Holdings: The core test wrapper handbook

The core test wrapper handbook: rationale and application of IEEE std. 1500

Saved in:

Bibliographic Details
Format:	Electronic eBook
Language:	English
Published:	New York, NY Springer 2006
Series:	Frontiers in electronic testing 35
Subjects:	IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems > Testing > Standards Systems on a chip > Testing > Standards Integrated circuits > Testing > Standards Testen Fehlererkennung Zuverlässigkeit Fehlertoleranz
Online Access:	BTU01 FHR01 Volltext
Physical Description:	1 Online-Ressource
ISBN:	0387307516 9780387346090
DOI:	10.1007/0-387-34609-0

Staff View

MARC


LEADER	00000nmm a2200000zcb4500
001	BV023115609
003	DE-604
005	00000000000000.0
007	cr\|uuu---uuuuu
008	080206s2006 xxu\|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 0387307516 \|9 0-387-30751-6
020			\|a 9780387346090 \|c Online \|9 978-0-387-34609-0
024	7		\|a 10.1007/0-387-34609-0 \|2 doi
035			\|a (OCoLC)850420450
035			\|a (DE-599)BVBBV023115609
040			\|a DE-604 \|b ger \|e aacr
041	0		\|a eng
044			\|a xxu \|c US
049			\|a DE-898 \|a DE-83 \|a DE-634
050		0	\|a TK7895.E42
082	0		\|a 620
082	0		\|a 004.16
245	1	0	\|a The core test wrapper handbook \|b rationale and application of IEEE std. 1500 \|c by Francisco da Silva, Teresa McLaurin, Tom Waayers
264		1	\|a New York, NY \|b Springer \|c 2006
300			\|a 1 Online-Ressource
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
490	1		\|a Frontiers in electronic testing \|v 35
630	0	4	\|a IEEE standard testability method for embedded core-based integrated circuits
650		4	\|a Embedded computer systems \|x Testing \|x Standards
650		4	\|a Systems on a chip \|x Testing \|x Standards
650		4	\|a Integrated circuits \|x Testing \|x Standards
650	0	7	\|a Testen \|0 (DE-588)4367264-4 \|2 gnd \|9 rswk-swf
650	0	7	\|a Fehlererkennung \|0 (DE-588)4133764-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Zuverlässigkeit \|0 (DE-588)4059245-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Fehlertoleranz \|0 (DE-588)4123192-2 \|2 gnd \|9 rswk-swf
689	0	0	\|a Zuverlässigkeit \|0 (DE-588)4059245-5 \|D s
689	0	1	\|a Testen \|0 (DE-588)4367264-4 \|D s
689	0	2	\|a Fehlertoleranz \|0 (DE-588)4123192-2 \|D s
689	0		\|8 1\p \|5 DE-604
689	1	0	\|a Fehlererkennung \|0 (DE-588)4133764-5 \|D s
689	1		\|8 2\p \|5 DE-604
700	1		\|a DaSilva, Francisco \|e Sonstige \|4 oth
700	1		\|a MacLaurin, Teresa \|e Sonstige \|4 oth
700	1		\|a Waayers, Tom \|e Sonstige \|4 oth
830		0	\|a Frontiers in electronic testing \|v 35 \|w (DE-604)BV010836129 \|9 35
856	4	0	\|u https://doi.org/10.1007/0-387-34609-0 \|x Verlag \|3 Volltext
912			\|a ZDB-2-ENG
999			\|a oai:aleph.bib-bvb.de:BVB01-016318137
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
966	e		\|u https://doi.org/10.1007/0-387-34609-0 \|l BTU01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/0-387-34609-0 \|l FHR01 \|p ZDB-2-ENG \|x Verlag \|3 Volltext

