The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
1985
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Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV024303928 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 090924s1985 |||| 00||| und d | ||
| 035 | |a (OCoLC)916202035 | ||
| 035 | |a (DE-599)BVBBV024303928 | ||
| 040 | |a DE-604 |b ger |e pi | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 100 | 1 | |a Krull, Wade Allen |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| 264 | 1 | |c 1985 | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 940 | 1 | |q TUB-n | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018205235 | ||
Datensatz im Suchindex
| _version_ | 1804140176969039872 |
|---|---|
| any_adam_object | |
| author | Krull, Wade Allen |
| author_facet | Krull, Wade Allen |
| author_role | aut |
| author_sort | Krull, Wade Allen |
| author_variant | w a k wa wak |
| building | Verbundindex |
| bvnumber | BV024303928 |
| ctrlnum | (OCoLC)916202035 (DE-599)BVBBV024303928 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00666nam a2200241 c 4500</leader><controlfield tag="001">BV024303928</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">090924s1985 |||| 00||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916202035</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024303928</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">pi</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Krull, Wade Allen</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1985</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-n</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018205235</subfield></datafield></record></collection> |
| id | DE-604.BV024303928 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:55:49Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018205235 |
| oclc_num | 916202035 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| psigel | TUB-n |
| publishDate | 1985 |
| publishDateSearch | 1985 |
| publishDateSort | 1985 |
| record_format | marc |
| spelling | Krull, Wade Allen Verfasser aut The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films 1985 txt rdacontent n rdamedia nc rdacarrier |
| spellingShingle | Krull, Wade Allen The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_auth | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_exact_search | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_full | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_fullStr | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_full_unstemmed | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_short | The Effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| title_sort | the effects of nonuniformity on the modeling or resistivity in polycrystalline silicon thin films |
| work_keys_str_mv | AT krullwadeallen theeffectsofnonuniformityonthemodelingorresistivityinpolycrystallinesiliconthinfilms |