Polarimetry and Ellipsometry: 20 - 23 May 1996, Kazimierz Dolny, Poland
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1997
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| Schriftenreihe: | Proceedings / SPIE
3094 : SPIE Poland Chapter proceedings 28 Proceedings / SPIE 3094 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Nebent.: P/E-metry |
| Beschreibung: | XVIII, 374 S. Ill., graph. Darst. |
| ISBN: | 0819425095 |
Internformat
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Datensatz im Suchindex
| _version_ | 1804140394744643584 |
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| adam_text | PROCEEDINGS SPIE*THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
POLARIMETRY AND ELLIPSOMETRY MAKSYMILIAN PLUTA TOMASZ R. WOLIHSKI
CHAIRS/EDITORS MARIUSZ SZYJER CO-EDITOR 20-23 MAY 1996 KAZIMIERZ DOLNY,
POLAND ORGANIZED BY SPIE POLAND CHAPTER INSTITUTE OF APPLIED OPTICS,
WARSAW (POLAND) SPONSORED BY SPIE*THE INTERNATIONAL SOCIETY FOR OPTICAL
ENGINEERING STATE COMMITTEE FOR SCIENTIFIC RESEARCH (POLAND) PUBLISHED
BY SPIE*THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING VOLUME 3094
SPIE IS AN INTERNATIONAL TECHNICAL SOCIETY DEDICATED TO ADVANCING
ENGINEERING AND SCIENTIFIC APPLICATIONS OF OPTICAL, PHOTONIC, IMAGING,
ELECTRONIC, AND OPTOELECTRONIC TECHNOLOGIES. CONTENTS VII CONFERENCE
COMMITTEES IX PREFA.CE WELCOME ADDRESS XVI * PHYSICS AND ANALYSIS OF
POLARIZED LIGHT 2 POLARIZATION CHARACTERISTICS OF QUANTUM-WELL
SEMICONDUCTOR STRUCTURES [3094-01] I. S. MANAK, BELORUSSIAN STATE UNIV.;
D. V. KARASEV, V. K. KONONENKO, B.L. STEPANOV INSTITUTE OF PHYSICS
(BELARUS); S. V. NAIIVKO, BELORUSSIAN STATE UNIV.; A. A. ROMANENKO,
INSTITUTE OF APPLIED OPTICS (BELARUS); A. A. VITALISOV, BELORUSSIAN
STATE UNIV. 1 8 POLARIZATION PROPERTIES OF LIGHT EMISSION OF ALGAAS
DOUBLE HETEROSTRUCTURE INJECTION LASERS [3094-02] I. S. MANAK, YU. L
ZHURAVSKII, M. T. KLOKOVA, BELORUSSIAN STATE UNIV.; V. L. KASYUTICH,
INSTITUTE OF MOLECULAR AND ATOMIC PHYSICS (BELARUS) 25 ANALYSIS OF
POLARIZED LIGHT IN MULTILAYERS [3094-03] J. PISTORA, R. KANTOR,
TECHNICAL UNIV. OSTRAVA (CZECH REPUBLIC); N. NEGRE, INSA (FRANCE); K.
POSTAVA, R. ANYZOVAE, J. SEIDL, TECHNICAL UNIV. OSTRAVA (CZECH REPUBLIC)
30 STOKES-MUELLER FORMALISM AND POINCARE SPHERE REPRESENTATION APPLIED
TO STUDIES OF MONOMODE OPTICAL FIBERS [3094-04] P. OLIVARD, P.-Y.
CERLIGAND, B. LE JEUNE, J. CARIOU, J. LOTRIAN, UNIV. DE BRETAGNE
OCCIDENTALE (FRANCE) 41 WEAKLY TWISTED OPTICALLY ANISOTROPIC MEDIA: IS
THERE AN ANALOGY BETWEEN HI-BI FIBERS AND LIQUID CRYSTALS? (INVITED
PAPER) [3094-05] T. R. WOLIRISKI, WARSAW UNIV. OF TECHNOLOGY (POLAND) 47
DEPOLARIZATION BEHAVIOR OF MULTIPLE SCATTERED LIGHT FROM AN OPTICALLY
DENSE RANDOM MEDIUM (INVITED PAPER) [3094-06] C. BROSSEAU, UNIV. DE
BRETAGNE OCCIDENTALE (FRANCE); D. BICOUT, INSTITUT DE BIOLOGIE
STRUCTURALE (FRANCE); A. S. MARTINEZ, LAB. D EXPERIMENTATION NUMERIQUE
(FRANCE); J. M. SCHMITT, NATIONAL INSTITUTES OF HEALTH (USA) 52 STATIC
PHASE CONJUGATOR FOR PSEUDODEPOLARIZED LASER BEAMS [3094-07 ] P. V.
