Electron and ion microscopy and microanalysis: principles and applications
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Dekker
1982
|
| Ausgabe: | 3. [print.] |
| Schriftenreihe: | Optical engineering
1 |
| Schlagworte: | |
| Beschreibung: | XIV, 793 S. |
| ISBN: | 0824715535 |
Internformat
MARC
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| 100 | 1 | |a Murr, Lawrence E. |d 1939- |e Verfasser |0 (DE-588)141844752 |4 aut | |
| 245 | 1 | 0 | |a Electron and ion microscopy and microanalysis |b principles and applications |c Lawrence E. Murr |
| 250 | |a 3. [print.] | ||
| 264 | 1 | |a New York [u.a.] |b Dekker |c 1982 | |
| 300 | |a XIV, 793 S. | ||
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| 490 | 1 | |a Optical engineering |v 1 | |
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Datensatz im Suchindex
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| author | Murr, Lawrence E. 1939- |
| author_GND | (DE-588)141844752 |
| author_facet | Murr, Lawrence E. 1939- |
| author_role | aut |
| author_sort | Murr, Lawrence E. 1939- |
| author_variant | l e m le lem |
| building | Verbundindex |
| bvnumber | BV024449973 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)833890411 (DE-599)BVBBV024449973 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 3. [print.] |
| format | Book |
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| id | DE-604.BV024449973 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:59:50Z |
| institution | BVB |
| isbn | 0824715535 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018426629 |
| oclc_num | 833890411 |
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| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XIV, 793 S. |
| publishDate | 1982 |
| publishDateSearch | 1982 |
| publishDateSort | 1982 |
| publisher | Dekker |
| record_format | marc |
| series | Optical engineering |
| series2 | Optical engineering |
| spelling | Murr, Lawrence E. 1939- Verfasser (DE-588)141844752 aut Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr 3. [print.] New York [u.a.] Dekker 1982 XIV, 793 S. txt rdacontent n rdamedia nc rdacarrier Optical engineering 1 Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Optical engineering 1 (DE-604)BV001893528 1 |
| spellingShingle | Murr, Lawrence E. 1939- Electron and ion microscopy and microanalysis principles and applications Optical engineering Elektronenmikroskopie (DE-588)4014327-2 gnd Feldionenmikroskopie (DE-588)4153929-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4153929-1 |
| title | Electron and ion microscopy and microanalysis principles and applications |
| title_auth | Electron and ion microscopy and microanalysis principles and applications |
| title_exact_search | Electron and ion microscopy and microanalysis principles and applications |
| title_full | Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr |
| title_fullStr | Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr |
| title_full_unstemmed | Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr |
| title_short | Electron and ion microscopy and microanalysis |
| title_sort | electron and ion microscopy and microanalysis principles and applications |
| title_sub | principles and applications |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Feldionenmikroskopie (DE-588)4153929-1 gnd |
| topic_facet | Elektronenmikroskopie Feldionenmikroskopie |
| volume_link | (DE-604)BV001893528 |
| work_keys_str_mv | AT murrlawrencee electronandionmicroscopyandmicroanalysisprinciplesandapplications |