Fourier transform infrared spectrometry:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York <<[u.a.]>>
Wiley
2007
|
| Ausgabe: | 2. ed. |
| Schriftenreihe: | Chemical analysis
171 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIII, 529 S. graph. Darst. |
| ISBN: | 0471099023 |
Internformat
MARC
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| 100 | 1 | |a Griffiths, Peter R. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Fourier transform infrared spectrometry |c Peter R. Griffiths ; James A. De Haseth |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a New York <<[u.a.]>> |b Wiley |c 2007 | |
| 300 | |a XIII, 529 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Chemical analysis |v 171 | |
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| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804140305283284992 |
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* * * * * * * * * * * * * * * * * * * * * * * * * * * * * * * V VI
CONTENTS CHAPTER 3 SAMPLING THE INTERFEROGRAM 57* 3.1. SAMPLING
FREQUENCY 57* 3.1.1. NYQUIST FREQUENCY 57* 3.1.2. CONCEPTUAL DISCUSSION
OF ALIASING 58* 3.1.3. MATHEMATICAL DISCUSSION OF ALIASING 60* 3.2.
ALIASING 62* 3.3. DYNAMIC RANGE 64* 3.3.1. ADC SPECIFICATIONS 64* 3.3.2.
DIGITIZATION NOISE 66* 3.3.3. GAIN RANGING 68* 3.3.4. CHIRPING 69* 3.4.
ANALOG-TO-DIGITAL CONVERTERS 71* CHAPTER 4 FOURIER TRANSFORMS 75* 4.1.
CLASSICAL FOURIER TRANSFORM 75* 4.1.1. ELEMENTARY CONCEPTS 75* 4.1.2.
MATHEMATICAL BASIS 76* 4.2. FAST FOURIER TRANSFORM 78* 4.3. PHASE
CORRECTION 85* 4.4. FOURIER TRANSFORM: PICTORIAL ESSAY 88* 4.5. DATA
SYSTEMS 93* CHAPTER 5 TWO-BEAM INTERFEROMETERS 97* 5.1.* MICHELSON-TYPE
INTERFEROMETERS 97* 5.2.* TILT-COMPENSATED INTERFEROMETERS 112* 5.3.*
REFRACTIVELY SCANNED INTERFEROMETERS 123* 5.4.* POLARIZATION
INTERFEROMETERS 125* 5.5.* STEP-SCAN INTERFEROMETERS 127* 5.6.*
STATIONARY INTERFEROMETERS 128* 5.7.* BEAMSPLITTERS 132* 5.1.1.
INTRODUCTION 97* 5.1.2. DRIVE 97* 5.1.3. BEARINGS 98* 5.1.4. FRINGE
REFERENCING 104* 5.1.5. DYNAMIC ALIGNMENT 110* 5.2.1. CUBE-CORNER
INTERFEROMETERS 112* 5.2.2. OTHER DESIGNS 118* CONTENTS* VII* 5.8.
