Proceedings: October 20 - 22, 1997, Paris, France
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
LosAlamitos, Calif. <<[u.a.]>>
IEEE Computer Soc. Press
1997
|
| Schlagworte: | |
| Beschreibung: | XI, 314 S. Ill., graph. Darst. |
| ISBN: | 0818681683 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024429983 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 980223s1997 ad|| |||| 10||| und d | ||
| 020 | |a 0818681683 |9 0-8186-8168-3 | ||
| 035 | |a (OCoLC)245731116 | ||
| 035 | |a (DE-599)BVBBV024429983 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 084 | |a ZN 4952 |0 (DE-625)157425: |2 rvk | ||
| 111 | 2 | |a International Symposium on Defect and Fault Tolerance in VLSI Systems |d 1997 |c Paris |j Verfasser |0 (DE-588)5270947-4 |4 aut | |
| 245 | 1 | 0 | |a Proceedings |b October 20 - 22, 1997, Paris, France |c 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| 246 | 1 | 3 | |a Defect and fault tolerance in VLSI systems |
| 264 | 1 | |a LosAlamitos, Calif. <<[u.a.]>> |b IEEE Computer Soc. Press |c 1997 | |
| 300 | |a XI, 314 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Datennetz |0 (DE-588)4011130-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Telekommunikationsnetz |0 (DE-588)4133586-7 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z San Diego Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Datennetz |0 (DE-588)4011130-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Telekommunikationsnetz |0 (DE-588)4133586-7 |D s |
| 689 | 1 | |5 DE-604 | |
| 710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018407282 | ||
Datensatz im Suchindex
| _version_ | 1804140403610353664 |
|---|---|
| any_adam_object | |
| author_corporate | International Symposium on Defect and Fault Tolerance in VLSI Systems Paris |
| author_corporate_role | aut |
| author_facet | International Symposium on Defect and Fault Tolerance in VLSI Systems Paris |
| author_sort | International Symposium on Defect and Fault Tolerance in VLSI Systems Paris |
| building | Verbundindex |
| bvnumber | BV024429983 |
| classification_rvk | ZN 4952 |
| ctrlnum | (OCoLC)245731116 (DE-599)BVBBV024429983 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01488nam a2200373 c 4500</leader><controlfield tag="001">BV024429983</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980223s1997 ad|| |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818681683</subfield><subfield code="9">0-8186-8168-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)245731116</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024429983</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4952</subfield><subfield code="0">(DE-625)157425:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Symposium on Defect and Fault Tolerance in VLSI Systems</subfield><subfield code="d">1997</subfield><subfield code="c">Paris</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5270947-4</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">October 20 - 22, 1997, Paris, France</subfield><subfield code="c">1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Defect and fault tolerance in VLSI systems</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">LosAlamitos, Calif. <<[u.a.]>></subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 314 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datennetz</subfield><subfield code="0">(DE-588)4011130-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikationsnetz</subfield><subfield code="0">(DE-588)4133586-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">San Diego Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Datennetz</subfield><subfield code="0">(DE-588)4011130-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Telekommunikationsnetz</subfield><subfield code="0">(DE-588)4133586-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018407282</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content |
| genre_facet | Konferenzschrift 1983 San Diego Calif. |
| id | DE-604.BV024429983 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:59:26Z |
| institution | BVB |
| institution_GND | (DE-588)5270947-4 (DE-588)1692-5 |
| isbn | 0818681683 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018407282 |
| oclc_num | 245731116 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XI, 314 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | International Symposium on Defect and Fault Tolerance in VLSI Systems 1997 Paris Verfasser (DE-588)5270947-4 aut Proceedings October 20 - 22, 1997, Paris, France 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems LosAlamitos, Calif. <<[u.a.]>> IEEE Computer Soc. Press 1997 XI, 314 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Datennetz (DE-588)4011130-1 gnd rswk-swf Telekommunikationsnetz (DE-588)4133586-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content Datennetz (DE-588)4011130-1 s DE-604 Telekommunikationsnetz (DE-588)4133586-7 s Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
| spellingShingle | Proceedings October 20 - 22, 1997, Paris, France Datennetz (DE-588)4011130-1 gnd Telekommunikationsnetz (DE-588)4133586-7 gnd |
| subject_GND | (DE-588)4011130-1 (DE-588)4133586-7 (DE-588)1071861417 |
| title | Proceedings October 20 - 22, 1997, Paris, France |
| title_alt | Defect and fault tolerance in VLSI systems |
| title_auth | Proceedings October 20 - 22, 1997, Paris, France |
| title_exact_search | Proceedings October 20 - 22, 1997, Paris, France |
| title_full | Proceedings October 20 - 22, 1997, Paris, France 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| title_fullStr | Proceedings October 20 - 22, 1997, Paris, France 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| title_full_unstemmed | Proceedings October 20 - 22, 1997, Paris, France 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| title_short | Proceedings |
| title_sort | proceedings october 20 22 1997 paris france |
| title_sub | October 20 - 22, 1997, Paris, France |
| topic | Datennetz (DE-588)4011130-1 gnd Telekommunikationsnetz (DE-588)4133586-7 gnd |
| topic_facet | Datennetz Telekommunikationsnetz Konferenzschrift 1983 San Diego Calif. |
| work_keys_str_mv | AT internationalsymposiumondefectandfaulttoleranceinvlsisystemsparis proceedingsoctober20221997parisfrance AT instituteofelectricalandelectronicsengineers proceedingsoctober20221997parisfrance AT internationalsymposiumondefectandfaulttoleranceinvlsisystemsparis defectandfaulttoleranceinvlsisystems AT instituteofelectricalandelectronicsengineers defectandfaulttoleranceinvlsisystems |