Thin film analysis by X-ray scattering: techniques for structural characterization
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Weinheim
WILEY-VCH
2006
|
| Ausgabe: | 1. Aufl. |
| Schlagworte: | |
| Beschreibung: | XXII, 356 S. Ill., graph. Darst. |
| ISBN: | 3527310525 |
Internformat
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| 100 | 1 | |a Birkholz, Mario |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Thin film analysis by X-ray scattering |b techniques for structural characterization |c Mario Birkholz |
| 250 | |a 1. Aufl. | ||
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| 300 | |a XXII, 356 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Birkholz, Mario |
| author_facet | Birkholz, Mario |
| author_role | aut |
| author_sort | Birkholz, Mario |
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| building | Verbundindex |
| bvnumber | BV023797712 |
| ctrlnum | (OCoLC)915971549 (DE-599)BVBBV023797712 |
| edition | 1. Aufl. |
| format | Book |
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| id | DE-604.BV023797712 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T21:37:02Z |
| institution | BVB |
| isbn | 3527310525 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017439915 |
| oclc_num | 915971549 |
| open_access_boolean | |
| owner | DE-634 |
| owner_facet | DE-634 |
| physical | XXII, 356 S. Ill., graph. Darst. |
| publishDate | 2006 |
| publishDateSearch | 2006 |
| publishDateSort | 2006 |
| publisher | WILEY-VCH |
| record_format | marc |
| spelling | Birkholz, Mario Verfasser aut Thin film analysis by X-ray scattering techniques for structural characterization Mario Birkholz 1. Aufl. Weinheim WILEY-VCH 2006 XXII, 356 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Röntgenstreuung (DE-588)4178324-4 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Röntgenstreuung (DE-588)4178324-4 s DE-604 Röntgenstrukturanalyse (DE-588)4137203-7 s |
| spellingShingle | Birkholz, Mario Thin film analysis by X-ray scattering techniques for structural characterization Röntgenstrukturanalyse (DE-588)4137203-7 gnd Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| subject_GND | (DE-588)4137203-7 (DE-588)4178324-4 (DE-588)4136925-7 |
| title | Thin film analysis by X-ray scattering techniques for structural characterization |
| title_auth | Thin film analysis by X-ray scattering techniques for structural characterization |
| title_exact_search | Thin film analysis by X-ray scattering techniques for structural characterization |
| title_full | Thin film analysis by X-ray scattering techniques for structural characterization Mario Birkholz |
| title_fullStr | Thin film analysis by X-ray scattering techniques for structural characterization Mario Birkholz |
| title_full_unstemmed | Thin film analysis by X-ray scattering techniques for structural characterization Mario Birkholz |
| title_short | Thin film analysis by X-ray scattering |
| title_sort | thin film analysis by x ray scattering techniques for structural characterization |
| title_sub | techniques for structural characterization |
| topic | Röntgenstrukturanalyse (DE-588)4137203-7 gnd Röntgenstreuung (DE-588)4178324-4 gnd Dünne Schicht (DE-588)4136925-7 gnd |
| topic_facet | Röntgenstrukturanalyse Röntgenstreuung Dünne Schicht |
| work_keys_str_mv | AT birkholzmario thinfilmanalysisbyxrayscatteringtechniquesforstructuralcharacterization |