Proceedings: [Oct. 19 - 21, 1998, Washington, DC]
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Washington, DC
International Test Conference <<[u.a.]>>
1998
|
Schlagworte: | |
Beschreibung: | XVI, 1179 S. Ill., graph. Darst. |
ISBN: | 0780350936 0780350928 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV024444108 | ||
003 | DE-604 | ||
005 | 20090910 | ||
007 | t | ||
008 | 090924s1998 ad|| |||| 10||| eng d | ||
020 | |a 0780350936 |9 0-7803-5093-6 | ||
020 | |a 0780350928 |9 0-7803-5092-8 | ||
035 | |a (OCoLC)634869074 | ||
035 | |a (DE-599)BVBBV024444108 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-83 | ||
084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
111 | 2 | |a International Test Conference |n 29 |d 1998 |c Washington, DC |j Verfasser |0 (DE-588)1901697-9 |4 aut | |
245 | 1 | 0 | |a Proceedings |b [Oct. 19 - 21, 1998, Washington, DC] |c International Test Conference 1998 ; [IEEE] |
264 | 1 | |a Washington, DC |b International Test Conference <<[u.a.]>> |c 1998 | |
300 | |a XVI, 1179 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 0 | 7 | |a Entwurf |0 (DE-588)4121208-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Datennetz |0 (DE-588)4011130-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Medizin |0 (DE-588)4038243-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Telekommunikationsnetz |0 (DE-588)4133586-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Computerunterstütztes Verfahren |0 (DE-588)4139030-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Telekommunikation |0 (DE-588)4059360-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Computersimulation |0 (DE-588)4148259-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Datenverarbeitungssystem |0 (DE-588)4125229-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z San Diego Calif. |2 gnd-content | |
689 | 0 | 0 | |a Datennetz |0 (DE-588)4011130-1 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Telekommunikationsnetz |0 (DE-588)4133586-7 |D s |
689 | 1 | |5 DE-604 | |
689 | 2 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 2 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 2 | |8 1\p |5 DE-604 | |
689 | 3 | 0 | |a Datenverarbeitungssystem |0 (DE-588)4125229-9 |D s |
689 | 3 | 1 | |a Computersimulation |0 (DE-588)4148259-1 |D s |
689 | 3 | |8 2\p |5 DE-604 | |
689 | 4 | 0 | |a Telekommunikation |0 (DE-588)4059360-5 |D s |
689 | 4 | 1 | |a Computersimulation |0 (DE-588)4148259-1 |D s |
689 | 4 | |8 3\p |5 DE-604 | |
689 | 5 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
689 | 5 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 5 | |8 4\p |5 DE-604 | |
689 | 6 | 0 | |a Elektronik |0 (DE-588)4014346-6 |D s |
689 | 6 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
689 | 6 | |8 5\p |5 DE-604 | |
689 | 7 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
689 | 7 | 1 | |a Entwurf |0 (DE-588)4121208-3 |D s |
689 | 7 | |8 6\p |5 DE-604 | |
689 | 8 | 0 | |a Computerunterstütztes Verfahren |0 (DE-588)4139030-1 |D s |
689 | 8 | 1 | |a Medizin |0 (DE-588)4038243-6 |D s |
689 | 8 | |8 7\p |5 DE-604 | |
689 | 9 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 9 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
689 | 9 | |8 8\p |5 DE-604 | |
710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-018420901 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 5\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 6\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 7\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 8\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804140422040125440 |
---|---|
any_adam_object | |
author_corporate | International Test Conference Washington, DC |
author_corporate_role | aut |
author_facet | International Test Conference Washington, DC |
author_sort | International Test Conference Washington, DC |
building | Verbundindex |
bvnumber | BV024444108 |
classification_rvk | ZN 4030 |
ctrlnum | (OCoLC)634869074 (DE-599)BVBBV024444108 |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03961nam a2200901 c 4500</leader><controlfield tag="001">BV024444108</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1998 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780350936</subfield><subfield code="9">0-7803-5093-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780350928</subfield><subfield code="9">0-7803-5092-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634869074</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024444108</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="n">29</subfield><subfield code="d">1998</subfield><subfield code="c">Washington, DC</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1901697-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">[Oct. 19 - 21, 1998, Washington, DC]</subfield><subfield code="c">International Test Conference 1998 ; [IEEE]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington, DC</subfield><subfield code="b">International Test Conference <<[u.a.]>></subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 1179 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datennetz</subfield><subfield code="0">(DE-588)4011130-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikationsnetz</subfield><subfield code="0">(DE-588)4133586-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">San Diego Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Datennetz</subfield><subfield code="0">(DE-588)4011130-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Telekommunikationsnetz</subfield><subfield code="0">(DE-588)4133586-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Datenverarbeitungssystem</subfield><subfield code="0">(DE-588)4125229-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Telekommunikation</subfield><subfield code="0">(DE-588)4059360-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2="1"><subfield code="a">Computersimulation</subfield><subfield