Record in the Search Index

_version_	1804137380945330176
adam_txt
any_adam_object
any_adam_object_boolean
building	Verbundindex
bvnumber	BV023115609
callnumber-first	T - Technology
callnumber-label	TK7895
callnumber-raw	TK7895.E42
callnumber-search	TK7895.E42
callnumber-sort	TK 47895 E42
callnumber-subject	TK - Electrical and Nuclear Engineering
collection	ZDB-2-ENG
ctrlnum	(OCoLC)850420450 (DE-599)BVBBV023115609
dewey-full	620 004.16
dewey-hundreds	600 - Technology (Applied sciences) 000 - Computer science, information, general works
dewey-ones	620 - Engineering and allied operations 004 - Computer science
dewey-raw	620 004.16
dewey-search	620 004.16
dewey-sort	3620
dewey-tens	620 - Engineering and allied operations 000 - Computer science, information, general works
discipline	Informatik
discipline_str_mv	Informatik
doi_str_mv	10.1007/0-387-34609-0
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02456nmm a2200613zcb4500</leader><controlfield tag="001">BV023115609</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">080206s2006 xxu\|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0387307516</subfield><subfield code="9">0-387-30751-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387346090</subfield><subfield code="c">Online</subfield><subfield code="9">978-0-387-34609-0</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/0-387-34609-0</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)850420450</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV023115609</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-898</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7895.E42</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">004.16</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">The core test wrapper handbook</subfield><subfield code="b">rationale and application of IEEE std. 1500</subfield><subfield code="c">by Francisco da Silva, Teresa McLaurin, Tom Waayers</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2006</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">35</subfield></datafield><datafield tag="630" ind1="0" ind2="4"><subfield code="a">IEEE standard testability method for embedded core-based integrated circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Testing</subfield><subfield code="x">Standards</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems on a chip</subfield><subfield code="x">Testing</subfield><subfield code="x">Standards</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="x">Standards</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlererkennung</subfield><subfield code="0">(DE-588)4133764-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Fehlererkennung</subfield><subfield code="0">(DE-588)4133764-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">DaSilva, Francisco</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">MacLaurin, Teresa</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Waayers, Tom</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">35</subfield><subfield code="w">(DE-604)BV010836129</subfield><subfield code="9">35</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/0-387-34609-0</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016318137</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/0-387-34609-0</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/0-387-34609-0</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV023115609
illustrated	Not Illustrated
index_date	2024-07-02T19:49:53Z
indexdate	2024-07-09T21:11:23Z
institution	BVB
isbn	0387307516 9780387346090
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-016318137
oclc_num	850420450
open_access_boolean
owner	DE-898 DE-BY-UBR DE-83 DE-634
owner_facet	DE-898 DE-BY-UBR DE-83 DE-634
physical	1 Online-Ressource
psigel	ZDB-2-ENG
publishDate	2006
publishDateSearch	2006
publishDateSort	2006
publisher	Springer
record_format	marc
series	Frontiers in electronic testing
series2	Frontiers in electronic testing
spelling	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers New York, NY Springer 2006 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing 35 IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen (DE-588)4367264-4 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 s Testen (DE-588)4367264-4 s Fehlertoleranz (DE-588)4123192-2 s 1\p DE-604 Fehlererkennung (DE-588)4133764-5 s 2\p DE-604 DaSilva, Francisco Sonstige oth MacLaurin, Teresa Sonstige oth Waayers, Tom Sonstige oth Frontiers in electronic testing 35 (DE-604)BV010836129 35 https://doi.org/10.1007/0-387-34609-0 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	The core test wrapper handbook rationale and application of IEEE std. 1500 Frontiers in electronic testing IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen (DE-588)4367264-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Fehlertoleranz (DE-588)4123192-2 gnd
subject_GND	(DE-588)4367264-4 (DE-588)4133764-5 (DE-588)4059245-5 (DE-588)4123192-2
title	The core test wrapper handbook rationale and application of IEEE std. 1500
title_auth	The core test wrapper handbook rationale and application of IEEE std. 1500
title_exact_search	The core test wrapper handbook rationale and application of IEEE std. 1500
title_exact_search_txtP	The core test wrapper handbook rationale and application of IEEE std. 1500
title_full	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers
title_fullStr	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers
title_full_unstemmed	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers
title_short	The core test wrapper handbook
title_sort	the core test wrapper handbook rationale and application of ieee std 1500
title_sub	rationale and application of IEEE std. 1500
topic	IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen (DE-588)4367264-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Fehlertoleranz (DE-588)4123192-2 gnd
topic_facet	IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen Fehlererkennung Zuverlässigkeit Fehlertoleranz
url	https://doi.org/10.1007/0-387-34609-0
volume_link	(DE-604)BV010836129
work_keys_str_mv	AT dasilvafrancisco thecoretestwrapperhandbookrationaleandapplicationofieeestd1500 AT maclaurinteresa thecoretestwrapperhandbookrationaleandapplicationofieeestd1500 AT waayerstom thecoretestwrapperhandbookrationaleandapplicationofieeestd1500

Holdings

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Get full text

MARC

Record in the Search Index

There is no print copy available.

Similar Items