Surface characterization for computer disks, wafers, and flat panel displays: 28 January 1999, San Jose, California
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1999
|
| Schriftenreihe: | Proceedings of SPIE
3619 |
| Schlagworte: | |
| Beschreibung: | VII, 136 S. Ill., graph. Darst. |
| ISBN: | 0819430897 |
Internformat
MARC
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| 245 | 1 | 0 | |a Surface characterization for computer disks, wafers, and flat panel displays |b 28 January 1999, San Jose, California |c John C. Stover, chair/ed. |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1999 | |
| 300 | |a VII, 136 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 1 | |a Proceedings of SPIE |v 3619 | |
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| 700 | 1 | |a Stover, John C. |4 edt | |
| 830 | 0 | |a Proceedings of SPIE |v 3619 |w (DE-604)BV000010887 |9 3619 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018423858 | ||
Datensatz im Suchindex
| _version_ | 1804140426026811392 |
|---|---|
| any_adam_object | |
| author2 | Stover, John C. |
| author2_role | edt |
| author2_variant | j c s jc jcs |
| author_facet | Stover, John C. |
| building | Verbundindex |
| bvnumber | BV024447169 |
| ctrlnum | (OCoLC)245789900 (DE-599)BVBBV024447169 |
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| genre_facet | Konferenzschrift |
| id | DE-604.BV024447169 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:59:47Z |
| institution | BVB |
| isbn | 0819430897 |
| language | Undetermined |
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| physical | VII, 136 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | SPIE |
| record_format | marc |
| series | Proceedings of SPIE |
| series2 | Proceedings of SPIE |
| spelling | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California John C. Stover, chair/ed. Bellingham, Wash. SPIE 1999 VII, 136 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings of SPIE 3619 (DE-588)1071861417 Konferenzschrift gnd-content Stover, John C. edt Proceedings of SPIE 3619 (DE-604)BV000010887 3619 |
| spellingShingle | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California Proceedings of SPIE |
| subject_GND | (DE-588)1071861417 |
| title | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California |
| title_auth | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California |
| title_exact_search | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California |
| title_full | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California John C. Stover, chair/ed. |
| title_fullStr | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California John C. Stover, chair/ed. |
| title_full_unstemmed | Surface characterization for computer disks, wafers, and flat panel displays 28 January 1999, San Jose, California John C. Stover, chair/ed. |
| title_short | Surface characterization for computer disks, wafers, and flat panel displays |
| title_sort | surface characterization for computer disks wafers and flat panel displays 28 january 1999 san jose california |
| title_sub | 28 January 1999, San Jose, California |
| topic_facet | Konferenzschrift |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT stoverjohnc surfacecharacterizationforcomputerdiskswafersandflatpaneldisplays28january1999sanjosecalifornia |