code="0">(DE-588)4148259-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">Elektronik</subfield><subfield code="0">(DE-588)4014346-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="7" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2="1"><subfield code="a">Entwurf</subfield><subfield code="0">(DE-588)4121208-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="7" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="8" ind2="0"><subfield code="a">Computerunterstütztes Verfahren</subfield><subfield code="0">(DE-588)4139030-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2="1"><subfield code="a">Medizin</subfield><subfield code="0">(DE-588)4038243-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="8" ind2=" "><subfield code="8">7\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="9" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="9" ind2=" "><subfield code="8">8\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018420901</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">7\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">8\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content |
genre_facet | Konferenzschrift 1983 San Diego Calif. |
id | DE-604.BV024444108 |
illustrated | Illustrated |
indexdate | 2024-07-09T21:59:43Z |
institution | BVB |
institution_GND | (DE-588)1901697-9 (DE-588)1692-5 |
isbn | 0780350936 0780350928 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018420901 |
oclc_num | 634869074 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | XVI, 1179 S. Ill., graph. Darst. |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | International Test Conference <<[u.a.]>> |
record_format | marc |
spelling | International Test Conference 29 1998 Washington, DC Verfasser (DE-588)1901697-9 aut Proceedings [Oct. 19 - 21, 1998, Washington, DC] International Test Conference 1998 ; [IEEE] Washington, DC International Test Conference <<[u.a.]>> 1998 XVI, 1179 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Entwurf (DE-588)4121208-3 gnd rswk-swf Elektronik (DE-588)4014346-6 gnd rswk-swf Datennetz (DE-588)4011130-1 gnd rswk-swf Medizin (DE-588)4038243-6 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Telekommunikationsnetz (DE-588)4133586-7 gnd rswk-swf Computerunterstütztes Verfahren (DE-588)4139030-1 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Telekommunikation (DE-588)4059360-5 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf Computersimulation (DE-588)4148259-1 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Datenverarbeitungssystem (DE-588)4125229-9 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content Datennetz (DE-588)4011130-1 s DE-604 Telekommunikationsnetz (DE-588)4133586-7 s Integrierte Schaltung (DE-588)4027242-4 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Datenverarbeitungssystem (DE-588)4125229-9 s Computersimulation (DE-588)4148259-1 s 2\p DE-604 Telekommunikation (DE-588)4059360-5 s 3\p DE-604 Mikroelektronik (DE-588)4039207-7 s 4\p DE-604 Elektronik (DE-588)4014346-6 s Testen (DE-588)4367264-4 s 5\p DE-604 VLSI (DE-588)4117388-0 s Entwurf (DE-588)4121208-3 s 6\p DE-604 Computerunterstütztes Verfahren (DE-588)4139030-1 s Medizin (DE-588)4038243-6 s 7\p DE-604 8\p DE-604 Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 7\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 8\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Proceedings [Oct. 19 - 21, 1998, Washington, DC] Entwurf (DE-588)4121208-3 gnd Elektronik (DE-588)4014346-6 gnd Datennetz (DE-588)4011130-1 gnd Medizin (DE-588)4038243-6 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Telekommunikationsnetz (DE-588)4133586-7 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd VLSI (DE-588)4117388-0 gnd Telekommunikation (DE-588)4059360-5 gnd Testen (DE-588)4367264-4 gnd Computersimulation (DE-588)4148259-1 gnd Prüftechnik (DE-588)4047610-8 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Mikroelektronik (DE-588)4039207-7 gnd |
subject_GND | (DE-588)4121208-3 (DE-588)4014346-6 (DE-588)4011130-1 (DE-588)4038243-6 (DE-588)4027242-4 (DE-588)4133586-7 (DE-588)4139030-1 (DE-588)4117388-0 (DE-588)4059360-5 (DE-588)4367264-4 (DE-588)4148259-1 (DE-588)4047610-8 (DE-588)4125229-9 (DE-588)4039207-7 (DE-588)1071861417 |
title | Proceedings [Oct. 19 - 21, 1998, Washington, DC] |
title_auth | Proceedings [Oct. 19 - 21, 1998, Washington, DC] |
title_exact_search | Proceedings [Oct. 19 - 21, 1998, Washington, DC] |
title_full | Proceedings [Oct. 19 - 21, 1998, Washington, DC] International Test Conference 1998 ; [IEEE] |
title_fullStr | Proceedings [Oct. 19 - 21, 1998, Washington, DC] International Test Conference 1998 ; [IEEE] |
title_full_unstemmed | Proceedings [Oct. 19 - 21, 1998, Washington, DC] International Test Conference 1998 ; [IEEE] |
title_short | Proceedings |
title_sort | proceedings oct 19 21 1998 washington dc |
title_sub | [Oct. 19 - 21, 1998, Washington, DC] |
topic | Entwurf (DE-588)4121208-3 gnd Elektronik (DE-588)4014346-6 gnd Datennetz (DE-588)4011130-1 gnd Medizin (DE-588)4038243-6 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Telekommunikationsnetz (DE-588)4133586-7 gnd Computerunterstütztes Verfahren (DE-588)4139030-1 gnd VLSI (DE-588)4117388-0 gnd Telekommunikation (DE-588)4059360-5 gnd Testen (DE-588)4367264-4 gnd Computersimulation (DE-588)4148259-1 gnd Prüftechnik (DE-588)4047610-8 gnd Datenverarbeitungssystem (DE-588)4125229-9 gnd Mikroelektronik (DE-588)4039207-7 gnd |
topic_facet | Entwurf Elektronik Datennetz Medizin Integrierte Schaltung Telekommunikationsnetz Computerunterstütztes Verfahren VLSI Telekommunikation Testen Computersimulation Prüftechnik Datenverarbeitungssystem Mikroelektronik Konferenzschrift 1983 San Diego Calif. |
work_keys_str_mv | AT internationaltestconferencewashingtondc proceedingsoct19211998washingtondc AT instituteofelectricalandelectronicsengineers proceedingsoct19211998washingtondc |