Characterization of very high speed semiconductor devices and integrated circuits: 23 - 25 March 1987, Bay Point, Fla.
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
1987
|
| Schriftenreihe: | Proceedings / SPIE
795 Critical reviews of optical science and technology |
| Schlagworte: | |
| Beschreibung: | X, 359 S. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV024445479 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s1987 |||| 10||| und d | ||
| 035 | |a (OCoLC)916181786 | ||
| 035 | |a (DE-599)BVBBV024445479 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 245 | 1 | 0 | |a Characterization of very high speed semiconductor devices and integrated circuits |b 23 - 25 March 1987, Bay Point, Fla. |c Ravi Jain, ed. |
| 264 | 1 | |a Bellingham, Wash. |c 1987 | |
| 300 | |a X, 359 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Proceedings / SPIE |v 795 | |
| 490 | 0 | |a Critical reviews of optical science and technology | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Jain, Ravi |4 edt | |
| 810 | 2 | |a SPIE |t Proceedings |v 795 |w (DE-604)BV000010887 |9 795 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018422216 | ||
Datensatz im Suchindex
| _version_ | 1804140423852064768 |
|---|---|
| any_adam_object | |
| author2 | Jain, Ravi |
| author2_role | edt |
| author2_variant | r j rj |
| author_facet | Jain, Ravi |
| building | Verbundindex |
| bvnumber | BV024445479 |
| ctrlnum | (OCoLC)916181786 (DE-599)BVBBV024445479 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00945nam a2200289 cb4500</leader><controlfield tag="001">BV024445479</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1987 |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916181786</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024445479</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Characterization of very high speed semiconductor devices and integrated circuits</subfield><subfield code="b">23 - 25 March 1987, Bay Point, Fla.</subfield><subfield code="c">Ravi Jain, ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, 359 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings / SPIE</subfield><subfield code="v">795</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Critical reviews of optical science and technology</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Jain, Ravi</subfield><subfield code="4">edt</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">SPIE</subfield><subfield code="t">Proceedings</subfield><subfield code="v">795</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">795</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018422216</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV024445479 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:59:45Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018422216 |
| oclc_num | 916181786 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | X, 359 S. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| record_format | marc |
| series2 | Proceedings / SPIE Critical reviews of optical science and technology |
| spelling | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. Ravi Jain, ed. Bellingham, Wash. 1987 X, 359 S. txt rdacontent n rdamedia nc rdacarrier Proceedings / SPIE 795 Critical reviews of optical science and technology (DE-588)1071861417 Konferenzschrift gnd-content Jain, Ravi edt SPIE Proceedings 795 (DE-604)BV000010887 795 |
| spellingShingle | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. |
| subject_GND | (DE-588)1071861417 |
| title | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. |
| title_auth | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. |
| title_exact_search | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. |
| title_full | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. Ravi Jain, ed. |
| title_fullStr | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. Ravi Jain, ed. |
| title_full_unstemmed | Characterization of very high speed semiconductor devices and integrated circuits 23 - 25 March 1987, Bay Point, Fla. Ravi Jain, ed. |
| title_short | Characterization of very high speed semiconductor devices and integrated circuits |
| title_sort | characterization of very high speed semiconductor devices and integrated circuits 23 25 march 1987 bay point fla |
| title_sub | 23 - 25 March 1987, Bay Point, Fla. |
| topic_facet | Konferenzschrift |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT jainravi characterizationofveryhighspeedsemiconductordevicesandintegratedcircuits2325march1987baypointfla |