VLSI reliability:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
San Diego, Calif. <<[u.a.]>>
Acad. Pr.
1990
|
| Schriftenreihe: | VLSI electronics, microstructure science
22 |
| Beschreibung: | XIII, 207 S. graph. Darst. |
| ISBN: | 0122341228 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV024370885 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 911105s1990 d||| |||| 00||| und d | ||
| 020 | |a 0122341228 |9 0-12-234122-8 | ||
| 035 | |a (OCoLC)635964826 | ||
| 035 | |a (DE-599)BVBBV024370885 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 084 | |a ZN 4040 |0 (DE-625)157343: |2 rvk | ||
| 100 | 1 | |a Sabnis, Anant G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a VLSI reliability |c Anant G. Sabnis |
| 264 | 1 | |a San Diego, Calif. <<[u.a.]>> |b Acad. Pr. |c 1990 | |
| 300 | |a XIII, 207 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a VLSI electronics, microstructure science |v 22 | |
| 830 | 0 | |a VLSI electronics, microstructure science |v 22 |w (DE-604)BV009495884 |9 22 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018351450 | ||
Datensatz im Suchindex
| _version_ | 1804140326649069568 |
|---|---|
| any_adam_object | |
| author | Sabnis, Anant G. |
| author_facet | Sabnis, Anant G. |
| author_role | aut |
| author_sort | Sabnis, Anant G. |
| author_variant | a g s ag ags |
| building | Verbundindex |
| bvnumber | BV024370885 |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)635964826 (DE-599)BVBBV024370885 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00898nam a2200289 cb4500</leader><controlfield tag="001">BV024370885</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">911105s1990 d||| |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0122341228</subfield><subfield code="9">0-12-234122-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)635964826</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024370885</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4040</subfield><subfield code="0">(DE-625)157343:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sabnis, Anant G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">VLSI reliability</subfield><subfield code="c">Anant G. Sabnis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">San Diego, Calif. <<[u.a.]>></subfield><subfield code="b">Acad. Pr.</subfield><subfield code="c">1990</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 207 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">VLSI electronics, microstructure science</subfield><subfield code="v">22</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">VLSI electronics, microstructure science</subfield><subfield code="v">22</subfield><subfield code="w">(DE-604)BV009495884</subfield><subfield code="9">22</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018351450</subfield></datafield></record></collection> |
| id | DE-604.BV024370885 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:58:12Z |
| institution | BVB |
| isbn | 0122341228 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018351450 |
| oclc_num | 635964826 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XIII, 207 S. graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Acad. Pr. |
| record_format | marc |
| series | VLSI electronics, microstructure science |
| series2 | VLSI electronics, microstructure science |
| spelling | Sabnis, Anant G. Verfasser aut VLSI reliability Anant G. Sabnis San Diego, Calif. <<[u.a.]>> Acad. Pr. 1990 XIII, 207 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier VLSI electronics, microstructure science 22 VLSI electronics, microstructure science 22 (DE-604)BV009495884 22 |
| spellingShingle | Sabnis, Anant G. VLSI reliability VLSI electronics, microstructure science |
| title | VLSI reliability |
| title_auth | VLSI reliability |
| title_exact_search | VLSI reliability |
| title_full | VLSI reliability Anant G. Sabnis |
| title_fullStr | VLSI reliability Anant G. Sabnis |
| title_full_unstemmed | VLSI reliability Anant G. Sabnis |
| title_short | VLSI reliability |
| title_sort | vlsi reliability |
| volume_link | (DE-604)BV009495884 |
| work_keys_str_mv | AT sabnisanantg vlsireliability |