LAMELLAR GRATING INTERFEROMETERS 138* APPENDIX: MANUFACTURERS OF FR-IR
SPECTROMETERS 142* CHAPTER 6* OTHER COMPONENTS OF FT-IR* SPECTROMETERS
143* 6.1.* INFRARED RADIATION SOURCES FOR TRANSMISSION* AND REFLECTION
SPECTROMETRY 143* 6.1.1.* MID-INFRARED SOURCES 143* 6.1.2.*
NEAR-INFRARED SOURCES 145* 6.1.3.* FAR-INFRARED SOURCES 146* 6.2.*
DETECTORS 146* 6.2.1.* THERMAL DETECTORS 146* 6.2.2.* QUANTUM DETECTORS
148* 6.3.* OPTICS 152* 6.3.1.* PARABOLOIDAL MIRRORS 152* 6.3.2.* PLANE
MIRRORS 155* 6.3.3.* ELLIPSOIDS, TOROIDS, AND OTHER* ASPHERICAL MIRRORS
155* 6.4.* SPECTROMETER DESIGN 156* CHAPTER 7* SIGNAL-TO-NOISE RATIO
161* 7.J.* DETECTOR NOISE 161* 7.2.* TRADING RULES IN FR-IR SPECTROMETRY
164* 7.2.1.* EFFECT OF RESOLUTION AND* THROUGHPUT ON SNR 164* 7.2.2.*
EFFECT OF APODIZATION 165* 7.2.3.* EFFECT OF CHANGING MIRROR VELOCITY
165* 7.3.* DIGITIZATION NOISE 166* 7.4.* OTHER SOURCES OF NOISE 167*
7.4.1.* SAMPLING ERROR 167* 7.4.2.* FOLDING 168* 7.4.3.* FLUCTUATION
NOISE 169* 7.4.4.* SHOT NOISE 170* 7.5.* INTERFEROMETERS VERSUS GRATING
SPECTROMETERS 171* 7.5.1.* FELLGETT S ADVANTAGE 171* 7.5.2.* JACQUINOT S
ADVANTAGE 172* 7.5.3.* OTHER FACTORS 173* VLLL* CONTENTS CHAPTER 8*
PHOTOMETRIC ACCURACY IN* FT-IR SPECTROMETRY 177* S.I. LNTRODUCTION* 177*
8.2. EFFECT OF SPECTRAL RESOLUTION* 177* 8.3. EFFECT OF APODIZATION*
180* 8.3.1. TRIANGULAR APODIZATION* 180* 8.3.2. NORTON-BEER APODIZATION
FUNCTIONS 181* 8.4. 100% LINES* ISI 8.4.1. SHORT-TERM PERFORMANCE* 181*
8.4.2. GLITCHES (NONRANDOM NOISE SOURCES) 184* 8.4.3. LONG- TERM
PERFORMANCE* 185* 8.4.4. EFFECT OF SAMPIE DIAMETER AND THICKNESS 186*
8.5. ZERO ENERGY LEVEL* 187* 8.5.1. DETECTOR RESPONSE NONLINEARITY 187*
8.5.2. CHANGES IN MODULATION EFFICIENCY 191* 8.5.3. SAMPLING EFFECTS*
193* 8.6. LINEARITY BETWEEN 100% AND O%T* 194* CHAPTER 9* QUANTITATIVE
ANALYSIS 197* 9. I. INTRODUCTION* 197* 9.2. BEER S LAW* 197* 9.3.
SPECTRAL SUBTRACTION* 201* 9.4. LINEAR LEAST-SQUARES FITTING METHODS
204* 9.5. CLASSICAL LEAST SQUARES* 207* 9.6. INVERSE LEAST-SQUARES
REGRESSION* 210* 9.7. PRINCIPAL COMPONENT ANALYSIS* 213* 9.8. PRINCIPAL
COMPONENT REGRESSION* 215* 9.9. PARTIAL LEAST-SQUARES REGRESSION* 216*
9.10. VALIDATION* 217* 9.1 I. MULTIVARIATE CURVE RESOLUTION* 218* 9.12.
GENERAL GUIDELINES FOR CALIBRATION DATA SETS 220* 9.13. NEURAL NETWORKS*
221* CHAPTER 10* DATA PROCESSING 225* 10.1. BASELINE CORRECTION* 225*
10.2. INTERPOLATION* 227* 10.3. PEAK PIEKING* 229* 10.4. SPECTRAL
SMOOTHING* 232* CONTENTS* IX 10.5. BAND FITTING* 235* 10.6. DERIVATIVES
OF SPECTRA* 237* 10.7. FOURIER SELF-DECONVOLUTION* 240* 10.8. SPECTRAL
SEARCHING* 246* CHAPTER 11* CONVENTIONAL TRANSMISSION* SPECTROMETRY 251*
11.1. CONDENSED-PHASE SAMPIES* 251* 11.1.1 WINDOW MATERIALS* 251* 11.1.2
BAND INTENSITIES* 251* 11.1.3 INTERFERENCE FRINGES 253* I 1.1.4 TRACE
ANALYSIS 255* 11.2. GAS- AND VAPOR-PHASE SAMPIES* 256* CHAPTER 12*
POLARIZATION 261* 12.1. PLANE-POLARIZED RADIATION* 261* 12.2. CIRCULAR
POLARIZATION* 263* 12.3. POLARIZATION MODULATION* 264* 12.4.
