Proceedings: March 17 - 20, 1997, Monterey, California
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
Piscataway, NJ
IEEE Service Center
1997
|
Schlagworte: | |
Beschreibung: | VIII, 225 S. Ill., graph. Darst. |
ISBN: | 078033244X 0780332431 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV024428241 | ||
003 | DE-604 | ||
005 | 20090910 | ||
007 | t | ||
008 | 980115s1997 ad|| |||| 10||| und d | ||
020 | |a 078033244X |9 0-7803-3244-X | ||
020 | |a 0780332431 |9 0-7803-3243-1 | ||
035 | |a (OCoLC)916086970 | ||
035 | |a (DE-599)BVBBV024428241 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | |a und | ||
049 | |a DE-83 | ||
084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
111 | 2 | |a International Conference on Microelectronic Test Structures |n 10 |d 1997 |c Monterey, Calif. |j Verfasser |0 (DE-588)5266344-9 |4 aut | |
245 | 1 | 0 | |a Proceedings |b March 17 - 20, 1997, Monterey, California |c 1996 IEEE International Conference on Microelectronic Test Structures |
264 | 1 | |a Piscataway, NJ |b IEEE Service Center |c 1997 | |
300 | |a VIII, 225 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 0 | 7 | |a Telekommunikationsnetz |0 (DE-588)4133586-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Datennetz |0 (DE-588)4011130-1 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1983 |z San Diego Calif. |2 gnd-content | |
689 | 0 | 0 | |a Datennetz |0 (DE-588)4011130-1 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Telekommunikationsnetz |0 (DE-588)4133586-7 |D s |
689 | 1 | |5 DE-604 | |
710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-018405598 |
Datensatz im Suchindex
_version_ | 1804140401556193280 |
---|---|
any_adam_object | |
author_corporate | International Conference on Microelectronic Test Structures Monterey, Calif |
author_corporate_role | aut |
author_facet | International Conference on Microelectronic Test Structures Monterey, Calif |
author_sort | International Conference on Microelectronic Test Structures Monterey, Calif |
building | Verbundindex |
bvnumber | BV024428241 |
classification_rvk | ZN 4030 |
ctrlnum | (OCoLC)916086970 (DE-599)BVBBV024428241 |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01452nam a2200373 c 4500</leader><controlfield tag="001">BV024428241</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980115s1997 ad|| |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">078033244X</subfield><subfield code="9">0-7803-3244-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780332431</subfield><subfield code="9">0-7803-3243-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916086970</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024428241</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Microelectronic Test Structures</subfield><subfield code="n">10</subfield><subfield code="d">1997</subfield><subfield code="c">Monterey, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5266344-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">March 17 - 20, 1997, Monterey, California</subfield><subfield code="c">1996 IEEE International Conference on Microelectronic Test Structures</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="b">IEEE Service Center</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 225 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Telekommunikationsnetz</subfield><subfield code="0">(DE-588)4133586-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datennetz</subfield><subfield code="0">(DE-588)4011130-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1983</subfield><subfield code="z">San Diego Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Datennetz</subfield><subfield code="0">(DE-588)4011130-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Telekommunikationsnetz</subfield><subfield code="0">(DE-588)4133586-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018405598</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content |
genre_facet | Konferenzschrift 1983 San Diego Calif. |
id | DE-604.BV024428241 |
illustrated | Illustrated |
indexdate | 2024-07-09T21:59:24Z |
institution | BVB |
institution_GND | (DE-588)5266344-9 (DE-588)1692-5 |
isbn | 078033244X 0780332431 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018405598 |
oclc_num | 916086970 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | VIII, 225 S. Ill., graph. Darst. |
publishDate | 1997 |
publishDateSearch | 1997 |
publishDateSort | 1997 |
publisher | IEEE Service Center |
record_format | marc |
spelling | International Conference on Microelectronic Test Structures 10 1997 Monterey, Calif. Verfasser (DE-588)5266344-9 aut Proceedings March 17 - 20, 1997, Monterey, California 1996 IEEE International Conference on Microelectronic Test Structures Piscataway, NJ IEEE Service Center 1997 VIII, 225 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Telekommunikationsnetz (DE-588)4133586-7 gnd rswk-swf Datennetz (DE-588)4011130-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1983 San Diego Calif. gnd-content Datennetz (DE-588)4011130-1 s DE-604 Telekommunikationsnetz (DE-588)4133586-7 s Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
spellingShingle | Proceedings March 17 - 20, 1997, Monterey, California Telekommunikationsnetz (DE-588)4133586-7 gnd Datennetz (DE-588)4011130-1 gnd |
subject_GND | (DE-588)4133586-7 (DE-588)4011130-1 (DE-588)1071861417 |
title | Proceedings March 17 - 20, 1997, Monterey, California |
title_auth | Proceedings March 17 - 20, 1997, Monterey, California |
title_exact_search | Proceedings March 17 - 20, 1997, Monterey, California |
title_full | Proceedings March 17 - 20, 1997, Monterey, California 1996 IEEE International Conference on Microelectronic Test Structures |
title_fullStr | Proceedings March 17 - 20, 1997, Monterey, California 1996 IEEE International Conference on Microelectronic Test Structures |
title_full_unstemmed | Proceedings March 17 - 20, 1997, Monterey, California 1996 IEEE International Conference on Microelectronic Test Structures |
title_short | Proceedings |
title_sort | proceedings march 17 20 1997 monterey california |
title_sub | March 17 - 20, 1997, Monterey, California |
topic | Telekommunikationsnetz (DE-588)4133586-7 gnd Datennetz (DE-588)4011130-1 gnd |
topic_facet | Telekommunikationsnetz Datennetz Konferenzschrift 1983 San Diego Calif. |
work_keys_str_mv | AT internationalconferenceonmicroelectronicteststructuresmontereycalif proceedingsmarch17201997montereycalifornia AT instituteofelectricalandelectronicsengineers proceedingsmarch17201997montereycalifornia |