Proceedings of the 1991 International Conference on Microelectronic Test Structures: March 18 - 20, 1991, Kyoto, Japan
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
New York, NY
1991
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| Schriftenreihe: | Proceedings on microelectronic test structures
4,1 |
| Schlagworte: | |
| Beschreibung: | XII, 264 S. Ill., graph. Darst. |
| ISBN: | 087942589X 0879425881 |
Internformat
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Datensatz im Suchindex
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| isbn | 087942589X 0879425881 |
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| physical | XII, 264 S. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| record_format | marc |
| series | Proceedings on microelectronic test structures |
| series2 | Proceedings on microelectronic test structures |
| spelling | ICMTS 4 1991 Kyōto Verfasser (DE-588)5059509-X aut Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan IEEE ... New York, NY 1991 XII, 264 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Proceedings on microelectronic test structures 4,1 Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Kyōto (DE-588)4073426-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s Kyōto (DE-588)4073426-2 g 1\p DE-604 Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth Proceedings on microelectronic test structures 4,1 (DE-604)BV024383198 4,1 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan Proceedings on microelectronic test structures Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)4073426-2 (DE-588)1071861417 |
| title | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan |
| title_auth | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan |
| title_exact_search | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan |
| title_full | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan IEEE ... |
| title_fullStr | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan IEEE ... |
| title_full_unstemmed | Proceedings of the 1991 International Conference on Microelectronic Test Structures March 18 - 20, 1991, Kyoto, Japan IEEE ... |
| title_short | Proceedings of the 1991 International Conference on Microelectronic Test Structures |
| title_sort | proceedings of the 1991 international conference on microelectronic test structures march 18 20 1991 kyoto japan |
| title_sub | March 18 - 20, 1991, Kyoto, Japan |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Kyōto Konferenzschrift |
| volume_link | (DE-604)BV024383198 |
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