Mikrometrologie:
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Braunschweig
1983
|
| Schriftenreihe: | PTB-Seminar
50.1983 PTB-Bericht : Opt |
| Beschreibung: | XI, 292 S. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV024567633 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s1983 |||| 00||| undod | ||
| 035 | |a (OCoLC)256236072 | ||
| 035 | |a (DE-599)BVBBV024567633 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 245 | 1 | 0 | |a Mikrometrologie |c Dietrich Hahn ; Dietmar Hoeschen [Hrsg.] |
| 264 | 1 | |a Braunschweig |c 1983 | |
| 300 | |a XI, 292 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a PTB-Seminar |v 50.1983 | |
| 490 | 0 | |a PTB-Bericht : Opt | |
| 700 | 1 | |a Hahn, Dietrich |4 edt | |
| 700 | 1 | |a Hoeschen, Dietmar |4 edt | |
| 940 | 1 | |q TUB-nse | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018541221 | ||
Datensatz im Suchindex
| _version_ | 1804140576924237824 |
|---|---|
| any_adam_object | |
| author2 | Hahn, Dietrich Hoeschen, Dietmar |
| author2_role | edt edt |
| author2_variant | d h dh d h dh |
| author_facet | Hahn, Dietrich Hoeschen, Dietmar |
| building | Verbundindex |
| bvnumber | BV024567633 |
| ctrlnum | (OCoLC)256236072 (DE-599)BVBBV024567633 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00757nam a2200289 cb4500</leader><controlfield tag="001">BV024567633</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1983 |||| 00||| undod</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)256236072</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024567633</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Mikrometrologie</subfield><subfield code="c">Dietrich Hahn ; Dietmar Hoeschen [Hrsg.]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Braunschweig</subfield><subfield code="c">1983</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 292 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">PTB-Seminar</subfield><subfield code="v">50.1983</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">PTB-Bericht : Opt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hahn, Dietrich</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hoeschen, Dietmar</subfield><subfield code="4">edt</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nse</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018541221</subfield></datafield></record></collection> |
| id | DE-604.BV024567633 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:02:11Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018541221 |
| oclc_num | 256236072 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XI, 292 S. |
| psigel | TUB-nse |
| publishDate | 1983 |
| publishDateSearch | 1983 |
| publishDateSort | 1983 |
| record_format | marc |
| series2 | PTB-Seminar PTB-Bericht : Opt |
| spelling | Mikrometrologie Dietrich Hahn ; Dietmar Hoeschen [Hrsg.] Braunschweig 1983 XI, 292 S. txt rdacontent n rdamedia nc rdacarrier PTB-Seminar 50.1983 PTB-Bericht : Opt Hahn, Dietrich edt Hoeschen, Dietmar edt |
| spellingShingle | Mikrometrologie |
| title | Mikrometrologie |
| title_auth | Mikrometrologie |
| title_exact_search | Mikrometrologie |
| title_full | Mikrometrologie Dietrich Hahn ; Dietmar Hoeschen [Hrsg.] |
| title_fullStr | Mikrometrologie Dietrich Hahn ; Dietmar Hoeschen [Hrsg.] |
| title_full_unstemmed | Mikrometrologie Dietrich Hahn ; Dietmar Hoeschen [Hrsg.] |
| title_short | Mikrometrologie |
| title_sort | mikrometrologie |
| work_keys_str_mv | AT hahndietrich mikrometrologie AT hoeschendietmar mikrometrologie |