Proceedings: March 17 - 20, 1997, Monterey, California
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Bibliographic Details
Corporate Author: International Conference on Microelectronic Test Structures Monterey, Calif (Author)
Format: Conference Proceeding Book
Language:Undetermined
Published: Piscataway, NJ IEEE Service Center 1997
Subjects:
Physical Description:VIII, 225 S. Ill., graph. Darst.
ISBN:078033244X
0780332431

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