On line-testing for VLSI:
Gespeichert in:
Weitere Verfasser: | , , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Boston ; Dordrecht ; London
Kluwer Acad. Publ.
1998
|
Schlagworte: | |
Beschreibung: | Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998 |
Beschreibung: | 159 S. graph. Darst. |
ISBN: | 0792381327 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV023517565 | ||
003 | DE-604 | ||
005 | 20070514000000.0 | ||
007 | t | ||
008 | 980910s1998 xxud||| |||| 00||| eng d | ||
020 | |a 0792381327 |9 0-7923-8132-7 | ||
035 | |a (OCoLC)632405152 | ||
035 | |a (DE-599)BVBBV023517565 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
044 | |a xxu |c XD-US | ||
049 | |a DE-521 | ||
050 | 0 | |a TK7867.O5 1998 | |
082 | 0 | |a 621.3815/028/7 21 | |
084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
245 | 1 | 0 | |a On line-testing for VLSI |c edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
264 | 1 | |a Boston ; Dordrecht ; London |b Kluwer Acad. Publ. |c 1998 | |
300 | |a 159 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998 | ||
650 | 4 | |a Datenverarbeitung | |
650 | 4 | |a Electronic circuits -- Testing -- Data processing | |
650 | 4 | |a Online data processing | |
650 | 4 | |a Electronic circuit design | |
650 | 4 | |a Error-correcting codes (Information theory) | |
650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
689 | 0 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
700 | 1 | |a Nicolaidis, Michael |4 edt | |
700 | 1 | |a Zorian, Yervant |4 edt | |
700 | 1 | |a Pradan, Dhiraj K. |4 edt | |
999 | |a oai:aleph.bib-bvb.de:BVB01-016838003 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804138156844384256 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author2 | Nicolaidis, Michael Zorian, Yervant Pradan, Dhiraj K. |
author2_role | edt edt edt |
author2_variant | m n mn y z yz d k p dk dkp |
author_facet | Nicolaidis, Michael Zorian, Yervant Pradan, Dhiraj K. |
building | Verbundindex |
bvnumber | BV023517565 |
callnumber-first | T - Technology |
callnumber-label | TK7867 |
callnumber-raw | TK7867.O5 1998 |
callnumber-search | TK7867.O5 1998 |
callnumber-sort | TK 47867 O5 41998 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ST 190 |
ctrlnum | (OCoLC)632405152 (DE-599)BVBBV023517565 |
dewey-full | 621.3815/028/721 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/028/7 21 |
dewey-search | 621.3815/028/7 21 |
dewey-sort | 3621.3815 228 17 221 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01729nam a2200481zc 4500</leader><controlfield tag="001">BV023517565</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20070514000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980910s1998 xxud||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0792381327</subfield><subfield code="9">0-7923-8132-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)632405152</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV023517565</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-521</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7867.O5 1998</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/028/7 21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">On line-testing for VLSI</subfield><subfield code="c">edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston ; Dordrecht ; London</subfield><subfield code="b">Kluwer Acad. Publ.</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">159 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Datenverarbeitung</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits -- Testing -- Data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Online data processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuit design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Error-correcting codes (Information theory)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nicolaidis, Michael</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zorian, Yervant</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pradan, Dhiraj K.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016838003</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
genre_facet | Aufsatzsammlung |
id | DE-604.BV023517565 |
illustrated | Illustrated |
index_date | 2024-07-02T22:32:10Z |
indexdate | 2024-07-09T21:23:43Z |
institution | BVB |
isbn | 0792381327 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016838003 |
oclc_num | 632405152 |
open_access_boolean | |
owner | DE-521 |
owner_facet | DE-521 |
physical | 159 S. graph. Darst. |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | Kluwer Acad. Publ. |
record_format | marc |
spelling | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan Boston ; Dordrecht ; London Kluwer Acad. Publ. 1998 159 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Reprinted from a special issue of Journal of electronic testing, theory and applications, volume 12, nos. 1 & 2, February/March 1998 Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI (DE-588)4117388-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content VLSI (DE-588)4117388-0 s Test (DE-588)4059549-3 s 1\p DE-604 Nicolaidis, Michael edt Zorian, Yervant edt Pradan, Dhiraj K. edt 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | On line-testing for VLSI Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd |
subject_GND | (DE-588)4117388-0 (DE-588)4059549-3 (DE-588)4143413-4 |
title | On line-testing for VLSI |
title_auth | On line-testing for VLSI |
title_exact_search | On line-testing for VLSI |
title_exact_search_txtP | On line-testing for VLSI |
title_full | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
title_fullStr | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
title_full_unstemmed | On line-testing for VLSI edited by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradan |
title_short | On line-testing for VLSI |
title_sort | on line testing for vlsi |
topic | Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI (DE-588)4117388-0 gnd Test (DE-588)4059549-3 gnd |
topic_facet | Datenverarbeitung Electronic circuits -- Testing -- Data processing Online data processing Electronic circuit design Error-correcting codes (Information theory) VLSI Test Aufsatzsammlung |
work_keys_str_mv | AT nicolaidismichael onlinetestingforvlsi AT zorianyervant onlinetestingforvlsi AT pradandhirajk onlinetestingforvlsi |