Proceedings of the 2001 International Conference on Microelectronic Test Structures: March 19 - 22, 2001, Kobe, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
IEEE Operations Center
2001
|
| Schlagworte: | |
| Beschreibung: | X, 271 S. Ill., graph. Darst. |
| ISBN: | 0780365119 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024489528 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s2001 ad|| |||| 10||| eng d | ||
| 020 | |a 0780365119 |9 0-7803-6511-9 | ||
| 035 | |a (OCoLC)247897849 | ||
| 035 | |a (DE-599)BVBBV024489528 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-83 | ||
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 111 | 2 | |a International Conference on Microelectronic Test Structures |n 14 |d 2001 |c Kōbe |j Verfasser |0 (DE-588)5531390-5 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the 2001 International Conference on Microelectronic Test Structures |b March 19 - 22, 2001, Kobe, Japan |
| 264 | 1 | |a Piscataway, NJ |b IEEE Operations Center |c 2001 | |
| 300 | |a X, 271 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018464791 | ||
Datensatz im Suchindex
| _version_ | 1804140482540863488 |
|---|---|
| any_adam_object | |
| author_corporate | International Conference on Microelectronic Test Structures Kōbe |
| author_corporate_role | aut |
| author_facet | International Conference on Microelectronic Test Structures Kōbe |
| author_sort | International Conference on Microelectronic Test Structures Kōbe |
| building | Verbundindex |
| bvnumber | BV024489528 |
| classification_rvk | ZN 4030 |
| ctrlnum | (OCoLC)247897849 (DE-599)BVBBV024489528 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00982nam a2200277 c 4500</leader><controlfield tag="001">BV024489528</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s2001 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780365119</subfield><subfield code="9">0-7803-6511-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)247897849</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024489528</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Microelectronic Test Structures</subfield><subfield code="n">14</subfield><subfield code="d">2001</subfield><subfield code="c">Kōbe</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5531390-5</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the 2001 International Conference on Microelectronic Test Structures</subfield><subfield code="b">March 19 - 22, 2001, Kobe, Japan</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE Operations Center</subfield><subfield code="c">2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, 271 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018464791</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV024489528 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:00:41Z |
| institution | BVB |
| institution_GND | (DE-588)5531390-5 |
| isbn | 0780365119 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018464791 |
| oclc_num | 247897849 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | X, 271 S. Ill., graph. Darst. |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | IEEE Operations Center |
| record_format | marc |
| spelling | International Conference on Microelectronic Test Structures 14 2001 Kōbe Verfasser (DE-588)5531390-5 aut Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan Piscataway, NJ IEEE Operations Center 2001 X, 271 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| title_auth | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| title_exact_search | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| title_full | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| title_fullStr | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| title_full_unstemmed | Proceedings of the 2001 International Conference on Microelectronic Test Structures March 19 - 22, 2001, Kobe, Japan |
| title_short | Proceedings of the 2001 International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the 2001 international conference on microelectronic test structures march 19 22 2001 kobe japan |
| title_sub | March 19 - 22, 2001, Kobe, Japan |
| topic_facet | Konferenzschrift |
| work_keys_str_mv | AT internationalconferenceonmicroelectronicteststructureskobe proceedingsofthe2001internationalconferenceonmicroelectronicteststructuresmarch19222001kobejapan |