POLYANSKII, CHERNIVTSY STATE UNIV. (UKRAINE) 59 ASSOCIATIVE DATA
RECONSTRUCTION FOR NONUNIFORMLY POLARIZED OPTICAL FIELDS [3094-08] P. V.
POLYANSKII, CHERNIVTSY STATE UNIV. (UKRAINE) POLARIMETERS: ACCESSORIES
AND APPLICATIONS 66 POLARIZATION MODULATION POLARIMETER FOR AN HPLC
DETECTOR (INVITED PAPER) [3094-09] Y. SHINDO, M. YAZAWA, M. IZUKA, H.
AOYAMA, M. KINNBARA, S. MAEDA, FUKUI UNIV. (JAPAN) 88 UNIVERSAL NULL
POLARIMETER FOR CRYSTAL OPTICS [3094-10] O. S. KUSHNIR, LVIV STATE UNIV.
(UKRAINE); O. C. VLOKH, INSTITUTE OF PHYSICAL OPTICS (UKRAINE) 100
COMPUTER-AIDED AUTOMATIC POLARIMETER [3094-11] A. KIEZUN, L. R.
JAROSZEWICZ, R. SWITTO, MILITARY UNIV. OF TECHNOLOGY (POLAND) I 05
ELECTRICALLY SWITCHED COMPENSATOR IN HIGH-ACCURACY POLARIMETER [3094-12]
YA. SHOPA, M. KRAVCHUK, LVIV STATE UNIV. (UKRAINE) II 2 NONMECHANICAL
AZIMUTH CHANGE OF A LINEAR POLARIZER PRECEDING A PHOTODETECTOR [3094-1
3] C. YE, UNIV. OF OULU (FINLAND) 11 8 COMPENSATION DETECTOR OF
BIREFRINGENCE [3094-14] M. I. SHRIBAK, V. L. KOLPASHCHIKOV, HEAT AND
MASS TRANSFER INSTITUTE (BELARUS) 121 MAGNETO-OPTICAL MODULATORS AND
ISOLATORS OF PARTIALLY POLARIZED LIGHT (INVITED PAPER) [3094-15] A. W.
DOMARISKI, WARSAW UNIV. OF TECHNOLOGY (POLAND) 1 31 OVERCOATED
WIDE-ANGLE WINDOW DESIGNED FOR SELECTED LIGHT WAVELENGTH [3094-16] J.
CIOSEK, MILITARY UNIV. OF TECHNOLOGY (POLAND) 1 36 TWO-FREQUENCY HE-NE
LASER FOR HETERODYNE POLARIMETRY AND ELLIPSOMETRY [3094-1 7] V. G.
GUDELEV, V. M. YASINSKII, INSTITUTE OF PHYSICS (BELARUS) 140
NULL-POLARIMETRIC STUDIES OF WAVEPLATE PARAMETERS [3094-18] O. S.
KUSHNIR, LVIV STATE UNIV. (UKRAINE); O. G. VIOKH, INSTITUTE OF PHYSICAL
OPTICS (UKRAINE) 147 POLARIMETRIE INVESTIGATIONS OF RESIDUAL STRESSES IN
CZOCHRALSKI-GROWN LINB0 3 SINGLE CRYSTALS [3094-19] A. L. BAJOR, Z.
