High-resolution electron microscopy:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Oxford [u.a.]
Oxford Univ. Press
2007
|
| Ausgabe: | 3. ed., reprint. |
| Schriftenreihe: | Monographs on the physics and chemistry of materials
60 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy |
| Beschreibung: | XVI, 401 S. Ill., graph. Darst. |
| ISBN: | 9780198509158 |
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Datensatz im Suchindex
| _version_ | 1804137779624411136 |
|---|---|
| adam_text | CONTENTS
1
Preliminaries
1
1.1
Elementary principles of phase-contrast microscopy
2
1.2
Instrumental requirements and modifications for
high-resolution work
9
1.3
First experiments
11
References
14
2
Electron Optics
15
2.1
The electron wavelength and relativity
16
2.2
Simple lens properties
18
2.3
The paraxial ray equation
25
2.4
The constant-field approximation
27
2.5
Projector lenses
28
2.6
The objective lens
31
2.7
Practical lens design
33
2.8
Aberrations
36
2.9
The pre-field
45
References
46
3
Wave Optics
48
3.1
Propagation and Fresnel diffraction
49
3.2
Lens action and the diffraction limit
52
3.3
Wave and ray aberrations
57
3.4
Strong-phase and weak-phase objects
61
3.5
Optical and digital diffractograms
63
References
65
Coherence and Fourier Optics
67
4.1
Independent electrons and computed images
69
4.2
Coherent and incoherent images and the damping envelopes
71
4.3
The characterization of coherence
77
4.4
Spatial coherence using hollow-cone illumination
80
4.5
The effect of source size on coherence
82
4.6
Coherence requirements in practice
84
References
87
xiv Contents
5
High-Resolution
Images
of Crystals and their Defects
89
5.1
The effect of lens aberrations on simple lattice fringes
90
5.2
The effect of beam divergence on depth of field for
simple fringes
94
5.3
Approximations for the diffracted amplitudes
97
5.4
Images of crystals with variable spacing
—
spinodal
decomposition and modulated structures
104
5.5
Are the atom images black or white? A simple
symmetry argument
106
5.6
The multislice method and the polynomial solution
107
5.7
Bloch wave methods, bound states and symmetry reduction
of the dispersion matrix
110
5.8
Partial coherence effects in dynamical computations
—
beyond the product representation. Fourier images
116
5.9
Absorption effects
118
5.10
Dynamical forbidden reflections
121
5.11
Computational algorithms and the relationship between them.
Supercells
and image patching
125
5.12
Sign conventions
130
5.13
Testing image-simulation programs. The accuracy of atom
position determinations
132
5.14
Image interpretation in germanium
—
a case study
134
5.15
Images of defects in crystalline solids. HREM tomography
139
References
150
HREM in Biology, Organic Crystals, and Radiation Damage
156
6.1
Phase and amplitude contrast
156
6.2
Single atoms in bright field
160
6.3
The use of higher accelerating voltage
168
6.4
Contrast and atomic number
171
6.5
Dark-field methods
173
6.6
Inelastic scattering
177
6.7
Molecular image simulation
181
6.8
Noise, information and the Rose equation
182
6.9
Molecular imaging in three dimensions
—
electron
tomography
186
6.10
Electron crystallography of two-dimensional
membrane protein crystals
192
6.11
Organic crystals
195
6.12
Radiation damage. Organics
196
6.13
Radiation damage. Inorganics
200
References
201
Contents xv
7 Image Processing
and Super-Resolution Schemes
207
7.1
Through-focus series. Coherent detection.
Optimization. Error metrics
207
7.2
Tilt series, aperture synthesis
214
7.3
Off-axis electron holography for HREM
214
7.4
Aberration correction
216
7.5
Combining diffraction and image information
221
7.6
Ptychography, ronchigrams, shadow imaging,
and in-line holography
225
7.7
Direct inversion from diffraction patterns
230
7.8
Atom lenses
230
7.9
Internal source holography, HiO and holographic Alchemi
231
References
232
8
STEM and Z-contrast
237
8.1
Introduction. Lattice imaging in STEM
237
8.2
Coherence functions in STEM
245
8.3
Dark-field STEM. Incoherent imaging. Resolution limits
247
8.4
Multiple elastic scattering in STEM. Channelling
254
8.5
STEM Z-contrast.
