Interferometric metrology: 20 - 21 August 1987, San Diego, California
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Bibliographic Details
Other Authors: Massie, N. A. (Editor)
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 1987
Series:Proceedings / SPIE 816
Critical reviews of optical science and technology
Subjects:
Physical Description:VI, 239 S.

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