APA (7th ed.) Citation

Herr, E. (1994). Gate oxide integrity of BiMOS power devices ([Mikrofiche-Ausg.].).

Chicago Style (17th ed.) Citation

Herr, Egon. Gate Oxide Integrity of BiMOS Power Devices. [Mikrofiche-Ausg.]. 1994.

MLA (9th ed.) Citation

Herr, Egon. Gate Oxide Integrity of BiMOS Power Devices. [Mikrofiche-Ausg.]. 1994.

Warning: These citations may not always be 100% accurate.