The influence of process induced defects on electrical properties of silicon junctions:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Göteborg
1992
|
| Schriftenreihe: | Doktorsavhandlingar vid Chalmers Tekniska Högskola
N.F.,844 |
| Schlagworte: | |
| Beschreibung: | Getr. Zählung Ill., graph. Darst. |
| ISBN: | 9170326754 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV024386158 | ||
| 003 | DE-604 | ||
| 005 | 20150213 | ||
| 007 | t | ||
| 008 | 931129s1992 ad|| m||| 00||| und d | ||
| 020 | |a 9170326754 |9 91-7032-675-4 | ||
| 035 | |a (OCoLC)180547934 | ||
| 035 | |a (DE-599)BVBBV024386158 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 100 | 1 | |a Andersson, Gert I. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a The influence of process induced defects on electrical properties of silicon junctions |c Gert I. Andersson |
| 264 | 1 | |a Göteborg |c 1992 | |
| 300 | |a Getr. Zählung |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Doktorsavhandlingar vid Chalmers Tekniska Högskola |v N.F.,844 | |
| 490 | 1 | |a Technical report / School of Electrical and Computer Engineering |v 226 | |
| 502 | |a Zugl.: Göteborg, Univ., Diss., 1992 | ||
| 655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
| 810 | 2 | |a School of Electrical and Computer Engineering |t Technical report |v 226 |w (DE-604)BV024368839 |9 226 | |
| 830 | 0 | |a Doktorsavhandlingar vid Chalmers Tekniska Högskola |v N.F.,844 |w (DE-604)BV008915633 |9 844 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018365686 | ||
Datensatz im Suchindex
| _version_ | 1804140346857226240 |
|---|---|
| any_adam_object | |
| author | Andersson, Gert I. |
| author_facet | Andersson, Gert I. |
| author_role | aut |
| author_sort | Andersson, Gert I. |
| author_variant | g i a gi gia |
| building | Verbundindex |
| bvnumber | BV024386158 |
| ctrlnum | (OCoLC)180547934 (DE-599)BVBBV024386158 |
| format | Thesis Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01258nam a2200325 cb4500</leader><controlfield tag="001">BV024386158</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20150213 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">931129s1992 ad|| m||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9170326754</subfield><subfield code="9">91-7032-675-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)180547934</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024386158</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Andersson, Gert I.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">The influence of process induced defects on electrical properties of silicon junctions</subfield><subfield code="c">Gert I. Andersson</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Göteborg</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Getr. Zählung</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Doktorsavhandlingar vid Chalmers Tekniska Högskola</subfield><subfield code="v">N.F.,844</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Technical report / School of Electrical and Computer Engineering</subfield><subfield code="v">226</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="a">Zugl.: Göteborg, Univ., Diss., 1992</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">School of Electrical and Computer Engineering</subfield><subfield code="t">Technical report</subfield><subfield code="v">226</subfield><subfield code="w">(DE-604)BV024368839</subfield><subfield code="9">226</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Doktorsavhandlingar vid Chalmers Tekniska Högskola</subfield><subfield code="v">N.F.,844</subfield><subfield code="w">(DE-604)BV008915633</subfield><subfield code="9">844</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018365686</subfield></datafield></record></collection> |
| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV024386158 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:58:31Z |
| institution | BVB |
| isbn | 9170326754 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018365686 |
| oclc_num | 180547934 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | Getr. Zählung Ill., graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| record_format | marc |
| series | Doktorsavhandlingar vid Chalmers Tekniska Högskola |
| series2 | Doktorsavhandlingar vid Chalmers Tekniska Högskola Technical report / School of Electrical and Computer Engineering |
| spelling | Andersson, Gert I. Verfasser aut The influence of process induced defects on electrical properties of silicon junctions Gert I. Andersson Göteborg 1992 Getr. Zählung Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Doktorsavhandlingar vid Chalmers Tekniska Högskola N.F.,844 Technical report / School of Electrical and Computer Engineering 226 Zugl.: Göteborg, Univ., Diss., 1992 (DE-588)4113937-9 Hochschulschrift gnd-content School of Electrical and Computer Engineering Technical report 226 (DE-604)BV024368839 226 Doktorsavhandlingar vid Chalmers Tekniska Högskola N.F.,844 (DE-604)BV008915633 844 |
| spellingShingle | Andersson, Gert I. The influence of process induced defects on electrical properties of silicon junctions Doktorsavhandlingar vid Chalmers Tekniska Högskola |
| subject_GND | (DE-588)4113937-9 |
| title | The influence of process induced defects on electrical properties of silicon junctions |
| title_auth | The influence of process induced defects on electrical properties of silicon junctions |
| title_exact_search | The influence of process induced defects on electrical properties of silicon junctions |
| title_full | The influence of process induced defects on electrical properties of silicon junctions Gert I. Andersson |
| title_fullStr | The influence of process induced defects on electrical properties of silicon junctions Gert I. Andersson |
| title_full_unstemmed | The influence of process induced defects on electrical properties of silicon junctions Gert I. Andersson |
| title_short | The influence of process induced defects on electrical properties of silicon junctions |
| title_sort | the influence of process induced defects on electrical properties of silicon junctions |
| topic_facet | Hochschulschrift |
| volume_link | (DE-604)BV024368839 (DE-604)BV008915633 |
| work_keys_str_mv | AT anderssongerti theinfluenceofprocessinduceddefectsonelectricalpropertiesofsiliconjunctions |