Image processing, analysis, measurement, and quality: part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif.
Gespeichert in:
Weitere Verfasser: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Bellingham, Wash.
SPIE
1988
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Schriftenreihe: | Proceedings / SPIE
901 |
Schlagworte: | |
Beschreibung: | VI, 270 S. |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV024461427 | ||
003 | DE-604 | ||
005 | 20090910 | ||
007 | t | ||
008 | 090924s1988 |||| 10||| eng d | ||
035 | |a (OCoLC)916256000 | ||
035 | |a (DE-599)BVBBV024461427 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-83 | ||
245 | 1 | 0 | |a Image processing, analysis, measurement, and quality |b part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. |c Gary W. Hughes ..., ed. |
264 | 1 | |a Bellingham, Wash. |b SPIE |c 1988 | |
300 | |a VI, 270 S. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Proceedings / SPIE |v 901 | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Hughes, Gary W. |4 edt | |
710 | 2 | |a Society for Imaging Science and Technology |e Sonstige |0 (DE-588)5029930-X |4 oth | |
711 | 2 | |a International Symposium and Exposition on Electronic Imaging Devices and Systems |d 1988 |c Los Angeles, Calif. |j Sonstige |0 (DE-588)811963-6 |4 oth | |
810 | 2 | |a SPIE |t Proceedings |v 901 |w (DE-604)BV000010887 |9 901 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-018437756 |
Datensatz im Suchindex
_version_ | 1804140446029447169 |
---|---|
any_adam_object | |
author2 | Hughes, Gary W. |
author2_role | edt |
author2_variant | g w h gw gwh |
author_facet | Hughes, Gary W. |
building | Verbundindex |
bvnumber | BV024461427 |
ctrlnum | (OCoLC)916256000 (DE-599)BVBBV024461427 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01228nam a2200301 cb4500</leader><controlfield tag="001">BV024461427</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1988 |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916256000</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024461427</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Image processing, analysis, measurement, and quality</subfield><subfield code="b">part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif.</subfield><subfield code="c">Gary W. Hughes ..., ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">SPIE</subfield><subfield code="c">1988</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 270 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings / SPIE</subfield><subfield code="v">901</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hughes, Gary W.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Society for Imaging Science and Technology</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)5029930-X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Symposium and Exposition on Electronic Imaging Devices and Systems</subfield><subfield code="d">1988</subfield><subfield code="c">Los Angeles, Calif.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)811963-6</subfield><subfield code="4">oth</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">SPIE</subfield><subfield code="t">Proceedings</subfield><subfield code="v">901</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">901</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018437756</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV024461427 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T22:00:05Z |
institution | BVB |
institution_GND | (DE-588)5029930-X (DE-588)811963-6 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018437756 |
oclc_num | 916256000 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | VI, 270 S. |
publishDate | 1988 |
publishDateSearch | 1988 |
publishDateSort | 1988 |
publisher | SPIE |
record_format | marc |
series2 | Proceedings / SPIE |
spelling | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. Gary W. Hughes ..., ed. Bellingham, Wash. SPIE 1988 VI, 270 S. txt rdacontent n rdamedia nc rdacarrier Proceedings / SPIE 901 (DE-588)1071861417 Konferenzschrift gnd-content Hughes, Gary W. edt Society for Imaging Science and Technology Sonstige (DE-588)5029930-X oth International Symposium and Exposition on Electronic Imaging Devices and Systems 1988 Los Angeles, Calif. Sonstige (DE-588)811963-6 oth SPIE Proceedings 901 (DE-604)BV000010887 901 |
spellingShingle | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. |
subject_GND | (DE-588)1071861417 |
title | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. |
title_auth | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. |
title_exact_search | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. |
title_full | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. Gary W. Hughes ..., ed. |
title_fullStr | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. Gary W. Hughes ..., ed. |
title_full_unstemmed | Image processing, analysis, measurement, and quality part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. Gary W. Hughes ..., ed. |
title_short | Image processing, analysis, measurement, and quality |
title_sort | image processing analysis measurement and quality part of spse s international symposium and exhibition on electronic imaging devices and systems 88 13 15 january 1988 los angeles calif |
title_sub | part of SPSE's International Symposium and Exhibition on Electronic Imaging Devices and Systems '88 ; 13 - 15 January 1988, Los Angeles, Calif. |
topic_facet | Konferenzschrift |
volume_link | (DE-604)BV000010887 |
work_keys_str_mv | AT hughesgaryw imageprocessinganalysismeasurementandqualitypartofspsesinternationalsymposiumandexhibitiononelectronicimagingdevicesandsystems881315january1988losangelescalif AT societyforimagingscienceandtechnology imageprocessinganalysismeasurementandqualitypartofspsesinternationalsymposiumandexhibitiononelectronicimagingdevicesandsystems881315january1988losangelescalif AT internationalsymposiumandexpositiononelectronicimagingdevicesandsystemslosangelescalif imageprocessinganalysismeasurementandqualitypartofspsesinternationalsymposiumandexhibitiononelectronicimagingdevicesandsystems881315january1988losangelescalif |