Proceedings: 24 - 26 October 2001, San Francisco, California
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Bibliographic Details
Corporate Author: International Symposium on Defect and Fault Tolerance in VLSI Systems San Francisco, Calif (Author)
Other Authors: Young, Danielle C. (Editor)
Format: Conference Proceeding Book
Language:English
Published: LosAlamitos, Calif. <<[u.a.]>> IEEE Computer Soc. 2001
Subjects:
Physical Description:XIII, 468 S. Ill., graph. Darst.
ISBN:0769512038
0769512046

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