Secondary ion mass spectrometry: SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991
Gespeichert in:
Weitere Verfasser: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Chichester [u.a.]
Wiley
1992
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Schlagworte: | |
Beschreibung: | XXV, 917 S. Ill., graph. Darst. |
ISBN: | 0471930644 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV023807313 | ||
003 | DE-604 | ||
005 | 20070307000000.0 | ||
007 | t | ||
008 | 931208s1992 ad|| |||| 10||| eng d | ||
020 | |a 0471930644 |9 0-471-93064-4 | ||
035 | |a (OCoLC)612441410 | ||
035 | |a (DE-599)BVBBV023807313 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-634 |a DE-83 | ||
084 | |a VG 9808 |0 (DE-625)147244:261 |2 rvk | ||
245 | 1 | 0 | |a Secondary ion mass spectrometry |b SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 |c ed. A. Benninghoven ... |
264 | 1 | |a Chichester [u.a.] |b Wiley |c 1992 | |
300 | |a XXV, 917 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 0 | 7 | |a Massenspektrometrie |0 (DE-588)4037882-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Sekundärion |0 (DE-588)4180798-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1991 |z Amsterdam |2 gnd-content | |
689 | 0 | 0 | |a Sekundärion |0 (DE-588)4180798-4 |D s |
689 | 0 | 1 | |a Massenspektrometrie |0 (DE-588)4037882-2 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Benninghoven, Alfred |4 edt | |
711 | 2 | |a SIMS |n 8 |d 1991 |c Amsterdam |j Sonstige |0 (DE-588)5085190-1 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-017449483 |
Datensatz im Suchindex
_version_ | 1804139007380029440 |
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any_adam_object | |
author2 | Benninghoven, Alfred |
author2_role | edt |
author2_variant | a b ab |
author_facet | Benninghoven, Alfred |
building | Verbundindex |
bvnumber | BV023807313 |
classification_rvk | VG 9808 |
ctrlnum | (OCoLC)612441410 (DE-599)BVBBV023807313 |
discipline | Chemie / Pharmazie |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01371nam a2200349zc 4500</leader><controlfield tag="001">BV023807313</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20070307000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">931208s1992 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0471930644</subfield><subfield code="9">0-471-93064-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)612441410</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV023807313</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9808</subfield><subfield code="0">(DE-625)147244:261</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Secondary ion mass spectrometry</subfield><subfield code="b">SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991</subfield><subfield code="c">ed. A. Benninghoven ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Chichester [u.a.]</subfield><subfield code="b">Wiley</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXV, 917 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Massenspektrometrie</subfield><subfield code="0">(DE-588)4037882-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärion</subfield><subfield code="0">(DE-588)4180798-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1991</subfield><subfield code="z">Amsterdam</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärion</subfield><subfield code="0">(DE-588)4180798-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Massenspektrometrie</subfield><subfield code="0">(DE-588)4037882-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Benninghoven, Alfred</subfield><subfield code="4">edt</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">SIMS</subfield><subfield code="n">8</subfield><subfield code="d">1991</subfield><subfield code="c">Amsterdam</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5085190-1</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017449483</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1991 Amsterdam gnd-content |
genre_facet | Konferenzschrift 1991 Amsterdam |
id | DE-604.BV023807313 |
illustrated | Illustrated |
indexdate | 2024-07-09T21:37:14Z |
institution | BVB |
institution_GND | (DE-588)5085190-1 |
isbn | 0471930644 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017449483 |
oclc_num | 612441410 |
open_access_boolean | |
owner | DE-634 DE-83 |
owner_facet | DE-634 DE-83 |
physical | XXV, 917 S. Ill., graph. Darst. |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | Wiley |
record_format | marc |
spelling | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 ed. A. Benninghoven ... Chichester [u.a.] Wiley 1992 XXV, 917 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Sekundärion (DE-588)4180798-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Amsterdam gnd-content Sekundärion (DE-588)4180798-4 s Massenspektrometrie (DE-588)4037882-2 s DE-604 Benninghoven, Alfred edt SIMS 8 1991 Amsterdam Sonstige (DE-588)5085190-1 oth |
spellingShingle | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 Massenspektrometrie (DE-588)4037882-2 gnd Sekundärion (DE-588)4180798-4 gnd |
subject_GND | (DE-588)4037882-2 (DE-588)4180798-4 (DE-588)1071861417 |
title | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 |
title_auth | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 |
title_exact_search | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 |
title_full | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 ed. A. Benninghoven ... |
title_fullStr | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 ed. A. Benninghoven ... |
title_full_unstemmed | Secondary ion mass spectrometry SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 ed. A. Benninghoven ... |
title_short | Secondary ion mass spectrometry |
title_sort | secondary ion mass spectrometry sims viii proceedings of the eighth international conference on secondary ion mass spectrometry international congress centre rai amsterdam the netherlands september 15 20th 1991 |
title_sub | SIMS VIII ; proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, International Congress Centre RAI, Amsterdam, The Netherlands, September 15-20th, 1991 |
topic | Massenspektrometrie (DE-588)4037882-2 gnd Sekundärion (DE-588)4180798-4 gnd |
topic_facet | Massenspektrometrie Sekundärion Konferenzschrift 1991 Amsterdam |
work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometrysimsviiiproceedingsoftheeighthinternationalconferenceonsecondaryionmassspectrometryinternationalcongresscentreraiamsterdamthenetherlandsseptember1520th1991 AT simsamsterdam secondaryionmassspectrometrysimsviiiproceedingsoftheeighthinternationalconferenceonsecondaryionmassspectrometryinternationalcongresscentreraiamsterdamthenetherlandsseptember1520th1991 |