Data Mining and Diagnosing IC Fails:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York
Springer
2005
|
Schriftenreihe: | Frontiers in Electronic Testing
31 |
Schlagworte: | |
Online-Zugang: | BTU01 FHR01 Volltext |
Beschreibung: | 1 Online-Ressource (XX, 250 S.) 46 schw.-w. Ill., 8 schw.-w. Fotos, 38 schw.-w. graph. Darst. |
ISBN: | 0387249931 9780387263519 |
DOI: | 10.1007/b137446 |
Internformat
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Datensatz im Suchindex
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author | Huisman, Leendert M. |
author_facet | Huisman, Leendert M. |
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building | Verbundindex |
bvnumber | BV023115884 |
collection | ZDB-2-ENG |
ctrlnum | (OCoLC)636776261 (DE-599)BVBBV023115884 |
discipline | Maschinenbau / Maschinenwesen |
discipline_str_mv | Maschinenbau / Maschinenwesen |
doi_str_mv | 10.1007/b137446 |
format | Electronic eBook |
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id | DE-604.BV023115884 |
illustrated | Illustrated |
index_date | 2024-07-02T19:49:58Z |
indexdate | 2024-07-09T21:11:23Z |
institution | BVB |
isbn | 0387249931 9780387263519 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016318411 |
oclc_num | 636776261 |
open_access_boolean | |
owner | DE-898 DE-BY-UBR DE-634 DE-83 |
owner_facet | DE-898 DE-BY-UBR DE-634 DE-83 |
physical | 1 Online-Ressource (XX, 250 S.) 46 schw.-w. Ill., 8 schw.-w. Fotos, 38 schw.-w. graph. Darst. |
psigel | ZDB-2-ENG |
publishDate | 2005 |
publishDateSearch | 2005 |
publishDateSort | 2005 |
publisher | Springer |
record_format | marc |
series | Frontiers in Electronic Testing |
series2 | Frontiers in Electronic Testing |
spelling | Huisman, Leendert M. Verfasser aut Data Mining and Diagnosing IC Fails Leendert M. Huisman New York Springer 2005 1 Online-Ressource (XX, 250 S.) 46 schw.-w. Ill., 8 schw.-w. Fotos, 38 schw.-w. graph. Darst. txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 31 Funktionstest (DE-588)4155698-7 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Data Mining (DE-588)4428654-5 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Funktionstest (DE-588)4155698-7 s Fehlererkennung (DE-588)4133764-5 s Data Mining (DE-588)4428654-5 s DE-604 Frontiers in Electronic Testing 31 (DE-604)BV010836129 31 https://doi.org/10.1007/b137446 Verlag Volltext |
spellingShingle | Huisman, Leendert M. Data Mining and Diagnosing IC Fails Frontiers in Electronic Testing Funktionstest (DE-588)4155698-7 gnd Fehlererkennung (DE-588)4133764-5 gnd Data Mining (DE-588)4428654-5 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
subject_GND | (DE-588)4155698-7 (DE-588)4133764-5 (DE-588)4428654-5 (DE-588)4027242-4 |
title | Data Mining and Diagnosing IC Fails |
title_auth | Data Mining and Diagnosing IC Fails |
title_exact_search | Data Mining and Diagnosing IC Fails |
title_exact_search_txtP | Data Mining and Diagnosing IC Fails |
title_full | Data Mining and Diagnosing IC Fails Leendert M. Huisman |
title_fullStr | Data Mining and Diagnosing IC Fails Leendert M. Huisman |
title_full_unstemmed | Data Mining and Diagnosing IC Fails Leendert M. Huisman |
title_short | Data Mining and Diagnosing IC Fails |
title_sort | data mining and diagnosing ic fails |
topic | Funktionstest (DE-588)4155698-7 gnd Fehlererkennung (DE-588)4133764-5 gnd Data Mining (DE-588)4428654-5 gnd Integrierte Schaltung (DE-588)4027242-4 gnd |
topic_facet | Funktionstest Fehlererkennung Data Mining Integrierte Schaltung |
url | https://doi.org/10.1007/b137446 |
volume_link | (DE-604)BV010836129 |
work_keys_str_mv | AT huismanleendertm datamininganddiagnosingicfails |