APPLICATIONS OF LINEAR DICHROISM* 266* 12.5. VIBRATIONAL CIRCULAR
DICHROISM* 269* CHAPTER 13* SPECULAR REFLECTION 277* 13. I.
INTRODUCTION* 277* 13.2. FRESNEL REFTECTION FROM BULK SAMPIES 277*
13.2.1. FRESNEL EQUATIONS* 277* 13.2.2. NONABSORBING MATERIALS* 278*
13.2.3. ABSORBING MATERIALS* 279* 13.3. INFRARED REFTECTION-ABSORPTION
SPECTROMETRY* WITH METAL SUBSTRATES 282* 13.3.1. EFFECT OF INCIDENCE
ANGLE AND POLARIZATION 282* 13.3.2. POLARIZATION MODULATION* 287*
13.3.3. SURFACE SELECTION RULE* 290* 13.4. LRRAS WITH DIELECTRIC
SUBSTRATES* 293* 13.5. TRANSFTECTION* 297* 13.5.1. THICK FILMS ON METAL
SUBSTRATES 297* 13.5.2. LIQUID SAMPLING FOR NEAR-LNFRARED* SPECTROMETRY
300* 13.6. SUMMARY* 300* X CONTENTS CHAPTER 14 MICROSPECTROSCOPY AND
IMAGING 303* 14.1. MICROSAMPLING WITH BEAM CONDENSERS 303* 14.2.
MICROSEOPES 304* 14.3. DIAMOND ANVIL CELLS 309* 14.4. REFTECTION
MICROSCOPY 310* 14.5. HYPERSPECTRAL FR-IR JMAGING 312* 14.5. I.
HYPERSPECTRAL IMAGING WITH A* STEP-SCANNING INTERFEROMETER 312* 14.5.2.
HYPERSPECTRAL IMAGING WITH A* CONTINUOUS-SCANNING INTERFEROMETER 314*
14.5.3. SIGNAL-TO-NOISE RATIO 316* 14.5.4. SOFTWARE 318* 14.5.5.
APPLICATIONS OF HYPERSPECTRAL IMAGING 319* CHAPTER 15 ATTENUATED TOTAL
REFLECTION 321* 15.1. INTRODUCTION 321* 15.2. THEORY 322* 15.3.
PRACTICAL CONSIDERATIONS 327* 15.4. ACCESSORIES FOR MULTIPLE INTERNAL
REFLECTION 329* 15.5. SINGLE-REFTECTION ACCESSORIES 336* 15.6. INFRARED
FIBERS 342* 15.7. SUMMARY 347* CHAPTER 16 DIFFUSE REFLECTION 349* 16.1.
THEORY OF DIFFUSE REFTECTION 349* 16.2. ACCESSORIES FOR DIFFUSE
REFTECTION 353* 16.3. APPLICATIONS OF MID-INFRARED DIFFUSE* REFTECTION
SPECTROMETRY 355* 16.4. APPLICATIONS OF NEAR-INFRARED DIFFUSE*
REFLECTION SPECTROMETRY 358* 16.5. REFERENCE MATERIALS FOR DIFFUSE
REFLECTION* SPECTROMETRY 361* CHAPTER 17 EMISSION 363* 17.1.
INTRODUCTION 363* 17.2. INFRARED EMISSION SPECTRA OF GASES 363*
CONTENTS* XI* 17.3. INFRARED EMISSION SPECTRA OF* CONDENSED-PHASE
SAMPIES 366* 17.4. TRANSIENT INFRARED EMISSION SPECTROSCOPY 368* CHAPTER
18* FOURIER TRANSFORM RAMAN* SPECTROMETRY 375* 18.1. INTRODUCTION* 375*
18.2. INSTRUMENTATION* 378* 18.2.1. ND: YAG LASER* 378* 18.2.2. FILTERS*
380* 18.2.3. COLLECTION OPTICS* 381* 18.2.4. INTERFEROMETER* 382*
18.2.5. DETECTOR* 382* 18.2.6. SPECTROMETER* 384* 18.3. FT RAMAN VERSUS
CCD RAMAN SPECTROMETRY 385* 18.4. APPLICATIONS OF FT-RAMAN SPECTROMETRY
387* 18.4.1. STANDARD RAMAN SPECTROSCOPY 387* 18.4.2. SURFACE-ENHANCED
RAMAN SPECTROSCOPY 389* 18.5. SUMMARY* 391* CHAPTER 19* TLME-RESOLVED
SPECTROMETRY 395* 19.1. CONTINUOUS-SCANNING INTERFEROMETERS 395* 19.1.1.
