Gate oxide integrity of BiMOS power devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Mikrofilm Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
1994
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| Ausgabe: | [Mikrofiche-Ausg.] |
| Schlagworte: | |
| Beschreibung: | 121 Bl. |
Internformat
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| 100 | 1 | |a Herr, Egon |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Gate oxide integrity of BiMOS power devices |c by Egon Herr |
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| 338 | |b he |2 rdacarrier | ||
| 502 | |a Zürich, Techn. Hochsch., Diss., 1994 | ||
| 533 | |a Mikroform-Ausgabe |n Mikrofiche-Ausg.: 2 Mikrofiches | ||
| 650 | 0 | 7 | |a Gate-Oxid |0 (DE-588)4269383-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a BIMOS |0 (DE-588)4260105-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 689 | 0 | 0 | |a BIMOS |0 (DE-588)4260105-8 |D s |
| 689 | 0 | 1 | |a Gate-Oxid |0 (DE-588)4269383-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 776 | 0 | 8 | |i Reproduktion von |a Herr, Egon |t Gate oxide integrity of BiMOS power devices |d 1994 |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018397578 | ||
Datensatz im Suchindex
| _version_ | 1804140391182630912 |
|---|---|
| any_adam_object | |
| author | Herr, Egon |
| author_facet | Herr, Egon |
| author_role | aut |
| author_sort | Herr, Egon |
| author_variant | e h eh |
| building | Verbundindex |
| bvnumber | BV024419977 |
| ctrlnum | (OCoLC)614360949 (DE-599)BVBBV024419977 |
| edition | [Mikrofiche-Ausg.] |
| format | Thesis Microfilm Book |
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| id | DE-604.BV024419977 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:59:14Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018397578 |
| oclc_num | 614360949 |
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| owner | DE-83 |
| owner_facet | DE-83 |
| physical | 121 Bl. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| record_format | marc |
| spelling | Herr, Egon Verfasser aut Gate oxide integrity of BiMOS power devices by Egon Herr [Mikrofiche-Ausg.] 1994 121 Bl. txt rdacontent h rdamedia he rdacarrier Zürich, Techn. Hochsch., Diss., 1994 Mikroform-Ausgabe Mikrofiche-Ausg.: 2 Mikrofiches Gate-Oxid (DE-588)4269383-4 gnd rswk-swf BIMOS (DE-588)4260105-8 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content BIMOS (DE-588)4260105-8 s Gate-Oxid (DE-588)4269383-4 s DE-604 Reproduktion von Herr, Egon Gate oxide integrity of BiMOS power devices 1994 |
| spellingShingle | Herr, Egon Gate oxide integrity of BiMOS power devices Gate-Oxid (DE-588)4269383-4 gnd BIMOS (DE-588)4260105-8 gnd |
| subject_GND | (DE-588)4269383-4 (DE-588)4260105-8 (DE-588)4113937-9 |
| title | Gate oxide integrity of BiMOS power devices |
| title_auth | Gate oxide integrity of BiMOS power devices |
| title_exact_search | Gate oxide integrity of BiMOS power devices |
| title_full | Gate oxide integrity of BiMOS power devices by Egon Herr |
| title_fullStr | Gate oxide integrity of BiMOS power devices by Egon Herr |
| title_full_unstemmed | Gate oxide integrity of BiMOS power devices by Egon Herr |
| title_short | Gate oxide integrity of BiMOS power devices |
| title_sort | gate oxide integrity of bimos power devices |
| topic | Gate-Oxid (DE-588)4269383-4 gnd BIMOS (DE-588)4260105-8 gnd |
| topic_facet | Gate-Oxid BIMOS Hochschulschrift |
| work_keys_str_mv | AT herregon gateoxideintegrityofbimospowerdevices |