Symposium: held April 13 - 16, 1998, San Francisco, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Pittsburgh, Pa.
Materials Research Soc.
1998
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| Schriftenreihe: | Materials Research Society symposium proceedings
516 : Materials reliability in microelectronics ; 8 Materials Research Society symposium proceedings 516 |
| Schlagworte: | |
| Beschreibung: | XI, 365 S. Ill., graph. Darst. |
| ISBN: | 155899422X |
Internformat
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| 490 | 1 | |a Materials Research Society symposium proceedings |v 516 | |
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| 700 | 1 | |a Bravman, John C. |4 edt | |
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Datensatz im Suchindex
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| any_adam_object | |
| author2 | Bravman, John C. |
| author2_role | edt |
| author2_variant | j c b jc jcb |
| author_corporate | Symposium Materials Reliability in Microelectronics San Francisco, Calif |
| author_corporate_role | aut |
| author_facet | Bravman, John C. Symposium Materials Reliability in Microelectronics San Francisco, Calif |
| author_sort | Symposium Materials Reliability in Microelectronics San Francisco, Calif |
| building | Verbundindex |
| bvnumber | BV024442770 |
| classification_rvk | UD 8400 |
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| discipline | Physik |
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| id | DE-604.BV024442770 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:59:41Z |
| institution | BVB |
| institution_GND | (DE-588)5318407-5 |
| isbn | 155899422X |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018419591 |
| oclc_num | 916164703 |
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| owner | DE-83 |
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| physical | XI, 365 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society symposium proceedings |
| series2 | Materials Research Society symposium proceedings |
| spelling | Symposium Materials Reliability in Microelectronics 8 1998 San Francisco, Calif. Verfasser (DE-588)5318407-5 aut Symposium held April 13 - 16, 1998, San Francisco, California, USA [Symposium "Materials Reliability in Microelectronics VIII"] ; ed.: John C. Bravman ... Pittsburgh, Pa. Materials Research Soc. 1998 XI, 365 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society symposium proceedings 516 : Materials reliability in microelectronics 8 Materials Research Society symposium proceedings 516 (DE-588)1071861417 Konferenzschrift gnd-content Bravman, John C. edt Materials Research Society symposium proceedings 516 : Materials reliability in microelectronics ; 8 (DE-604)BV024396378 8 Materials Research Society symposium proceedings 516 (DE-604)BV001899105 516 |
| spellingShingle | Symposium held April 13 - 16, 1998, San Francisco, California, USA Materials Research Society symposium proceedings |
| subject_GND | (DE-588)1071861417 |
| title | Symposium held April 13 - 16, 1998, San Francisco, California, USA |
| title_auth | Symposium held April 13 - 16, 1998, San Francisco, California, USA |
| title_exact_search | Symposium held April 13 - 16, 1998, San Francisco, California, USA |
| title_full | Symposium held April 13 - 16, 1998, San Francisco, California, USA [Symposium "Materials Reliability in Microelectronics VIII"] ; ed.: John C. Bravman ... |
| title_fullStr | Symposium held April 13 - 16, 1998, San Francisco, California, USA [Symposium "Materials Reliability in Microelectronics VIII"] ; ed.: John C. Bravman ... |
| title_full_unstemmed | Symposium held April 13 - 16, 1998, San Francisco, California, USA [Symposium "Materials Reliability in Microelectronics VIII"] ; ed.: John C. Bravman ... |
| title_short | Symposium |
| title_sort | symposium held april 13 16 1998 san francisco california usa |
| title_sub | held April 13 - 16, 1998, San Francisco, California, USA |
| topic_facet | Konferenzschrift |
| volume_link | (DE-604)BV024396378 (DE-604)BV001899105 |
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