Proceedings of the 1998 International Conference on Microelectronic Test Structures: March 23 - 26, 1998, Kanazawa, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Piscataway, NJ
IEEE Service Center
1998
|
| Schlagworte: | |
| Beschreibung: | X, 240 S. Ill., graph. Darst. |
| ISBN: | 0780343492 0780343484 |
Internformat
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Datensatz im Suchindex
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|---|---|
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| publishDate | 1998 |
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| spelling | International Conference on Microelectronic Test Structures 11 1998 Kanazawa Verfasser (DE-588)5318567-5 aut Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan [IEEE] Piscataway, NJ IEEE Service Center 1998 X, 240 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier (DE-588)1071861417 Konferenzschrift gnd-content Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
| spellingShingle | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan |
| subject_GND | (DE-588)1071861417 |
| title | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan |
| title_auth | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan |
| title_exact_search | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan |
| title_full | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan [IEEE] |
| title_fullStr | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan [IEEE] |
| title_full_unstemmed | Proceedings of the 1998 International Conference on Microelectronic Test Structures March 23 - 26, 1998, Kanazawa, Japan [IEEE] |
| title_short | Proceedings of the 1998 International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the 1998 international conference on microelectronic test structures march 23 26 1998 kanazawa japan |
| title_sub | March 23 - 26, 1998, Kanazawa, Japan |
| topic_facet | Konferenzschrift |
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