INSTRUMENTAL CONSIDERATIONS* 395* 19.1.2. APPLICATIONS* 397* 19.2.
TIME-RESOLVED MEASUREMENTS USING STEP-SCAN* INTERFEROMETERS 400* 19.2.1.
INSTRUMENTAL CONSIDERATIONS* 400* 19.2.2. APPLICATIONS OF TIME-RESOLVED*
SPECTROSCOPY WITH A STEP-SCAN* INTERFEROMETER 402* 19.3. STROBOSCOPIC
SPECTROMETRY* 407* 19.4. ASYNCHRONOUS TIME-RESOLVED FT-IR* SPECTROMETRY
408* 19.4.1. INSTRUMENTAL CONSIDERATIONS* 408* 19.4.2. APPLICATION TO
LIQUID-CRYSTAL* ORIENTATION DYNAMICS 412* XII* CONTENTS CHAPTER 20*
PHOTOACOUSTIC SPECTROMETRY 415* 20.1.* PHOTOACOUSTIC SPECTROSCOPY OF
GASES 415* 20.2.* PHOTOACOUSTIC SPECTROSCOPY OF SOLIDS WITH* A
RAPID-SCANNING INTERFEROMETER 417* 20.3.* PHOTOACOUSTIC SPECTROSCOPY OF
SOLIDS WITH* A STEP-SCAN INTERFEROMETER 425* 20.3.1. PHASE MODULATION*
425* 20.3.2. DEPTH PROFILING BY VARYING THE* PHOTOACOUSTIC PHASE 428*
20.3.3. MULTIFREQUENCY MEASUREMENTS 431* CHAPTER 21* SAMPLE MODULATION
SPECTROMETRY* WITH A STEP-SCAN INTERFEROMETER 435* 21.1.* DYNAMIC
INFRARED LINEAR DICHROISM MEASURED* WITH A MONOCHROMATOR 435* 21.2.*
DIRLD SPECTROMETRY WITH A STEP-SCAN FOURIER* TRANSFORM SPECTROMETER 440*
21.3. TWO-DIMENSIONAL CORRELATION PLOTS* 448* 21.4.* DIRLD SPECTROMETRY
WITH A FR-IR SPECTROMETERY* AND DIGITAL SIGNAL PROCESSING 454* 21.5.*
OTHER SAMPIE MODULATION MEASUREMENTS* WITH STEP-SCAN INTERFEROMETERS
458* 21.5.1. LIQUID-CRYSTAL ELECTROREORIENTATION 458* 21.5.2. INFRARED
SPECTROELECTROCHEMISTRY 460* CHAPTER 22* ATMOSPHERIC MONITORING 463*
22.1.* EXTRACTIVE ATMOSPHERIC MONITORING 463* 22.2.* OPEN-PATH
ATMOSPHERIC MONITORING 466* CHAPTER 23* COUPLED TECHNIQUES 481* 23.1.*
INTRODUCTION 481* 23.2.* LIGHT-PIPE-BASED GC/FF-IR INTERFACES 482*
23.2.1. INSTRUMENTAL CONSIDERATIONS* 482* 23.2.2. SPECTROSCOPIC
CONSIDERATIONS 485* 23.2.3. CHROMATOGRAM CONSTRUCTION* 486* 23.2.4.
EXAMP1E OF GC/FR-IR* 490* 23.3.* MOBILE-PHASE ELIMINATION APPROACHES*
FOR GC/FR-IR 491* CONTENTS X 111 23.3.1. INTRODUCTION 491* 23.3.2.
