal, Vishwani D. Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Frontiers in electronic testing Elektronische Schaltung (DE-588)4113419-9 gnd VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4113419-9 (DE-588)4117388-0 (DE-588)4047610-8 |
| title | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_auth | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_exact_search | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_full | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal |
| title_fullStr | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal |
| title_full_unstemmed | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell ; Vishwani D. Agrawal |
| title_short | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_sort | essentials of electronic testing for digital memory and mixed signal vlsi circuits |
| topic | Elektronische Schaltung (DE-588)4113419-9 gnd VLSI (DE-588)4117388-0 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Elektronische Schaltung VLSI Prüftechnik |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT bushnellmichaell essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits AT agrawalvishwanid essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits |