Scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
New York, NY
Springer
2007
|
Ausgabe: | 3. ed., corr. printing |
Schlagworte: | |
Beschreibung: | 690 S. Ill., graph. Darst. |
ISBN: | 9780306472923 |
Internformat
MARC
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035 | |a (OCoLC)254505502 | ||
035 | |a (DE-599)BVBBV023234146 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
044 | |a xxu |c US | ||
049 | |a DE-706 | ||
050 | 0 | |a QH212.S3 | |
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084 | |a PHY 135f |2 stub | ||
084 | |a CHE 264f |2 stub | ||
245 | 1 | 0 | |a Scanning electron microscopy and x-ray microanalysis |c Joseph I. Goldstein ... |
250 | |a 3. ed., corr. printing | ||
264 | 1 | |a New York, NY |b Springer |c 2007 | |
300 | |a 690 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Scanning electron microscopy | |
650 | 4 | |a X-ray microanalysis | |
650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Werkstoff |0 (DE-588)4065579-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
689 | 1 | 1 | |a Werkstoff |0 (DE-588)4065579-9 |D s |
689 | 1 | |8 1\p |5 DE-604 | |
689 | 2 | 0 | |a Raster-Transmissions-Elektronenmikroskopie |0 (DE-588)4320991-9 |D s |
689 | 2 | |8 2\p |5 DE-604 | |
700 | 1 | |a Goldstein, Joseph I. |e Sonstige |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-016419797 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
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Datensatz im Suchindex
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adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
building | Verbundindex |
bvnumber | BV023234146 |
callnumber-first | Q - Science |
callnumber-label | QH212 |
callnumber-raw | QH212.S3 |
callnumber-search | QH212.S3 |
callnumber-sort | QH 3212 S3 |
callnumber-subject | QH - Natural History and Biology |
classification_rvk | UH 6320 |
classification_tum | PHY 135f CHE 264f |
ctrlnum | (OCoLC)254505502 (DE-599)BVBBV023234146 |
dewey-full | 502.825 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502.825 |
dewey-search | 502.825 |
dewey-sort | 3502.825 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft Physik Chemie |
discipline_str_mv | Allgemeine Naturwissenschaft Physik Chemie |
edition | 3. ed., corr. printing |
format | Book |
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id | DE-604.BV023234146 |
illustrated | Illustrated |
index_date | 2024-07-02T20:21:17Z |
indexdate | 2024-07-09T21:13:43Z |
institution | BVB |
isbn | 9780306472923 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016419797 |
oclc_num | 254505502 |
open_access_boolean | |
owner | DE-706 |
owner_facet | DE-706 |
physical | 690 S. Ill., graph. Darst. |
publishDate | 2007 |
publishDateSearch | 2007 |
publishDateSort | 2007 |
publisher | Springer |
record_format | marc |
spelling | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... 3. ed., corr. printing New York, NY Springer 2007 690 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s 1\p DE-604 Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 2\p DE-604 Goldstein, Joseph I. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd |
subject_GND | (DE-588)4048455-5 (DE-588)4065579-9 (DE-588)4151898-6 (DE-588)4320991-9 |
title | Scanning electron microscopy and x-ray microanalysis |
title_auth | Scanning electron microscopy and x-ray microanalysis |
title_exact_search | Scanning electron microscopy and x-ray microanalysis |
title_exact_search_txtP | Scanning electron microscopy and x-ray microanalysis |
title_full | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... |
title_fullStr | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... |
title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein ... |
title_short | Scanning electron microscopy and x-ray microanalysis |
title_sort | scanning electron microscopy and x ray microanalysis |
topic | Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd |
topic_facet | Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie |
work_keys_str_mv | AT goldsteinjosephi scanningelectronmicroscopyandxraymicroanalysis |