MATRIX ISOLATION GC/FR-IR 491* 23.3.3. DIRECT DEPOSITION GC/FT-LR 493*
23.4. HPLC/FT-IR INTERFACE 495* 23.4.1. MEASUREMENTS MADE WITH FLOW
CELLS 495* 23.4.2. MOBILE-PHASE ELIMINATION TECHNIQUES* FOR HPLC/FT-IR
496* 23.5. SFC/FT-IR INTERFACE 500* 23.6. TGA/FT-IR 502* 23.7. OTHER
COUPLED TECHNIQUES 504* INDEX 509*
|
| any_adam_object | 1 |
| author | Griffiths, Peter R. DeHaseth, James A. |
| author_facet | Griffiths, Peter R. DeHaseth, James A. |
| author_role | aut aut |
| author_sort | Griffiths, Peter R. |
| author_variant | p r g pr prg j a d ja jad |
| building | Verbundindex |
| bvnumber | BV024117736 |
| classification_rvk | VG 9200 |
| ctrlnum | (OCoLC)254783254 (DE-599)BVBBV024117736 |
| dewey-full | 535.842 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 535 - Light and related radiation |
| dewey-raw | 535.842 |
| dewey-search | 535.842 |
| dewey-sort | 3535.842 |
| dewey-tens | 530 - Physics |
| discipline | Chemie / Pharmazie Physik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV024117736 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:57:52Z |
| institution | BVB |
| isbn | 0471099023 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018334459 |
| oclc_num | 254783254 |
| open_access_boolean | |
| owner | DE-83 |
| owner_facet | DE-83 |
| physical | XIII, 529 S. graph. Darst. |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Wiley |
| record_format | marc |
| series | Chemical analysis |
| series2 | Chemical analysis |
| spelling | Griffiths, Peter R. Verfasser aut Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth 2. ed. New York <<[u.a.]>> Wiley 2007 XIII, 529 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Chemical analysis 171 FT-IR-Spektroskopie rswk-swf Infrarotspektroskopie (DE-588)4135411-4 gnd rswk-swf FT-IR-Spektroskopie (DE-588)4135416-3 gnd rswk-swf Fourier-Transformation (DE-588)4018014-1 gnd rswk-swf Fourier-Spektroskopie (DE-588)4135413-8 gnd rswk-swf Fourier-Spektroskopie (DE-588)4135413-8 s Infrarotspektroskopie (DE-588)4135411-4 s 1\p DE-604 FT-IR-Spektroskopie (DE-588)4135416-3 s 2\p DE-604 Fourier-Transformation (DE-588)4018014-1 s 3\p DE-604 FT-IR-Spektroskopie s 4\p DE-604 DeHaseth, James A. Verfasser aut Chemical analysis 171 (DE-604)BV000008780 171 OEBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018334459&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Griffiths, Peter R. DeHaseth, James A. Fourier transform infrared spectrometry Chemical analysis FT-IR-Spektroskopie Infrarotspektroskopie (DE-588)4135411-4 gnd FT-IR-Spektroskopie (DE-588)4135416-3 gnd Fourier-Transformation (DE-588)4018014-1 gnd Fourier-Spektroskopie (DE-588)4135413-8 gnd |
| subject_GND | (DE-588)4135411-4 (DE-588)4135416-3 (DE-588)4018014-1 (DE-588)4135413-8 |
| title | Fourier transform infrared spectrometry |
| title_auth | Fourier transform infrared spectrometry |
| title_exact_search | Fourier transform infrared spectrometry |
| title_full | Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth |
| title_fullStr | Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth |
| title_full_unstemmed | Fourier transform infrared spectrometry Peter R. Griffiths ; James A. De Haseth |
| title_short | Fourier transform infrared spectrometry |
| title_sort | fourier transform infrared spectrometry |
| topic | FT-IR-Spektroskopie Infrarotspektroskopie (DE-588)4135411-4 gnd FT-IR-Spektroskopie (DE-588)4135416-3 gnd Fourier-Transformation (DE-588)4018014-1 gnd Fourier-Spektroskopie (DE-588)4135413-8 gnd |
| topic_facet | FT-IR-Spektroskopie Infrarotspektroskopie Fourier-Transformation Fourier-Spektroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018334459&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000008780 |
| work_keys_str_mv | AT griffithspeterr fouriertransforminfraredspectrometry AT dehasethjamesa fouriertransforminfraredspectrometry |