GATGZKA, INSTITUTE OF ELECTRONIC MATERIALS TECHNOLOGY (POLAND) 1 59
METHODS FOR DETERMIMNG OPTICAL PARAMETERS IN GYROTROPIC CRYSTALS
[3094-20] A. F. KONSTANTINOVA, E. A. EVDISCHENKO, INSTITUTE OF
CRYSTALLOGRAPHY (RUSSIA) 1 69 APPLICATION OF POLARIMETRY IN OPTICAL
COMPUTERIZED TOMOGRAPHY OF ANISOTROPIC MEDIA [3094-21] S. YU. BEREZHNA,
I. V. BEREZHNYI, O. M. KRUPYCH, O. G. VIOKH, INSTITUTE FOR PHYSICAL
OPTICS (UKRAINE) 1 75 OPTICAL ROTATORY POWER OF TRIGONAL QUARTZ AND
GERMANIUM DIOXIDE SINGLE CRYSTALS [3094-22] T. M. GLUSHKOVA, D. F.
KISELEV, M. M. FIRSOVA, A. P. STYRKOVA, MOSCOW UNIV. (RUSSIA) 1 78
PECULIARITIES OF THE OPTICAL ANISOTROPY IN LEAD-GERMANATE-TYPE CRYSTALS
[3094-23] YA. SHOPA, M. KRAVCHUK, LVIV STATE UNIV. (UKRAINE); O. G.
VIOKH, INSTITUTE OF PHYSICAL OPTICS (UKRAINE) 184 POLARIMETRY OF
SEMICONDUETOR EXCITON SPECTRA [3094-24] Z. B. NITSOVICH, C. YU. ZENKOVA,
B. M. NITSOVICH, CHERNIVTSY STATE UNIV. (UKRAINE) 1 88 NUMERICAL AND
EXPERIMENTAL STUDY OF CORNEAL BIREFRINGENCE [3094-25] J. W. JARORISKI,
H. T. KASPRZAK, E. B. JANKOWSKA-KUCHTA, TECHNICAL UNIV. OF WRODAW
(POLAND) POLARIMETRIC FIBER OPTIC SENSORS 1 94 DISTRIBUTED POLARIMETRIE
FIBER OPTIC SENSORS USING A WAVELENGTH-SCANNING TECHNIQUE [3094-26] S.
V. MIRIDONOV, M. G. SHLYAGIN, A. V. KHOMENKO, D. TENTORI, CTR. DE
INVESTIGACIOEN CIENTFFICA Y DE EDUCACIOEN DE ENSENADA (MEXICO) 204
POLARIZATION ROLE IN FIBER OPTIC INTERFEROMETERS (INVITED PAPER)
[3094-27] L R. JAROSZEWICZ, MILITARY UNIV. OF TECHNOLOGY (POLAND) 218
MULTIPLEXED POLARIMETRIE SENSORS WITH HIGHLY BIREFRINGENT OPTICAL FIBERS
FOR SMART STRUETURES [3094-28] T. R. WOLIRISKI, UNIV. MARIE
CURIE-SKTODOWSKA LUBLIN (POLAND); P. GATAZKA, WARSAW UNIV. OF TECHNOLOGY
(POLAND); J. WOEJCIK, UNIV. MARIE CURIE-SKTODOWSKA LUBLIN (POLAND)
ELLIPSOMETRY: INSTRUMENTATION AND APPLICATIONS 226 NONLINEAR
POLARIZATION-MODULATED ELLIPSOMETRY [3094-29] V. B. TARANENKO, V. YU.
BAZHENOV, O. A. KULIKOVSKAYA, INSTITUTE OF PHYSICS (UKRAINE) 239
POSSIBILITIES OF ELLIPSOMETRY WITH SURFACE PLASMON EXCITATION IN THE
INVESTIGATION OF THIN FILMS IN COMPARISON TO SEPARATED ELLIPSOMETRY AND
SURFACE PLASMON SPECTROSCOPY (INVITED PAPER) [3094-30] E. G.
BORTCHAGOVSKY, INSTITUTE OF SEMICONDUCTOR PHYSICS (UKRAINE) 250
CHARACTERIZATION OF THIN METAL FILMS WITH OVERLAYERS BY TRANSPARENCY AND
MULTIANGLE INCLUDING SURFACE PLASMON EXCITATION REFLECTANCE ELLIPSOMETRY
METHOD [3094-31] O. YU. BORKOVSKAYA, N. L. DMITRUK, O. V. FURSENKO,
INSTITUTE FOR PHYSICS OF SEMICONDUCTORS (UKRAINE) 255 APPLICATION OF
GENERALIZED ELLIPSOMETRY TO COMPLEX OPTICAL SYSTEMS [3094-32] M.