TDS.
3-D
STEM tomography
256
References
261
9
Electron Sources and Detectors
264
9.1
The illumination system
265
9.2
Brightness measurement
267
9.3
Biasing and high-voltage stability
270
9.4
Hair-pin filaments
273
9.5
Lanthanum hexaboride sources
274
9.6
Field-emission sources. Degeneracy
275
9.7
Detectors. The charged-coupled device
(CCD)
camera
277
9.8
Image plates
280
9.9
Film
282
9.10
Video cameras and intensifiers
283
References
284
10
Measurement of Electron-Optical Parameters
286
10.1
Objective-lens focus increments
286
10.2
Spherical aberration constant
288
10.3
Magnification calibration
290
10.4
Objective-lens current measurement
293
10.5
Chromatic aberration constant
293
10.6
Astigmatic difference. Three-fold astigmatism
294
10.7
Diffractogram measurements
295
xvi Contents
10.8 Lateral
coherence
298
10.9 Electron
wavelength and camera length
301
10.10
Resolution
301
References
305
11
Instabilities and the Microscope Environment
307
11.1
Magnetic fields
307
11.2
High-voltage instability
310
11.3
Vibration
311
11.4
Specimen movement
312
11.5
Contamination and the vacuum system
314
11.6
Pressure, temperature and drafts
316
References
316
12
Experimental Methods
318
12.1
Astigmatism correction
319
12.2
Taking the picture
320
12.3
Finding and recording lattice fringes
—
an example
323
12.4
Adjusting the crystal orientation
using non-eucentric specimen holders
330
12.5
Focusing techniques and auto-tuning
333
12.6
Substrate films
336
12.7
Photographic techniques and micrograph examination
338
12.8
Ancillary instrumentation for HREM
340
12.9
A checklist for high-resolution work
341
References
342
13
Associated Techniques
344
13.1
X-ray microanalysis and ALCHEMI
345
13.2
Electron energy loss spectroscopy (EELS) in STEM
352
13.3
Electron
microdiffraction
and CBED
357
13.4
Cathodoluminescence in STEM
364
13.5
Environmental HREM, HREM of surfaces, holography
of fields and in-situ manipulation
368
References
372
Appendices
377
Index
394
|
| adam_txt |
CONTENTS
1
Preliminaries
1
1.1
Elementary principles of phase-contrast microscopy
2
1.2
Instrumental requirements and modifications for
high-resolution work
9
1.3
First experiments
11
References
14
2
Electron Optics
15
2.1
The electron wavelength and relativity
16
2.2
Simple lens properties
18
2.3
The paraxial ray equation
25
2.4
The constant-field approximation
27
2.5
Projector lenses
28
2.6
The objective lens
31
2.7
Practical lens design
33
2.8
Aberrations
36
2.9
The pre-field
45
References
46
3
Wave Optics
48
3.1
Propagation and Fresnel diffraction
49
3.2
Lens action and the diffraction limit
52
3.3
Wave and ray aberrations
57
3.4
Strong-phase and weak-phase objects
61
3.5
Optical and digital diffractograms
63
References
65
Coherence and Fourier Optics
67
4.1
Independent electrons and computed images
69
4.2
Coherent and incoherent images and the damping envelopes
71
4.3
The characterization of coherence
77
4.4
Spatial coherence using hollow-cone illumination
80
4.5
The effect of source size on coherence
82
4.6
Coherence requirements in practice
84
References
87
xiv Contents
5
High-Resolution
Images
of Crystals and their Defects
89
5.1
The effect of lens aberrations on simple lattice fringes
90
5.2
The effect of beam divergence on depth of field for
simple fringes
94
5.3
Approximations for the diffracted amplitudes
97
5.4
Images of crystals with variable spacing
—
spinodal
decomposition and modulated structures
104
5.5
Are the atom images black or white? A simple
symmetry argument
106
5.6
The multislice method and the polynomial solution
107
5.7
Bloch wave methods, bound states and 'symmetry reduction'
of the dispersion matrix
110
5.8
Partial coherence effects in dynamical computations
—
beyond the product representation. Fourier images
116
5.9
Absorption effects
118
5.10
Dynamical forbidden reflections
121
5.11
Computational algorithms and the relationship between them.
