Proceedings of the 18th International Conference on Defects in Semiconductors: Sendai, Japan, July 23 - 28, 1995 2
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Zürich <<[u.a.]>>
Trans Tech Publ.
1995
|
| Schriftenreihe: | Defects in semiconductors
18,2 Materials science forum 196/201,2 |
| Beschreibung: | (1995). - LXIII, S. 579 - S. 1101 graph. Darst. |
| ISBN: | 0878497137 |
Internformat
MARC
| LEADER | 00000nam a2200000 cc4500 | ||
|---|---|---|---|
| 001 | BV024173553 | ||
| 003 | DE-604 | ||
| 005 | 20090910 | ||
| 007 | t | ||
| 008 | 960510s1995 d||| |||| 00||| und d | ||
| 020 | |a 0878497137 |9 0-87849-713-7 | ||
| 035 | |a (OCoLC)916099697 | ||
| 035 | |a (DE-599)BVBBV024173553 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-83 | ||
| 111 | 2 | |a International Conference on Defects in Semiconductors |n 18 |d 1995 |c Sendai |j Verfasser |0 (DE-588)5177034-9 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the 18th International Conference on Defects in Semiconductors |b Sendai, Japan, July 23 - 28, 1995 |n 2 |c ed. by Masashi Suezawa ... |
| 264 | 1 | |a Zürich <<[u.a.]>> |b Trans Tech Publ. |c 1995 | |
| 300 | |a (1995). - LXIII, S. 579 - S. 1101 |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Defects in semiconductors |v 18,2 | |
| 490 | 1 | |a Materials science forum |v 196/201,2 | |
| 490 | 0 | |a Defects in semiconductors |v 18 | |
| 490 | 0 | |a Materials science forum |v 196/201 | |
| 700 | 1 | |a Suezawa, Masashi |4 edt | |
| 773 | 0 | 8 | |w (DE-604)BV024135612 |g 2 |
| 830 | 0 | |a Defects in semiconductors |v 18,2 |w (DE-604)BV024374451 |9 18,2 | |
| 830 | 0 | |a Materials science forum |v 196/201,2 |w (DE-604)BV001902147 |9 196/201,2 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018297066 | ||
Datensatz im Suchindex
| _version_ | 1804140265953296384 |
|---|---|
| any_adam_object | |
| author2 | Suezawa, Masashi |
| author2_role | edt |
| author2_variant | m s ms |
| author_corporate | International Conference on Defects in Semiconductors Sendai |
| author_corporate_role | aut |
| author_facet | Suezawa, Masashi International Conference on Defects in Semiconductors Sendai |
| author_sort | International Conference on Defects in Semiconductors Sendai |
| building | Verbundindex |
| bvnumber | BV024173553 |
| ctrlnum | (OCoLC)916099697 (DE-599)BVBBV024173553 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01336nam a2200349 cc4500</leader><controlfield tag="001">BV024173553</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">960510s1995 d||| |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0878497137</subfield><subfield code="9">0-87849-713-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)916099697</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024173553</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Conference on Defects in Semiconductors</subfield><subfield code="n">18</subfield><subfield code="d">1995</subfield><subfield code="c">Sendai</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5177034-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the 18th International Conference on Defects in Semiconductors</subfield><subfield code="b">Sendai, Japan, July 23 - 28, 1995</subfield><subfield code="n">2</subfield><subfield code="c">ed. by Masashi Suezawa ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Zürich <<[u.a.]>></subfield><subfield code="b">Trans Tech Publ.</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">(1995). - LXIII, S. 579 - S. 1101</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Defects in semiconductors</subfield><subfield code="v">18,2</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials science forum</subfield><subfield code="v">196/201,2</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Defects in semiconductors</subfield><subfield code="v">18</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Materials science forum</subfield><subfield code="v">196/201</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Suezawa, Masashi</subfield><subfield code="4">edt</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="w">(DE-604)BV024135612</subfield><subfield code="g">2</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Defects in semiconductors</subfield><subfield code="v">18,2</subfield><subfield code="w">(DE-604)BV024374451</subfield><subfield code="9">18,2</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials science forum</subfield><subfield code="v">196/201,2</subfield><subfield code="w">(DE-604)BV001902147</subfield><subfield code="9">196/201,2</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018297066</subfield></datafield></record></collection> |
| id | DE-604.BV024173553 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:57:14Z |
| institution | BVB |
| institution_GND | (DE-588)5177034-9 |
| isbn | 0878497137 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018297066 |
| oclc_num | 916099697 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | (1995). - LXIII, S. 579 - S. 1101 graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Trans Tech Publ. |
| record_format | marc |
| series | Defects in semiconductors Materials science forum |
| series2 | Defects in semiconductors Materials science forum |
| spelling | International Conference on Defects in Semiconductors 18 1995 Sendai Verfasser (DE-588)5177034-9 aut Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 2 ed. by Masashi Suezawa ... Zürich <<[u.a.]>> Trans Tech Publ. 1995 (1995). - LXIII, S. 579 - S. 1101 graph. Darst. txt rdacontent n rdamedia nc rdacarrier Defects in semiconductors 18,2 Materials science forum 196/201,2 Defects in semiconductors 18 Materials science forum 196/201 Suezawa, Masashi edt (DE-604)BV024135612 2 Defects in semiconductors 18,2 (DE-604)BV024374451 18,2 Materials science forum 196/201,2 (DE-604)BV001902147 196/201,2 |
| spellingShingle | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 Defects in semiconductors Materials science forum |
| title | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 |
| title_auth | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 |
| title_exact_search | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 |
| title_full | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 2 ed. by Masashi Suezawa ... |
| title_fullStr | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 2 ed. by Masashi Suezawa ... |
| title_full_unstemmed | Proceedings of the 18th International Conference on Defects in Semiconductors Sendai, Japan, July 23 - 28, 1995 2 ed. by Masashi Suezawa ... |
| title_short | Proceedings of the 18th International Conference on Defects in Semiconductors |
| title_sort | proceedings of the 18th international conference on defects in semiconductors sendai japan july 23 28 1995 |
| title_sub | Sendai, Japan, July 23 - 28, 1995 |
| volume_link | (DE-604)BV024135612 (DE-604)BV024374451 (DE-604)BV001902147 |
| work_keys_str_mv | AT internationalconferenceondefectsinsemiconductorssendai proceedingsofthe18thinternationalconferenceondefectsinsemiconductorssendaijapanjuly232819952 AT suezawamasashi proceedingsofthe18thinternationalconferenceondefectsinsemiconductorssendaijapanjuly232819952 |