Imaging and illumination for metrology and inspection: 2 - 4 November 1994, Boston, Massachusetts
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
SPIE
1995
|
| Schriftenreihe: | Proceedings / SPIE
2348 |
| Schlagworte: | |
| Beschreibung: | VII, 276 S. Ill., graph. Darst. |
| ISBN: | 0819416835 |
Internformat
MARC
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| 245 | 1 | 0 | |a Imaging and illumination for metrology and inspection |b 2 - 4 November 1994, Boston, Massachusetts |c Donald J. Svetkoff, chair/ed. |
| 264 | 1 | |a Bellingham, Wash. |b SPIE |c 1995 | |
| 300 | |a VII, 276 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Proceedings / SPIE |v 2348 | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Svetkoff, Donald J. |4 edt | |
| 810 | 2 | |a SPIE |t Proceedings |v 2348 |w (DE-604)BV000010887 |9 2348 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018378819 | ||
Datensatz im Suchindex
| _version_ | 1804140365289095168 |
|---|---|
| any_adam_object | |
| author2 | Svetkoff, Donald J. |
| author2_role | edt |
| author2_variant | d j s dj djs |
| author_facet | Svetkoff, Donald J. |
| building | Verbundindex |
| bvnumber | BV024400071 |
| classification_rvk | ZQ 3150 |
| ctrlnum | (OCoLC)832439949 (DE-599)BVBBV024400071 |
| dewey-full | 670.425 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 670 - Manufacturing |
| dewey-raw | 670.425 |
| dewey-search | 670.425 |
| dewey-sort | 3670.425 |
| dewey-tens | 670 - Manufacturing |
| discipline | Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| format | Book |
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| genre_facet | Konferenzschrift |
| id | DE-604.BV024400071 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:58:49Z |
| institution | BVB |
| isbn | 0819416835 |
| language | Undetermined |
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| physical | VII, 276 S. Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | SPIE |
| record_format | marc |
| series2 | Proceedings / SPIE |
| spelling | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts Donald J. Svetkoff, chair/ed. Bellingham, Wash. SPIE 1995 VII, 276 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings / SPIE 2348 (DE-588)1071861417 Konferenzschrift gnd-content Svetkoff, Donald J. edt SPIE Proceedings 2348 (DE-604)BV000010887 2348 |
| spellingShingle | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts |
| subject_GND | (DE-588)1071861417 |
| title | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts |
| title_auth | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts |
| title_exact_search | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts |
| title_full | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts Donald J. Svetkoff, chair/ed. |
| title_fullStr | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts Donald J. Svetkoff, chair/ed. |
| title_full_unstemmed | Imaging and illumination for metrology and inspection 2 - 4 November 1994, Boston, Massachusetts Donald J. Svetkoff, chair/ed. |
| title_short | Imaging and illumination for metrology and inspection |
| title_sort | imaging and illumination for metrology and inspection 2 4 november 1994 boston massachusetts |
| title_sub | 2 - 4 November 1994, Boston, Massachusetts |
| topic_facet | Konferenzschrift |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT svetkoffdonaldj imagingandilluminationformetrologyandinspection24november1994bostonmassachusetts |