Verfügbarkeit: The core test wrapper handbook

The core test wrapper handbook: rationale and application of IEEE std. 1500

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Bibliographische Detailangaben
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	New York, NY Springer 2006
Schriftenreihe:	Frontiers in electronic testing 35
Schlagworte:	IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems > Testing > Standards Systems on a chip > Testing > Standards Integrated circuits > Testing > Standards Testen Fehlererkennung Zuverlässigkeit Fehlertoleranz
Online-Zugang:	BTU01 FHR01 Volltext
Beschreibung:	1 Online-Ressource
ISBN:	0387307516 9780387346090
DOI:	10.1007/0-387-34609-0

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spelling	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers New York, NY Springer 2006 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing 35 IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen (DE-588)4367264-4 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 s Testen (DE-588)4367264-4 s Fehlertoleranz (DE-588)4123192-2 s 1\p DE-604 Fehlererkennung (DE-588)4133764-5 s 2\p DE-604 DaSilva, Francisco Sonstige oth MacLaurin, Teresa Sonstige oth Waayers, Tom Sonstige oth Frontiers in electronic testing 35 (DE-604)BV010836129 35 https://doi.org/10.1007/0-387-34609-0 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	The core test wrapper handbook rationale and application of IEEE std. 1500 Frontiers in electronic testing IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen (DE-588)4367264-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Fehlertoleranz (DE-588)4123192-2 gnd
subject_GND	(DE-588)4367264-4 (DE-588)4133764-5 (DE-588)4059245-5 (DE-588)4123192-2
title	The core test wrapper handbook rationale and application of IEEE std. 1500
title_auth	The core test wrapper handbook rationale and application of IEEE std. 1500
title_exact_search	The core test wrapper handbook rationale and application of IEEE std. 1500
title_exact_search_txtP	The core test wrapper handbook rationale and application of IEEE std. 1500
title_full	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers
title_fullStr	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers
title_full_unstemmed	The core test wrapper handbook rationale and application of IEEE std. 1500 by Francisco da Silva, Teresa McLaurin, Tom Waayers
title_short	The core test wrapper handbook
title_sort	the core test wrapper handbook rationale and application of ieee std 1500
title_sub	rationale and application of IEEE std. 1500
topic	IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen (DE-588)4367264-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Zuverlässigkeit (DE-588)4059245-5 gnd Fehlertoleranz (DE-588)4123192-2 gnd
topic_facet	IEEE standard testability method for embedded core-based integrated circuits Embedded computer systems Testing Standards Systems on a chip Testing Standards Integrated circuits Testing Standards Testen Fehlererkennung Zuverlässigkeit Fehlertoleranz
url	https://doi.org/10.1007/0-387-34609-0
volume_link	(DE-604)BV010836129
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