Supercells
and image patching
125
5.12
Sign conventions
130
5.13
Testing image-simulation programs. The accuracy of atom
position determinations
132
5.14
Image interpretation in germanium
—
a case study
134
5.15
Images of defects in crystalline solids. HREM tomography
139
References
150
HREM in Biology, Organic Crystals, and Radiation Damage
156
6.1
Phase and amplitude contrast
156
6.2
Single atoms in bright field
160
6.3
The use of higher accelerating voltage
168
6.4
Contrast and atomic number
171
6.5
Dark-field methods
173
6.6
Inelastic scattering
177
6.7
Molecular image simulation
181
6.8
Noise, information and the Rose equation
182
6.9
Molecular imaging in three dimensions
—
electron
tomography
186
6.10
Electron crystallography of two-dimensional
membrane protein crystals
192
6.11
Organic crystals
195
6.12
Radiation damage. Organics
196
6.13
Radiation damage. Inorganics
200
References
201
Contents xv
7 Image Processing
and Super-Resolution Schemes
207
7.1
Through-focus series. Coherent detection.
Optimization. Error metrics
207
7.2
Tilt series, aperture synthesis
214
7.3
Off-axis electron holography for HREM
214
7.4
Aberration correction
216
7.5
Combining diffraction and image information
221
7.6
Ptychography, ronchigrams, shadow imaging,
and in-line holography
225
7.7
Direct inversion from diffraction patterns
230
7.8
Atom lenses
230
7.9
Internal source holography, HiO and holographic Alchemi
231
References
232
8
STEM and Z-contrast
237
8.1
Introduction. Lattice imaging in STEM
237
8.2
Coherence functions in STEM
245
8.3
Dark-field STEM. Incoherent imaging. Resolution limits
247
8.4
Multiple elastic scattering in STEM. Channelling
254
8.5
STEM Z-contrast.
TDS.
3-D
STEM tomography
256
References
261
9
Electron Sources and Detectors
264
9.1
The illumination system
265
9.2
Brightness measurement
267
9.3
Biasing and high-voltage stability
270
9.4
Hair-pin filaments
273
9.5
Lanthanum hexaboride sources
274
9.6
Field-emission sources. Degeneracy
275
9.7
Detectors. The charged-coupled device
(CCD)
camera
277
9.8
Image plates
280
9.9
Film
282
9.10
Video cameras and intensifiers
283
References
284
10
Measurement of Electron-Optical Parameters
286
10.1
Objective-lens focus increments
286
10.2
Spherical aberration constant
288
10.3
Magnification calibration
290
10.4
Objective-lens current measurement
293
10.5
Chromatic aberration constant
293
10.6
Astigmatic difference. Three-fold astigmatism
294
10.7
Diffractogram measurements
295
xvi Contents
10.8 Lateral
coherence
298
10.9 Electron
wavelength and camera length
301
10.10
Resolution
301
References
305
11
Instabilities and the Microscope Environment
307
11.1
Magnetic fields
307
11.2
High-voltage instability
310
11.3
Vibration
311
11.4
Specimen movement
312
11.5
Contamination and the vacuum system
314
11.6
Pressure, temperature and drafts
316
References
316
12
Experimental Methods
318
12.1
Astigmatism correction
319
12.2
Taking the picture
320
12.3
Finding and recording lattice fringes
—
an example
323
12.4
Adjusting the crystal orientation
using non-eucentric specimen holders
330
12.5
Focusing techniques and auto-tuning
333
12.6
Substrate films
336
12.7
Photographic techniques and micrograph examination
338
12.8
Ancillary instrumentation for HREM
340
12.9
A checklist for high-resolution work
341
References
342
13
Associated Techniques
344
13.1
X-ray microanalysis and'ALCHEMI'
345
13.2
Electron energy loss spectroscopy (EELS) in STEM
352
13.3
Electron
microdiffraction
and CBED
357
13.4
Cathodoluminescence in STEM
364
13.5
Environmental HREM, HREM of surfaces, holography
of fields and in-situ manipulation
368
References
372
