Proceedings: November 6 - 8, 1996, Boston, Massachusetts
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Bibliographic Details
Corporate Author: International Symposium on Defect and Fault Tolerance in VLSI Systems Boston, Mass (Author)
Format: Conference Proceeding Book
Language:Undetermined
Published: LosAlamitos, Calif. <<[u.a.]>> IEEE Computer Soc. Press 1996
Subjects:
Physical Description:XI, 341 S. Ill., graph. Darst.
ISBN:0818675454

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