SCHUBERT, B. RHEINLAENDER, UNIV. OF LEIPZIG (FRG); J. A. WOOLLAM, UNIV.
OF NEBRASKA (USA); B. D. JOHS, C. M. HERZINGER, J.A. WOOLLAM CO. (USA)
266 ACCURACY OF TRADITIONAL ELLIPSOMETRY AND COMPLEX
ELLIPSOMETRY-TRANSMISSION PHOTOMETRY TECHNIQUES FOR
ABSORPTIVE-FILM/TRANSPARENT-SUBSTRATE SYSTEMS [3094-33] A. M. KOSTRUBA,
O. G. VLOKH, INSTITUTE OF PHYSICAL OPTICS (UKRAINE) 272 COMPARISON OF
THE PRECISION OF A NULL-ELLIPSOMETER TO AN EMIPSOMETER WITH A ROTATING
ANALYZER [3094-34] E. G. BORTCHAGOVSKY, O. M. GETSKO, INSTITUTE OF
SEMICONDUCTOR PHYSICS (UKRAINE) 276 ELLIPSOMETRIC STUDIES OF
PHOTOCHROMIC ULTRATHIN POLYMER FILMS [3094-35] H. KNOBLOCH, S. KATHOLY,
H. ORENDI, J. HESSE, D. PRESCHER, L. BREHMER, UNIV. POTSDAM (FRG); R.
RUHMANN, INSTITUT FUER ANGEWANDTE CHEMIE EV (FRG) 281 ELLIPSOMETRY FOR
DETERMINING THE REFRACTIVE INDEX PROFILES OF THIN FILMS (INVITED PAPER)
[3094-36] V. A. TOLMACHEV, S.I. VAVILOV STATE OPTICAL INSTITUTE (RUSSIA)
288 ELLIPSOMETRY FOR CORRECTIY DETERMINING THE VOID FRACTION AND TRUE
REFRACTIVE INDEX OF THIN FILMS [3094-37] V. A. TOLMACHEV, S.I. VAVILOV
STATE OPTICAL INSTITUTE (RUSSIA) 295 MANIFESTATION OF OPTICAL ACTIVITY
IN LIGHT REFLECTION FROM GYROTROPIC UNIAXIAL FILM [3094-38] B. V.
NABATOV, A. F. KONSTANTINOVA, A. YU. TRONIN, INSTITUTE OF
CRYSTALLOGRAPHY (RUSSIA) V 301 REAL-TIME MONITORING AND CONTROL DURING
MBE GROWTH OF GAAS/AIGAAS BRAGG REFLECTORS USING MULTIWAVE ELLIPSOMETRY
[3094-39] T. WAGNER, LOT-ORIEL GMBH (FRG); B. D. JOHS, C. M. HERZINGER,
P. HE, S. PITTAL, J. A. WOOLLAM, J.A. WOOLLAM CO. (USA) 308
ELLIPSOMETRIC INVESTIGATION OF IMPLANTED GAAS [3094-40] M. KULIK, UNIV.
MARIE CURIE-SWODOWSKA LUBLIN (POLAND) 31 7 DETERMINATION OF THE OPTICAL
MODEL OF THE MOS STRUCTURE WITH SPECTROSCOPIC ELLIPSOMETRY [3094-41] A.
KUDLA, D. BRZEZINSKA, INSTITUTE OF ELECTRON TECHNOLOGY (POLAND); T.
WAGNER, LOT-ORIEL GMBH (FRG); Z. SAWICKI, INSTITUTE OF ELECTRON
TECHNOLOGY (POLAND) 322 RESEARCH OF OXIDATION PROCESSES OF A CADMIUM
TELLURIDE FILM SURFACE BY ELLIPSOMETRIC METHOD [3094-42] L. A. ZABASHTA,
A. S. OPANASYUK, V. I. KHARCHENKO, SUMY STATE UNIV. (UKRAINE) 328
ELLIPSOMETRIC STUDIES OF THE EFFECT OF A METAL ISLAND STRUCTURE ON THE
OPTIC PROPERTIES OF A SEMICONDUCTOR SURFACE [3094-43] N. L. DMITRUK,
INSTITUTE OF SEMICONDUCTOR PHYSICS (UKRAINE); L. A. ZABASHTA, SUMY STATE
UNIV. (UKRAINE) 333 PRACTICAL ASPECTS OF MULTIPLE-ANGLE ELLIPSOMETRY OF
SEMICONDUCTOR STRUCTURES [3094-44] L. A. ZABASHTA, SUMY STATE UNIV.
