Materials science and technology: a comprehensive treatment Vol. 2A. Characterization of materials : Part I
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Weinheim [u.a.]
VCH
(1992)
Tokyo Kodansha |
| Schriftenreihe: | Materials science and technology
Vol. 2A |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | 724 S. Ill., graph. Darst. |
| ISBN: | 3527268154 089573690X |
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| 264 | 1 | |a Weinheim [u.a.] |b VCH |c (1992) | |
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CONTENTS
1 ELECTRON DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY .
.
.
. 1
S. AMELINCKX
2 ANALYTICAL ELECTRON MICROSCOPY 147
E.L. HALL
3 SCANNING ELECTRON MICROSCOPY 221
D. C. JOY
4 X-RAY DIFFRACTION 251
R. L. SNYDER
5 LIGHT OPTICAL MICROSCOPY 357
R. TELLE, G. PETZOW \
6 ATOMIC SPECTROMETRY 423
R N. KELIHER F, E. M. SHELLY FRAME
7 THERMOANALYTICAL METHODS 491
P. K. GALLAGHER
8 APPLICATION OF SYNCHROTRON X-RADIATION TO PROBLEMS
IN MATERIALS SCIENCE 551
A. R. GERSON, P. J. HALFPENNY, S. PIZZINI, R. RISTIC, K. J. ROBERTS,
D. B. SHEEN, J. N. SHERWOOD
9 X-RAY FLUORESCENCE ANALYSIS 619
R. JENKINS
10 POLYMER MOLECULAR STRUCTURE DETERMINATION 663
E. A. WILLIAMS
INDEX 707
HTTP://D-NB.INFO/920303994
1 ELECTRON DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY
SEVERIN AMELINCKX
LABORATORIUM VOOR ALGEMENE NATUURKUNDE EN FYSICA VAN DE VASTE STOF,
UNIVERSITEIT ANTWERPEN, ANTWERPEN, BELGIUM
LIST OF SYMBOLS AND ABBREVIATIONS 5
1.1 INTRODUCTION 9
1.2 GEOMETRY OF DIFFRACTION 9
1.2.1 BRAGG'S LAW AND THE EWALD CONSTRUCTION 9
1.2.2 ATOMIC SCATTERING FACTOR - INTERACTION STRENGTH 11
1.3 KINEMATIC DIFFRACTION THEORY 11
1.3.1 INTRODUCTION 11
1.3.2 KIKUCHI LINES 12
1.3.3 DETERMINATION OF THE SIGN AND MAGNITUDE OF THE DEVIATION PARAMETER
S . 15
1.3.4 REFRACTION OF ELECTRONS 15
1.3.5 BASIC EQUATIONS OF THE KINEMATIC THEORY .
.
.
.\ 16
1.3.6 KINEMATIC ROCKING CURVE 20
1.3.7 THE COLUMN APPROXIMATION 20
1.3.8 DESCRIPTION OF DEFORMED CRYSTALS 22
1.3.9 DIFFRACTION EQUATIONS FOR DEFORMED CRYSTALS 22
1.3.10 STACKING FAULT FRINGES 23
1.3.11 DISLOCATION DISPLACEMENT FIELDS 24
1.4 TWO-BEAM DYNAMIC THEORY 24
1.4.1 DERIVATION OF THE BASIC SET OF EQUATIONS: THE DARWIN APPROACH 24
1.4.2 ALTERNATIVE FORMS OF THE DIFFRACTION EQUATIONS 26
1.4.3 DYNAMIC EQUATIONS FOR DEFORMED CRYSTALS 26
1.4.4 SOLUTIONS OF THE DYNAMIC EQUATIONS FOR THE PERFECT CRYSTAL 27
1.4.5 DISPERSION SURFACE AND WAVE FIELDS 30
1.4.5.1 TWO-BEAM CASE 30
1.4.5.2 MANY-BEAM CASE 33
1.4.6 WAVE FUNCTION AT THE EXIT FACE 34
1.4.7 INTUITIVE MODEL FOR THE ORIGIN OF LATTICE FRINGES 34
1.4.8 ABSORPTION 35
1.4.8.1 NORMAL ABSORPTION 35
1.4.8.2 ANOMALOUS ABSORPTION 36
1.4.9 DYNAMIC EQUATIONS INCLUDING ANOMALOUS ABSORPTION 37
1.4.10 WAVE FIELDS 38
1.4.11 ROCKING CURVES FOR PERFECT CRYSTALS 39
1.5 CONTRAST AT PLANAR INTERFACES: TWO-BEAM DYNAMIC THEORY 40
1.5.1 INTRODUCTION 40
2
1 ELECTRON DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY
1.5.2 MATRIX FORMULATION 40
1.5.2.1 PERFECT CRYSTAL MATRIX 40
1.5.2.2 MATRICES FOR FAULTED CRYSTALS, SHIFT MATRIX 41
1.5.2.3 VACUUM MATRIX 43
1.5.2.4 OVERLAPPING INTERFACES 43
1.5.3 FRINGE PROFILES FOR PLANAR INTERFACES INCLUDING ANOMALOUS
