1994 IEEE international reliability physics proceedings: 32nd annual ; San Jose, California, April 12, 13, 14, 1994
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | Undetermined |
| Published: |
Piscataway, NJ
1994
|
| Subjects: | |
| Item Description: | Nebent.: 1994 IEEE annual international reliability physics |
| Physical Description: | XI, 505 S. Ill., graph. Darst. |
| ISBN: | 0780313585 0780313577 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024398267 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 950221s1994 ad|| |||| 10||| und d | ||
| 020 | |a 0780313585 |9 0-7803-1358-5 | ||
| 020 | |a 0780313577 |9 0-7803-1357-7 | ||
| 035 | |a (OCoLC)636702888 | ||
| 035 | |a (DE-599)BVBBV024398267 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 245 | 1 | 0 | |a 1994 IEEE international reliability physics proceedings |b 32nd annual ; San Jose, California, April 12, 13, 14, 1994 |c [1994 International Reliability Physics Symposium] |
| 246 | 1 | 3 | |a Nineteen hundred and ninety-four IEEE international reliability physics proceedings |
| 246 | 1 | 3 | |a 1994 IEEE annual international reliability physics |
| 246 | 1 | 3 | |a Nineteen hundred and ninety-four IEEE annual international reliability physics |
| 264 | 1 | |a Piscataway, NJ |c 1994 | |
| 300 | |a XI, 505 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Nebent.: 1994 IEEE annual international reliability physics | ||
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
| 711 | 2 | |a International Reliability Physics Symposium |n 32 |d 1994 |c San José, Calif. |j Sonstige |0 (DE-588)5128585-X |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018377104 | ||
Record in the Search Index
| _version_ | 1804140362946576384 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV024398267 |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)636702888 (DE-599)BVBBV024398267 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01481nam a2200349 c 4500</leader><controlfield tag="001">BV024398267</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">950221s1994 ad|| |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780313585</subfield><subfield code="9">0-7803-1358-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0780313577</subfield><subfield code="9">0-7803-1357-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)636702888</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024398267</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">1994 IEEE international reliability physics proceedings</subfield><subfield code="b">32nd annual ; San Jose, California, April 12, 13, 14, 1994</subfield><subfield code="c">[1994 International Reliability Physics Symposium]</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Nineteen hundred and ninety-four IEEE international reliability physics proceedings</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">1994 IEEE annual international reliability physics</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Nineteen hundred and ninety-four IEEE annual international reliability physics</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, NJ</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XI, 505 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Nebent.: 1994 IEEE annual international reliability physics</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Reliability Physics Symposium</subfield><subfield code="n">32</subfield><subfield code="d">1994</subfield><subfield code="c">San José, Calif.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5128585-X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018377104</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV024398267 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:58:47Z |
| institution | BVB |
| institution_GND | (DE-588)1692-5 (DE-588)5128585-X |
| isbn | 0780313585 0780313577 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018377104 |
| oclc_num | 636702888 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XI, 505 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| record_format | marc |
| spelling | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 [1994 International Reliability Physics Symposium] Nineteen hundred and ninety-four IEEE international reliability physics proceedings 1994 IEEE annual international reliability physics Nineteen hundred and ninety-four IEEE annual international reliability physics Piscataway, NJ 1994 XI, 505 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Nebent.: 1994 IEEE annual international reliability physics (DE-588)1071861417 Konferenzschrift gnd-content Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth International Reliability Physics Symposium 32 1994 San José, Calif. Sonstige (DE-588)5128585-X oth |
| spellingShingle | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 |
| subject_GND | (DE-588)1071861417 |
| title | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 |
| title_alt | Nineteen hundred and ninety-four IEEE international reliability physics proceedings 1994 IEEE annual international reliability physics Nineteen hundred and ninety-four IEEE annual international reliability physics |
| title_auth | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 |
| title_exact_search | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 |
| title_full | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 [1994 International Reliability Physics Symposium] |
| title_fullStr | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 [1994 International Reliability Physics Symposium] |
| title_full_unstemmed | 1994 IEEE international reliability physics proceedings 32nd annual ; San Jose, California, April 12, 13, 14, 1994 [1994 International Reliability Physics Symposium] |
| title_short | 1994 IEEE international reliability physics proceedings |
| title_sort | 1994 ieee international reliability physics proceedings 32nd annual san jose california april 12 13 14 1994 |
| title_sub | 32nd annual ; San Jose, California, April 12, 13, 14, 1994 |
| topic_facet | Konferenzschrift |
| work_keys_str_mv | AT instituteofelectricalandelectronicsengineers 1994ieeeinternationalreliabilityphysicsproceedings32ndannualsanjosecaliforniaapril1213141994 AT internationalreliabilityphysicssymposiumsanjosecalif 1994ieeeinternationalreliabilityphysicsproceedings32ndannualsanjosecaliforniaapril1213141994 AT instituteofelectricalandelectronicsengineers nineteenhundredandninetyfourieeeinternationalreliabilityphysicsproceedings AT internationalreliabilityphysicssymposiumsanjosecalif nineteenhundredandninetyfourieeeinternationalreliabilityphysicsproceedings AT instituteofelectricalandelectronicsengineers 1994ieeeannualinternationalreliabilityphysics AT internationalreliabilityphysicssymposiumsanjosecalif 1994ieeeannualinternationalreliabilityphysics AT instituteofelectricalandelectronicsengineers nineteenhundredandninetyfourieeeannualinternationalreliabilityphysics AT internationalreliabilityphysicssymposiumsanjosecalif nineteenhundredandninetyfourieeeannualinternationalreliabilityphysics |