Second International Symposium on Measurement Technology and Intelligent Instruments: 29 October - 5 November 1993, Wuhan, China
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Bibliographic Details
Corporate Author: International Symposium on Measurement Technology and Intelligent Instruments Wuhan (Author)
Other Authors: Li, Zhu (Editor)
Format: Conference Proceeding Book
Language:Undetermined
Published: Bellingham, Wash.
Series:Proceedings / SPIE 2101
Subjects:
ISBN:0819413844

There is no print copy available.

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