Appendices
377
Index
394 |
| any_adam_object | 1 |
| any_adam_object_boolean | 1 |
| author | Spence, John C. |
| author_facet | Spence, John C. |
| author_role | aut |
| author_sort | Spence, John C. |
| author_variant | j c s jc jcs |
| building | Verbundindex |
| bvnumber | BV023398163 |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)266968899 (DE-599)BVBBV023398163 |
| discipline | Physik |
| discipline_str_mv | Physik |
| edition | 3. ed., reprint. |
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| id | DE-604.BV023398163 |
| illustrated | Illustrated |
| index_date | 2024-07-02T21:22:47Z |
| indexdate | 2024-07-09T21:17:43Z |
| institution | BVB |
| isbn | 9780198509158 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016580994 |
| oclc_num | 266968899 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR |
| owner_facet | DE-355 DE-BY-UBR |
| physical | XVI, 401 S. Ill., graph. Darst. |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | Oxford Univ. Press |
| record_format | marc |
| series | Monographs on the physics and chemistry of materials |
| series2 | Monographs on the physics and chemistry of materials |
| spelling | Spence, John C. Verfasser aut High-resolution electron microscopy John C. H. Spence 3. ed., reprint. Oxford [u.a.] Oxford Univ. Press 2007 XVI, 401 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Monographs on the physics and chemistry of materials 60 Bis 2. Aufl. u.d.T.: Spence, John C.: Experimental high-resolution electron microscopy Transmission electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Festkörper (DE-588)4016918-2 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 1\p DE-604 Struktur (DE-588)4058125-1 s 2\p DE-604 Festkörper (DE-588)4016918-2 s 3\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 4\p DE-604 Monographs on the physics and chemistry of materials 60 (DE-604)BV000725086 60 Digitalisierung UB Regensburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016580994&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Spence, John C. High-resolution electron microscopy Monographs on the physics and chemistry of materials Transmission electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Struktur (DE-588)4058125-1 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Festkörper (DE-588)4016918-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4058125-1 (DE-588)4287503-1 (DE-588)4215608-7 (DE-588)4016918-2 (DE-588)4151862-7 |
| title | High-resolution electron microscopy |
| title_auth | High-resolution electron microscopy |
| title_exact_search | High-resolution electron microscopy |
| title_exact_search_txtP | High-resolution electron microscopy |
| title_full | High-resolution electron microscopy John C. H. Spence |
| title_fullStr | High-resolution electron microscopy John C. H. Spence |
| title_full_unstemmed | High-resolution electron microscopy John C. H. Spence |
| title_short | High-resolution electron microscopy |
| title_sort | high resolution electron microscopy |
| topic | Transmission electron microscopy Elektronenmikroskopie (DE-588)4014327-2 gnd Struktur (DE-588)4058125-1 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Festkörper (DE-588)4016918-2 gnd Elektronenbeugung (DE-588)4151862-7 gnd |
| topic_facet | Transmission electron microscopy Elektronenmikroskopie Struktur Hochauflösendes Verfahren Durchstrahlungselektronenmikroskopie Festkörper Elektronenbeugung |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016580994&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000725086 |
| work_keys_str_mv | AT spencejohnc highresolutionelectronmicroscopy |