ABSORPTION . . 44
1.5.3.1 INTRODUCTION 44
1.5.3.2 TRANSLATION INTERFACES 45
1.5.3.3 PROPERTIES OF FRINGES DUE TO TRANSLATION INTERFACES (A FRINGES)
46
1.5.3.4 DOMAIN BOUNDARY FRINGES ( S FRINGES) 47
1.5.3.5 PROPERTIES OF DOMAIN BOUNDARY FRINGES 49
1.5.4 APPLICATIONS 50
1.5.4.1 DETERMINATION OF THE TYPE OF STACKING FAULT 50
1.5.4.2 DOMAIN TEXTURES 52
1.5.4.3 DIFFRACTION PATTERNS OF DOMAIN TEXTURES 54
1.5.4.4 INVERSION BOUNDARIES IN NON-CENTRO-SYMMETRICAL CRYSTALS 56
1.5.4.5 STRUCTURE FACTOR CONTRAST 57
1.6 DISLOCATION CONTRAST 58
1.6.1 INTUITIVE CONSIDERATIONS 58
1.6.2 IMAGE PROFILES: KINEMATIC THEORY 63
1.6.3 IMAGE PROFILES: DYNAMIC THEORY 64
1.6.3.1 IMAGES OF SCREW DISLOCATIONS 65.
1.6.3.2 IMAGES OF EDGE AND MIXED DISLOCATIONS 67
1.6.3.3 PARTIAL DISLOCATIONS 69
1.6.3.4 SMALL DEFECTS 70
1.6.3.5 QUALITATIVE IMAGE PROFILES 71
1.6.3.6 THE IMAGE SIDE OF DISLOCATIONS 73
1.6.3.7 CHARACTERIZING DISLOCATIONS 74
1.6.3.8 THE WEAK-BEAM METHOD 76
1.7 MOIRE PATTERNS 79
1.7.1 INTUITIVE CONSIDERATIONS 79
1.7.2 THEORETICAL CONSIDERATIONS 80
1.8 TWO-BEAM LATTICE FRINGES 82
1.8.1 THEORETICAL CONSIDERATIONS 82
1.8.2 PROPERTIES OF LATTICE FRINGES 82
1.9 HIGH-RESOLUTION ELECTRON MICROSCOPY (HREM) 84
1.9.1 INTRODUCTION 84
1.9.2 IMAGE FORMATION IN AN IDEAL MICROSCOPE 84
1.9.3 IMAGE FORMATION IN A REAL MICROSCOPE 85
1.9.3.1 SPHERICAL ABERRATION 85
1.9.3.2 APERTURE 86
1.9.3.3 DEFOCUS 86
1.9.3.4 CHROMATIC ABERRATION 86
1.9.3.5 BEAM DIVERGENCE 87
1.9.3.6 ULTIMATE RESOLUTION 87
1 ELECTRON DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY
3
1.9.3.7 PHASE SHIFT 88
1.9.4 MATHEMATICAL FORMULATION OF IMAGE FORMATION 89
1.9.4.1 GENERAL 89
1.9.4.2 PHASE GRATING APPROXIMATION 89
1.9.4.3 WEAK-PHASE OBJECT 90
1.9.4.4 OPTIMUM DEFOCUS IMAGES 91
1.9.4.5 PROJECTED CHARGE DENSITY APPROXIMATION OR
THICK-PHASE
OBJECT 92
1.9.5 TWO-DIMENSIONAL MULTIPLE-BEAM IMAGES 93
1.9.5.1 WAVE APPROACH (FOURIER SYNTHESIS) F 93
1.9.5.2 PARTICLE APPROACH (CHANNELLING) 94
1.9.5.3 IMAGE INTERPRETATION 95
1.9.5.4 DEFECTS REVEALED BY HIGH-RESOLUTION ELECTRON MICROSCOPY 96
1.10 GEOMETRIC DIFFRACTION THEORY 97
1.10.1 INTRODUCTION 97
1.10.2 DIFFRACTION BY MODULATED STRUCTURES 99
1.10.3 COMPOSITION MODULATION 100
1.10.4 DISPLACEMENT MODULATION 100
1.10.5 COMPOSITION VERSUS DISPLACEMENT MODULATION 101
1.10.6 TRANSLATION INTERFACE MODULATION 102
1.11 SHORT-RANGE ORDER IN BINARY SYSTEMS 103
1.11.1 INTRODUCTION 103
1.11.2 TRANSITION STATE DIFFUSE SCATTERING 104
1.11.3 EXAMPLES OF APPLICATIONS 106
1.11.3.1 PLANES OF DIFFUSE SCATTERING 106
1.11.3.2 LINES OF DIFFUSE SCATTERING 106
1.11.4 SHORT-RANGE-ORDER PARAMETERS 108
1.11.5 DIFFUSE SCATTERING DUE TO ORIENTATIONAL DISORDER 108
1.11.6 DISPLACIVE DISORDER 110
1.11.7 NON-PERIODIC ARRAYS OF SCATTERING CENTERS I
L
L
1.11.7.1 INTRODUCTION I
L
L
1.11.7.2 UNIFORM SEQUENCES I
L
L
1.11.7.3 PROBABILISTIC SEQUENCES 113
1.12 APPLICATIONS AND CASE STUDIES 115
1.12.1 INTRODUCTION 115
1.12.2 THE FINE STRUCTURE OF DISLOCATIONS 116
1.12.2.1 MEASUREMENT OF THE STACKING FAULT ENERGY 116
1.12.2.2 MULTIRIBBONS 118
1.12.2.3 PLASTIC DEFORMATION: GLIDE DISLOCATIONS 120
1.12.3 SMALL PARTICLES 121
1.12.4 POINT DEFECT CLUSTERS 123
