Test, measurements, and characterization of electrooptic devices and systems: 8. September 1989, Boston, Mass.
Gespeichert in:
Weitere Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Bellingham, Wash.
1990
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Schriftenreihe: | Proceedings / SPIE
1180 |
Schlagworte: | |
Beschreibung: | VI, 196 S. |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV024378751 | ||
003 | DE-604 | ||
005 | 20151110 | ||
007 | t | ||
008 | 930122s1990 |||| 10||| eng d | ||
035 | |a (OCoLC)916364511 | ||
035 | |a (DE-599)BVBBV024378751 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-83 | ||
245 | 1 | 0 | |a Test, measurements, and characterization of electrooptic devices and systems |b 8. September 1989, Boston, Mass. |c Shekhar G. Wadekar, ed. |
264 | 1 | |a Bellingham, Wash. |c 1990 | |
300 | |a VI, 196 S. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Proceedings / SPIE |v 1180 | |
650 | 0 | 7 | |a Elektrooptisches Bauelement |0 (DE-588)4199294-5 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1989 |z Boston Mass. |2 gnd-content | |
689 | 0 | 0 | |a Elektrooptisches Bauelement |0 (DE-588)4199294-5 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Wadekar, Shekhar G. |4 edt | |
810 | 2 | |a SPIE |t Proceedings |v 1180 |w (DE-604)BV000010887 |9 1180 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-018358747 |
Datensatz im Suchindex
_version_ | 1804140337133780992 |
---|---|
any_adam_object | |
author2 | Wadekar, Shekhar G. |
author2_role | edt |
author2_variant | s g w sg sgw |
author_facet | Wadekar, Shekhar G. |
building | Verbundindex |
bvnumber | BV024378751 |
ctrlnum | (OCoLC)916364511 (DE-599)BVBBV024378751 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01079nam a2200313 cb4500</leader><controlfield tag="001">BV024378751</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20151110 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930122s1990 |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916364511</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024378751</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Test, measurements, and characterization of electrooptic devices and systems</subfield><subfield code="b">8. September 1989, Boston, Mass.</subfield><subfield code="c">Shekhar G. Wadekar, ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 196 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Proceedings / SPIE</subfield><subfield code="v">1180</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektrooptisches Bauelement</subfield><subfield code="0">(DE-588)4199294-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1989</subfield><subfield code="z">Boston Mass.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektrooptisches Bauelement</subfield><subfield code="0">(DE-588)4199294-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Wadekar, Shekhar G.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">SPIE</subfield><subfield code="t">Proceedings</subfield><subfield code="v">1180</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">1180</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018358747</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1989 Boston Mass. gnd-content |
genre_facet | Konferenzschrift 1989 Boston Mass. |
id | DE-604.BV024378751 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T21:58:22Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018358747 |
oclc_num | 916364511 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | VI, 196 S. |
publishDate | 1990 |
publishDateSearch | 1990 |
publishDateSort | 1990 |
record_format | marc |
series2 | Proceedings / SPIE |
spelling | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. Bellingham, Wash. 1990 VI, 196 S. txt rdacontent n rdamedia nc rdacarrier Proceedings / SPIE 1180 Elektrooptisches Bauelement (DE-588)4199294-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1989 Boston Mass. gnd-content Elektrooptisches Bauelement (DE-588)4199294-5 s DE-604 Wadekar, Shekhar G. edt SPIE Proceedings 1180 (DE-604)BV000010887 1180 |
spellingShingle | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Elektrooptisches Bauelement (DE-588)4199294-5 gnd |
subject_GND | (DE-588)4199294-5 (DE-588)1071861417 |
title | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. |
title_auth | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. |
title_exact_search | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. |
title_full | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. |
title_fullStr | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. |
title_full_unstemmed | Test, measurements, and characterization of electrooptic devices and systems 8. September 1989, Boston, Mass. Shekhar G. Wadekar, ed. |
title_short | Test, measurements, and characterization of electrooptic devices and systems |
title_sort | test measurements and characterization of electrooptic devices and systems 8 september 1989 boston mass |
title_sub | 8. September 1989, Boston, Mass. |
topic | Elektrooptisches Bauelement (DE-588)4199294-5 gnd |
topic_facet | Elektrooptisches Bauelement Konferenzschrift 1989 Boston Mass. |
volume_link | (DE-604)BV000010887 |
work_keys_str_mv | AT wadekarshekharg testmeasurementsandcharacterizationofelectroopticdevicesandsystems8september1989bostonmass |