Test, measurements, and characterization of electrooptic devices and systems: 8. September 1989, Boston, Mass.
Saved in:
| Other Authors: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash.
1990
|
| Series: | Proceedings / SPIE
1180 |
| Subjects: | |
| Physical Description: | VI, 196 S. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV024378751 | ||
| 003 | DE-604 | ||
| 005 | 20151110 | ||
| 007 | t | ||
| 008 | 930122s1990 |||| 10||| eng d | ||
| 035 | |a (OCoLC)916364511 | ||
| 035 | |a (DE-599)BVBBV024378751 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-83 | ||
| 245 | 1 | 0 | |a Test, measurements, and characterization of electrooptic devices and systems |b 8. September 1989, Boston, Mass. |c Shekhar G. Wadekar, ed. |
| 264 | 1 | |a Bellingham, Wash. |c 1990 | |
| 300 | |a VI, 196 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Proceedings / SPIE |v 1180 | |
| 650 | 0 | 7 | |a Elektrooptisches Bauelement |0 (DE-588)4199294-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1989 |z Boston Mass. |2 gnd-content | |
| 689 | 0 | 0 | |a Elektrooptisches Bauelement |0 (DE-588)4199294-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Wadekar, Shekhar G. |4 edt | |
| 810 | 2 | |a SPIE |t Proceedings |v 1180 |w (DE-604)BV000010887 |9 1180 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018358747 | ||
Record in the Search Index
| _version_ | 1804140337133780992 |
|---|---|
| any_adam_object | |
| author2 | Wadekar, Shekhar G. |
| author2_role | edt |
| author2_variant | s g w sg sgw |
| author_facet | Wadekar, Shekhar G. |
| building | Verbundindex |
| bvnumber | BV024378751 |
| ctrlnum | (OCoLC)916364511 (DE-599)BVBBV024378751 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01079nam a2200313 cb4500</leader><controlfield tag="001">BV024378751</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20151110 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930122s1990 |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916364511</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024378751</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Test, measurements, and characterization of electrooptic devices and systems</subfield><subfield code="b">8. September 1989, Boston, Mass.</subfield><subfield code="c">Shekhar G. Wadekar, ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 196 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings / SPIE</subfield><subfield code="v">1180</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrooptisches Bauelement</subfield><subfield code="0">(DE-588)4199294-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1989</subfield><subfield code="z">Boston Mass.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektrooptisches Bauelement</subfield><subfield code="0">(DE-588)4199294-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wadekar, Shekhar G.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">SPIE</subfield><subfield code="t">Proceedings</subfield><subfield code="v">1180</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">1180</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018358747</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1989 Boston Mass. gnd-content |
| genre_facet | Konferenzschrift 1989 Boston Mass. |
| id | DE-604.BV024378751 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:58:22Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018358747 |
| oclc_num | 916364511 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | VI, 196 S. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| record_format | marc |
| series2 | Proceedings / SPIE |
| spelling | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. Bellingham, Wash. 1990 VI, 196 S. txt rdacontent n rdamedia nc rdacarrier Proceedings / SPIE 1180 Elektrooptisches Bauelement (DE-588)4199294-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1989 Boston Mass. gnd-content Elektrooptisches Bauelement (DE-588)4199294-5 s DE-604 Wadekar, Shekhar G. edt SPIE Proceedings 1180 (DE-604)BV000010887 1180 |
| spellingShingle | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Elektrooptisches Bauelement (DE-588)4199294-5 gnd |
| subject_GND | (DE-588)4199294-5 (DE-588)1071861417 |
| title | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. |
| title_auth | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. |
| title_exact_search | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. |
| title_full | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. |
| title_fullStr | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. |
| title_full_unstemmed | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. |
| title_short | Test, measurements, and characterization of electrooptic devices and systems |
| title_sort | test measurements and characterization of electrooptic devices and systems 8 september 1989 boston mass |
| title_sub | 8. September 1989, Boston, Mass. |
| topic | Elektrooptisches Bauelement (DE-588)4199294-5 gnd |
| topic_facet | Elektrooptisches Bauelement Konferenzschrift 1989 Boston Mass. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT wadekarshekharg testmeasurementsandcharacterizationofelectroopticdevicesandsystems8september1989bostonmass |