1.12.5 QUASI-CRYSTALS 124
1.12.6 MIXED LAYER COMPOUNDS 124
1.12.7 MTS
3
COMPOUNDS 125
1.12.8 PLANAR INTERFACES ! 127
1.12.9 DOMAIN STRUCTURES : 128
4
1 ELECTRON DIFFRACTION AND TRANSMISSION ELECTRON MICROSCOPY
1.12.10 THE STRUCTURE OF ORDERED ALLOYS 130
1.12.11 LONG-PERIOD ALLOY SUPERSTRUCTURES 131
1.12.12 MINERALS : 136
1.12.13 FABRICATION-INDUCED DEFECTS IN SEMICONDUCTORS 136
1.12.14 SUPERSTRUCTURES DUE TO NON-STOICHIOMETRY 139
1.12.15 VARIOUS APPLICATIONS 141
1.12.15.1 IN SITU STUDIES 141
1.12.15.2 RADIATION DAMAGE 142
1.12.15.3 RADIATION ORDERING 142
1.12.15.4 MAGNETIC DOMAIN STRUCTURES 142
1.13 ACKNOWLEDGEMENTS 142
1.14 REFERENCES 143 |
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| indexdate | 2024-12-02T09:06:06Z |
| institution | BVB |
| isbn | 3527268154 089573690X |
| language | English |
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| spelling | Materials science and technology a comprehensive treatment Vol. 2A. Characterization of materials : Part I ed. by R. W. Cahn ... ; Vol. editor: Eric Lifshin Weinheim [u.a.] VCH (1992) Tokyo Kodansha 724 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials science and technology Vol. 2A Stoffeigenschaft (DE-588)4192147-1 gnd rswk-swf Gefüge Werkstoffkunde (DE-588)4169819-8 gnd rswk-swf Physikalische Analyse (DE-588)4121477-8 gnd rswk-swf Stoffeigenschaft (DE-588)4192147-1 s Physikalische Analyse (DE-588)4121477-8 s DE-604 Gefüge Werkstoffkunde (DE-588)4169819-8 s Lifshin, Eric edt Cahn, Robert W. 1924-2007 Sonstige (DE-588)139082328 oth (DE-604)BV006632717 2 DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017201063&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Materials science and technology a comprehensive treatment Stoffeigenschaft (DE-588)4192147-1 gnd Gefüge Werkstoffkunde (DE-588)4169819-8 gnd Physikalische Analyse (DE-588)4121477-8 gnd |
| subject_GND | (DE-588)4192147-1 (DE-588)4169819-8 (DE-588)4121477-8 |
| title | Materials science and technology a comprehensive treatment |
| title_auth | Materials science and technology a comprehensive treatment |
| title_exact_search | Materials science and technology a comprehensive treatment |
| title_full | Materials science and technology a comprehensive treatment Vol. 2A. Characterization of materials : Part I ed. by R. W. Cahn ... ; Vol. editor: Eric Lifshin |
| title_fullStr | Materials science and technology a comprehensive treatment Vol. 2A. Characterization of materials : Part I ed. by R. W. Cahn ... ; Vol. editor: Eric Lifshin |
| title_full_unstemmed | Materials science and technology a comprehensive treatment Vol. 2A. Characterization of materials : Part I ed. by R. W. Cahn ... ; Vol. editor: Eric Lifshin |
| title_short | Materials science and technology |
| title_sort | materials science and technology a comprehensive treatment characterization of materials part i |
| title_sub | a comprehensive treatment |
| topic | Stoffeigenschaft (DE-588)4192147-1 gnd Gefüge Werkstoffkunde (DE-588)4169819-8 gnd Physikalische Analyse (DE-588)4121477-8 gnd |
| topic_facet | Stoffeigenschaft Gefüge Werkstoffkunde Physikalische Analyse |
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