Verfügbarkeit: Fundamentals of Surface and Thin Film Analysis

Fundamentals of Surface and Thin Film Analysis:

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Bibliographische Detailangaben
Hauptverfasser:	Feldman, Leonard C. (VerfasserIn), Mayer, James W. 1930-2013 (VerfasserIn)
Format:	Buch
Sprache:	Undetermined
Veröffentlicht:	Englewood Cliffs Prentice-Hall 1986
Schlagworte:	Oberflächenanalyse Festkörperoberfläche Dünne Schicht Oberflächenphysik Analyse
Beschreibung:	XVIII, 352 S. Ill.
ISBN:	0135005701

Internformat

MARC


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Datensatz im Suchindex

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author	Feldman, Leonard C. Mayer, James W. 1930-2013
author_GND	(DE-588)121494349
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author_sort	Feldman, Leonard C.
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bvnumber	BV023664210
classification_rvk	ZN 4150
ctrlnum	(OCoLC)632418852 (DE-599)BVBBV023664210
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
format	Book
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indexdate	2024-07-09T21:33:24Z
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isbn	0135005701
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physical	XVIII, 352 S. Ill.
publishDate	1986
publishDateSearch	1986
publishDateSort	1986
publisher	Prentice-Hall
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spelling	Feldman, Leonard C. Verfasser aut Fundamentals of Surface and Thin Film Analysis Loenard C. Feldman ; James W. Mayer Englewood Cliffs Prentice-Hall 1986 XVIII, 352 S. Ill. txt rdacontent n rdamedia nc rdacarrier Oberflächenanalyse (DE-588)4172243-7 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Oberflächenphysik (DE-588)4134881-3 gnd rswk-swf Analyse (DE-588)4122795-5 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Analyse (DE-588)4122795-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Oberflächenanalyse (DE-588)4172243-7 s 2\p DE-604 Oberflächenphysik (DE-588)4134881-3 s 3\p DE-604 Mayer, James W. 1930-2013 Verfasser (DE-588)121494349 aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Feldman, Leonard C. Mayer, James W. 1930-2013 Fundamentals of Surface and Thin Film Analysis Oberflächenanalyse (DE-588)4172243-7 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Dünne Schicht (DE-588)4136925-7 gnd Oberflächenphysik (DE-588)4134881-3 gnd Analyse (DE-588)4122795-5 gnd
subject_GND	(DE-588)4172243-7 (DE-588)4127823-9 (DE-588)4136925-7 (DE-588)4134881-3 (DE-588)4122795-5
title	Fundamentals of Surface and Thin Film Analysis
title_auth	Fundamentals of Surface and Thin Film Analysis
title_exact_search	Fundamentals of Surface and Thin Film Analysis
title_full	Fundamentals of Surface and Thin Film Analysis Loenard C. Feldman ; James W. Mayer
title_fullStr	Fundamentals of Surface and Thin Film Analysis Loenard C. Feldman ; James W. Mayer
title_full_unstemmed	Fundamentals of Surface and Thin Film Analysis Loenard C. Feldman ; James W. Mayer
title_short	Fundamentals of Surface and Thin Film Analysis
title_sort	fundamentals of surface and thin film analysis
topic	Oberflächenanalyse (DE-588)4172243-7 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Dünne Schicht (DE-588)4136925-7 gnd Oberflächenphysik (DE-588)4134881-3 gnd Analyse (DE-588)4122795-5 gnd
topic_facet	Oberflächenanalyse Festkörperoberfläche Dünne Schicht Oberflächenphysik Analyse
work_keys_str_mv	AT feldmanleonardc fundamentalsofsurfaceandthinfilmanalysis AT mayerjamesw fundamentalsofsurfaceandthinfilmanalysis

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