A reliable optimisation based model parameter extraction: approach for GaAS based field effect transistors using measurement correlated parameter starting values
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Kassel
Kassel Univ. Press
2002
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| Schlagworte: | |
| Beschreibung: | XX, 162 S. graph. Darst. |
| ISBN: | 3933146941 |
Internformat
MARC
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| 100 | 1 | |a Mwema, Wilfred N. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a A reliable optimisation based model parameter extraction |b approach for GaAS based field effect transistors using measurement correlated parameter starting values |c Wilfred N. Mwema |
| 264 | 1 | |a Kassel |b Kassel Univ. Press |c 2002 | |
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| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
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Datensatz im Suchindex
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|---|---|
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| author | Mwema, Wilfred N. |
| author_facet | Mwema, Wilfred N. |
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| author_sort | Mwema, Wilfred N. |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T22:00:56Z |
| institution | BVB |
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| spelling | Mwema, Wilfred N. Verfasser aut A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values Wilfred N. Mwema Kassel Kassel Univ. Press 2002 XX, 162 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Zugl.: Kassel, Univ., Diss., 2002 (DE-588)4113937-9 Hochschulschrift gnd-content |
| spellingShingle | Mwema, Wilfred N. A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values |
| subject_GND | (DE-588)4113937-9 |
| title | A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values |
| title_auth | A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values |
| title_exact_search | A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values |
| title_full | A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values Wilfred N. Mwema |
| title_fullStr | A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values Wilfred N. Mwema |
| title_full_unstemmed | A reliable optimisation based model parameter extraction approach for GaAS based field effect transistors using measurement correlated parameter starting values Wilfred N. Mwema |
| title_short | A reliable optimisation based model parameter extraction |
| title_sort | a reliable optimisation based model parameter extraction approach for gaas based field effect transistors using measurement correlated parameter starting values |
| title_sub | approach for GaAS based field effect transistors using measurement correlated parameter starting values |
| topic_facet | Hochschulschrift |
| work_keys_str_mv | AT mwemawilfredn areliableoptimisationbasedmodelparameterextractionapproachforgaasbasedfieldeffecttransistorsusingmeasurementcorrelatedparameterstartingvalues |