Secondary ion mass spectrometry: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester <<[u.a.]>>
Wiley
1988
|
| Schlagworte: | |
| Beschreibung: | XXVII, 1078 S. |
| ISBN: | 0471918326 |
Internformat
MARC
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| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 |c ed.: A. Benninghoven ... |
| 264 | 1 | |a Chichester <<[u.a.]>> |b Wiley |c 1988 | |
| 300 | |a XXVII, 1078 S. | ||
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| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Benninghoven, Alfred |4 edt | |
| 711 | 2 | |a SIMS |n 6 |d 1987 |c Versailles |j Sonstige |0 (DE-588)5000470-0 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018399712 | ||
Datensatz im Suchindex
| _version_ | 1804140394182606848 |
|---|---|
| any_adam_object | |
| author2 | Benninghoven, Alfred |
| author2_role | edt |
| author2_variant | a b ab |
| author_facet | Benninghoven, Alfred |
| building | Verbundindex |
| bvnumber | BV024422226 |
| classification_rvk | VG 9808 |
| ctrlnum | (OCoLC)265659725 (DE-599)BVBBV024422226 |
| discipline | Chemie / Pharmazie |
| format | Conference Proceeding Book |
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| genre_facet | Konferenzschrift |
| id | DE-604.BV024422226 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:59:17Z |
| institution | BVB |
| institution_GND | (DE-588)5000470-0 |
| isbn | 0471918326 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018399712 |
| oclc_num | 265659725 |
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| physical | XXVII, 1078 S. |
| publishDate | 1988 |
| publishDateSearch | 1988 |
| publishDateSort | 1988 |
| publisher | Wiley |
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| spelling | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 ed.: A. Benninghoven ... Chichester <<[u.a.]>> Wiley 1988 XXVII, 1078 S. txt rdacontent n rdamedia nc rdacarrier (DE-588)1071861417 Konferenzschrift gnd-content Benninghoven, Alfred edt SIMS 6 1987 Versailles Sonstige (DE-588)5000470-0 oth |
| spellingShingle | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 |
| subject_GND | (DE-588)1071861417 |
| title | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 |
| title_auth | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 |
| title_exact_search | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 |
| title_full | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 ed.: A. Benninghoven ... |
| title_fullStr | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 ed.: A. Benninghoven ... |
| title_full_unstemmed | Secondary ion mass spectrometry proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 ed.: A. Benninghoven ... |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry proceedings of the sixth international conference on secondary ion mass spectrometry sims vi versailles paris france september 13 18th 1987 |
| title_sub | proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry(SIMS VI), Versailles, Paris, France, September 13 - 18th, 1987 |
| topic_facet | Konferenzschrift |
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