Secondary ion mass spectrometry: SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991
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Bibliographic Details
Other Authors: Benninghoven, Alfred (Editor)
Format: Conference Proceeding Book
Language:English
Published: Chichester [u.a.] Wiley 1992
Subjects:
Physical Description:XXV, 917 S. Ill., graph. Darst.
ISBN:0471930644

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