2000 5th International Workshop on Statistical Metrology: June 11, 2000, Hawaii
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
IEEE Service Center <<[u.a.]>>
2000
|
| Schlagworte: | |
| Beschreibung: | 83 S. graph. Darst. |
| ISBN: | 0780358961 |
Internformat
MARC
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Datensatz im Suchindex
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| author_corporate | International Workshop on Statistical Metrology Honolulu, Hawaii |
| author_corporate_role | aut |
| author_facet | International Workshop on Statistical Metrology Honolulu, Hawaii |
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| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381520287 |
| dewey-search | 621.381520287 |
| dewey-sort | 3621.381520287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| publishDate | 2000 |
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| publisher | IEEE Service Center <<[u.a.]>> |
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| spelling | International Workshop on Statistical Metrology 5 2000 Honolulu, Hawaii Verfasser (DE-588)6028814-0 aut 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii The IEEE Electron Devices Society Two-Thousand 5th International Workshop on Statistical Metrology Piscataway, NJ IEEE Service Center <<[u.a.]>> 2000 83 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-588)1071861417 Konferenzschrift gnd-content IEEE Electron Devices Society Sonstige (DE-588)121920-0 oth |
| spellingShingle | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii |
| subject_GND | (DE-588)1071861417 |
| title | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii |
| title_alt | Two-Thousand 5th International Workshop on Statistical Metrology |
| title_auth | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii |
| title_exact_search | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii |
| title_full | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii The IEEE Electron Devices Society |
| title_fullStr | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii The IEEE Electron Devices Society |
| title_full_unstemmed | 2000 5th International Workshop on Statistical Metrology June 11, 2000, Hawaii The IEEE Electron Devices Society |
| title_short | 2000 5th International Workshop on Statistical Metrology |
| title_sort | 2000 5th international workshop on statistical metrology june 11 2000 hawaii |
| title_sub | June 11, 2000, Hawaii |
| topic_facet | Konferenzschrift |
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