1998 3rd International Workshop on Statistical Metrology: June 7, 1998, Honolulu
Gespeichert in:
Körperschaften: | , |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Piscataway, NJ
IEEE Service Center
1998
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Schlagworte: | |
Beschreibung: | VI, 121 S. graph. Darst. |
ISBN: | 0780343387 |
Internformat
MARC
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Datensatz im Suchindex
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physical | VI, 121 S. graph. Darst. |
publishDate | 1998 |
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spelling | International Workshop on Statistical Metrology 3 1998 Honolulu, Hawaii Verfasser (DE-588)5327809-4 aut 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu the IEEE Electron Devices Society Piscataway, NJ IEEE Service Center 1998 VI, 121 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-588)1071861417 Konferenzschrift gnd-content IEEE Electron Devices Society Sonstige (DE-588)121920-0 oth International Workshop on Statistical Metrology 3 1998 Honolulu, Hawaii (DE-588)5327809-4 aut Nineteen Hundred and Ninety-Eighth 3rd International Workshop on Statistical Metrology |
spellingShingle | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu |
subject_GND | (DE-588)1071861417 |
title | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu |
title_alt | Nineteen Hundred and Ninety-Eighth 3rd International Workshop on Statistical Metrology |
title_auth | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu |
title_exact_search | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu |
title_full | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu the IEEE Electron Devices Society |
title_fullStr | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu the IEEE Electron Devices Society |
title_full_unstemmed | 1998 3rd International Workshop on Statistical Metrology June 7, 1998, Honolulu the IEEE Electron Devices Society |
title_short | 1998 3rd International Workshop on Statistical Metrology |
title_sort | 1998 3rd international workshop on statistical metrology june 7 1998 honolulu |
title_sub | June 7, 1998, Honolulu |
topic_facet | Konferenzschrift |
work_keys_str_mv | AT internationalworkshoponstatisticalmetrologyhonoluluhawaii 19983rdinternationalworkshoponstatisticalmetrologyjune71998honolulu AT ieeeelectrondevicessociety 19983rdinternationalworkshoponstatisticalmetrologyjune71998honolulu |