(UKRAINE); O. I. ZABASHTA, INSTITUTE OF APPLIED PHYSICS (UKRAINE); N. L.
DMITRUK, INSTITUTE OF SEMICONDUCTOR PHYSICS (UKRAINE) MEASURING
TECHNIQUES RELATED TO POLARIMETRY AND ELLIPSOMETRY 340 POLARIZATION
INTERFERENCE METROLOGY FOR STATISTICAL PARAMETERS OF OPTICAL FIELDS
(INVITED PAPER) [3094-45] O. V. ANGELSKY, P. P. MAKSIMYAK, CHERNIVTSY
STATE UNIV. (UKRAINE) 349 DETERMINATION OF ANISOTROPIC FILM THICKNESS,
COMPLEX REFLECTIVE INDICES, AND THEIR DISPERSION FROM REFLECTANCE
SPECTRA [3094-46] V. V. FILIPPOV, V. P. KUTAVICHUS, INSTITUTE OF PHYSICS
(BELARUS) 354 THIN-FILM ANALYSIS BASED ON THE RATIO OF ENVELOPES OF THE
REFLECTANCE SPECTRA MEASURED AT TWO INCIDENT ANGLES [3094-47] V. V.
FILIPPOV, INSTITUTE OF PHYSICS (BELARUS) 360 EFFECT OF MATCHING LAYER ON
POLARIZATION PHOTOSENSITIVITY OF AN AIIIBV SCHOTTKY-BARRIER
PHOTODETECTOR MONOLITHICALLY INTEGRATED WITH AN OPTICAL WAVEGUIDE
[3094-48] N. L. DMITRUK, O. V. FURSENKO, O. I. MAYEVA, INSTITUTE FOR
PHYSICS OF SEMICONDUCTORS (UKRAINE) 367 AUTHOR INDEX 370 SUBJECT INDEX
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| spelling | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland organized by SPIE Poland Chapter ... Maksymilian Pluta ..., chairs/eds. P/E-metry Bellingham, Wash. SPIE 1997 XVIII, 374 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings / SPIE 3094 : SPIE Poland Chapter proceedings 28 Proceedings / SPIE 3094 Nebent.: P/E-metry (DE-588)1071861417 Konferenzschrift gnd-content Pluta, Maksymilian edt SPIE, The International Society for Optical Engineering Poland Chapter Sonstige (DE-588)5143706-5 oth SPIE Proceedings 3094 : SPIE Poland Chapter proceedings ; 28 (DE-604)BV024411506 28 SPIE Proceedings 3094 (DE-604)BV000010887 3094 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018400151&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland |
| subject_GND | (DE-588)1071861417 |
| title | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland |
| title_alt | P/E-metry |
| title_auth | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland |
| title_exact_search | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland |
| title_full | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland organized by SPIE Poland Chapter ... Maksymilian Pluta ..., chairs/eds. |
| title_fullStr | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland organized by SPIE Poland Chapter ... Maksymilian Pluta ..., chairs/eds. |
| title_full_unstemmed | Polarimetry and Ellipsometry 20 - 23 May 1996, Kazimierz Dolny, Poland organized by SPIE Poland Chapter ... Maksymilian Pluta ..., chairs/eds. |
| title_short | Polarimetry and Ellipsometry |
| title_sort | polarimetry and ellipsometry 20 23 may 1996 kazimierz dolny poland |
| title_sub | 20 - 23 May 1996, Kazimierz Dolny, Poland |
| topic_facet | Konferenzschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018400151&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV024411506 (DE-604)BV000010887 |
| work_keys_str_mv | AT plutamaksymilian polarimetryandellipsometry2023may1996kazimierzdolnypoland AT spietheinternationalsocietyforopticalengineeringpolandchapter polarimetryandellipsometry2023may1996kazimierzdolnypoland AT plutamaksymilian pemetry AT spietheinternationalsocietyforopticalengineeringpolandchapter pemetry |