Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
Jülich
Forschungszentrum, Zentralbibliothek
2004
|
| Schriftenreihe: | Schriften des Forschungszentrums Jülich
Materie und Material ; 23 |
| Schlagworte: | |
| Beschreibung: | 133 S. Ill., graph. Darst. 24 cm |
| ISBN: | 3893363734 |
Internformat
MARC
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| 100 | 1 | |a Linke, Felix |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |c Felix Linke |
| 264 | 1 | |a Jülich |b Forschungszentrum, Zentralbibliothek |c 2004 | |
| 300 | |a 133 S. |b Ill., graph. Darst. |c 24 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Schriften des Forschungszentrums Jülich : Materie und Material |v 23 | |
| 502 | |a Zugl.: München, Techn. Univ., Diss., 2004 | ||
| 650 | 0 | 7 | |a Ellipsometrie |0 (DE-588)4152025-7 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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| author | Linke, Felix |
| author_facet | Linke, Felix |
| author_role | aut |
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| id | DE-604.BV023831776 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:37:38Z |
| institution | BVB |
| isbn | 3893363734 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017473937 |
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| physical | 133 S. Ill., graph. Darst. 24 cm |
| publishDate | 2004 |
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| publisher | Forschungszentrum, Zentralbibliothek |
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| series | Schriften des Forschungszentrums Jülich |
| series2 | Schriften des Forschungszentrums Jülich : Materie und Material |
| spelling | Linke, Felix Verfasser aut Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke Jülich Forschungszentrum, Zentralbibliothek 2004 133 S. Ill., graph. Darst. 24 cm txt rdacontent n rdamedia nc rdacarrier Schriften des Forschungszentrums Jülich : Materie und Material 23 Zugl.: München, Techn. Univ., Diss., 2004 Ellipsometrie (DE-588)4152025-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Dünne Schicht (DE-588)4136925-7 s Ellipsometrie (DE-588)4152025-7 s Mikroskopie (DE-588)4039238-7 s 1\p DE-604 Schriften des Forschungszentrums Jülich Materie und Material ; 23 (DE-604)BV013159873 23 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Linke, Felix Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Schriften des Forschungszentrums Jülich Ellipsometrie (DE-588)4152025-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Mikroskopie (DE-588)4039238-7 gnd |
| subject_GND | (DE-588)4152025-7 (DE-588)4136925-7 (DE-588)4039238-7 (DE-588)4113937-9 |
| title | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_auth | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_exact_search | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_full | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke |
| title_fullStr | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke |
| title_full_unstemmed | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces Felix Linke |
| title_short | Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces |
| title_sort | development of ellipsometric microscopy as a quantitative high resolution technique for the investigation of thin films at glass water and silicon air interfaces |
| topic | Ellipsometrie (DE-588)4152025-7 gnd Dünne Schicht (DE-588)4136925-7 gnd Mikroskopie (DE-588)4039238-7 gnd |
| topic_facet | Ellipsometrie Dünne Schicht Mikroskopie Hochschulschrift |
| volume_link | (DE-604)BV013159873 |
| work_keys_str_mv | AT linkefelix developmentofellipsometricmicroscopyasaquantitativehighresolutiontechniquefortheinvestigationofthinfilmsatglasswaterandsiliconairinterfaces |