Semiconductor measurements and instrumentation:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
New York <<[u.a.]>>
McGraw Hill
1997
|
| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Beschreibung: | X, 454 S. Ill., graph. Darst. |
| ISBN: | 0070576971 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024436949 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s1997 ad|| |||| 00||| und d | ||
| 020 | |a 0070576971 |9 0-07-057697-1 | ||
| 035 | |a (OCoLC)833259170 | ||
| 035 | |a (DE-599)BVBBV024436949 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 082 | 0 | |a 621.381520287 | |
| 084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
| 100 | 1 | |a Runyan, Walter R. |d 1925- |e Verfasser |0 (DE-588)140968016 |4 aut | |
| 245 | 1 | 0 | |a Semiconductor measurements and instrumentation |c W. R. Runyan and T. J. Shaffner |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a New York <<[u.a.]>> |b McGraw Hill |c 1997 | |
| 300 | |a X, 454 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristallographie |0 (DE-588)4033217-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleitermesstechnik |0 (DE-588)4158807-1 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4151278-9 |a Einführung |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 1 | 1 | |a Kristallographie |0 (DE-588)4033217-2 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 689 | 2 | 0 | |a Halbleitermesstechnik |0 (DE-588)4158807-1 |D s |
| 689 | 2 | |8 3\p |5 DE-604 | |
| 700 | 1 | |a Shaffner, Thomas J. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018413983 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804140412794830848 |
|---|---|
| any_adam_object | |
| author | Runyan, Walter R. 1925- |
| author_GND | (DE-588)140968016 |
| author_facet | Runyan, Walter R. 1925- |
| author_role | aut |
| author_sort | Runyan, Walter R. 1925- |
| author_variant | w r r wr wrr |
| building | Verbundindex |
| bvnumber | BV024436949 |
| classification_rvk | ZN 4800 |
| ctrlnum | (OCoLC)833259170 (DE-599)BVBBV024436949 |
| dewey-full | 621.381520287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381520287 |
| dewey-search | 621.381520287 |
| dewey-sort | 3621.381520287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 2. ed. |
| format | Book |
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| genre | (DE-588)4151278-9 Einführung gnd-content |
| genre_facet | Einführung |
| id | DE-604.BV024436949 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:59:34Z |
| institution | BVB |
| isbn | 0070576971 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018413983 |
| oclc_num | 833259170 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | X, 454 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | McGraw Hill |
| record_format | marc |
| spelling | Runyan, Walter R. 1925- Verfasser (DE-588)140968016 aut Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner 2. ed. New York <<[u.a.]>> McGraw Hill 1997 X, 454 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Halbleiter (DE-588)4022993-2 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Halbleitermesstechnik (DE-588)4158807-1 gnd rswk-swf (DE-588)4151278-9 Einführung gnd-content Halbleiter (DE-588)4022993-2 s Mikroskopie (DE-588)4039238-7 s 1\p DE-604 Kristallographie (DE-588)4033217-2 s 2\p DE-604 Halbleitermesstechnik (DE-588)4158807-1 s 3\p DE-604 Shaffner, Thomas J. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Runyan, Walter R. 1925- Semiconductor measurements and instrumentation Halbleiter (DE-588)4022993-2 gnd Kristallographie (DE-588)4033217-2 gnd Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4033217-2 (DE-588)4039238-7 (DE-588)4158807-1 (DE-588)4151278-9 |
| title | Semiconductor measurements and instrumentation |
| title_auth | Semiconductor measurements and instrumentation |
| title_exact_search | Semiconductor measurements and instrumentation |
| title_full | Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner |
| title_fullStr | Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner |
| title_full_unstemmed | Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner |
| title_short | Semiconductor measurements and instrumentation |
| title_sort | semiconductor measurements and instrumentation |
| topic | Halbleiter (DE-588)4022993-2 gnd Kristallographie (DE-588)4033217-2 gnd Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd |
| topic_facet | Halbleiter Kristallographie Mikroskopie Halbleitermesstechnik Einführung |
| work_keys_str_mv | AT runyanwalterr semiconductormeasurementsandinstrumentation AT shaffnerthomasj semiconductormeasurementsandinstrumentation |