Physical limitations of semiconductor devices:
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York, NY
Springer
2008
|
| Subjects: | |
| Physical Description: | XIII, 330 S. Ill., graph. Darst. |
| ISBN: | 9780387745138 9780387745145 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV023091114 | ||
| 003 | DE-604 | ||
| 005 | 20080618 | ||
| 007 | t | ||
| 008 | 080121s2008 gw ad|| |||| 00||| eng d | ||
| 015 | |a 07,N33,0729 |2 dnb | ||
| 016 | 7 | |a 985051418 |2 DE-101 | |
| 020 | |a 9780387745138 |9 978-0-387-74513-8 | ||
| 020 | |a 9780387745145 |9 978-0-387-74514-5 | ||
| 024 | 3 | |a 9780387745138 | |
| 028 | 5 | 2 | |a 12028962 |
| 035 | |a (OCoLC)172979451 | ||
| 035 | |a (DE-599)DNB985051418 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-703 |a DE-1050 |a DE-92 | ||
| 050 | 0 | |a TK7871.85 | |
| 082 | 0 | |a 621.38152 |2 22 | |
| 084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
| 084 | |a 620 |2 sdnb | ||
| 100 | 1 | |a Vashchenko, Vladislav A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Physical limitations of semiconductor devices |c V. A. Vashchenko ; V. F. Sinkevitch |
| 264 | 1 | |a New York, NY |b Springer |c 2008 | |
| 300 | |a XIII, 330 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Semiconductors | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 650 | 4 | |a Semiconductors |x Reliability | |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Versagen |0 (DE-588)4258790-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Reliabilität |0 (DE-588)4213628-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Versagen |0 (DE-588)4258790-6 |D s |
| 689 | 0 | 2 | |a Reliabilität |0 (DE-588)4213628-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Sinkevitch, V. F. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-016293978 | ||
Record in the Search Index
| _version_ | 1804137344017629184 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author | Vashchenko, Vladislav A. Sinkevitch, V. F. |
| author_facet | Vashchenko, Vladislav A. Sinkevitch, V. F. |
| author_role | aut aut |
| author_sort | Vashchenko, Vladislav A. |
| author_variant | v a v va vav v f s vf vfs |
| building | Verbundindex |
| bvnumber | BV023091114 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4800 |
| ctrlnum | (OCoLC)172979451 (DE-599)DNB985051418 |
| dewey-full | 621.38152 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38152 |
| dewey-search | 621.38152 |
| dewey-sort | 3621.38152 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01642nam a2200505 c 4500</leader><controlfield tag="001">BV023091114</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20080618 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">080121s2008 gw ad|| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">07,N33,0729</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">985051418</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387745138</subfield><subfield code="9">978-0-387-74513-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780387745145</subfield><subfield code="9">978-0-387-74514-5</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9780387745138</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">12028962</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)172979451</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB985051418</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.38152</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4800</subfield><subfield code="0">(DE-625)157408:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">620</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Vashchenko, Vladislav A.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Physical limitations of semiconductor devices</subfield><subfield code="c">V. A. Vashchenko ; V. F. Sinkevitch</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY</subfield><subfield code="b">Springer</subfield><subfield code="c">2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 330 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Versagen</subfield><subfield code="0">(DE-588)4258790-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Reliabilität</subfield><subfield code="0">(DE-588)4213628-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterbauelement</subfield><subfield code="0">(DE-588)4113826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Versagen</subfield><subfield code="0">(DE-588)4258790-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Reliabilität</subfield><subfield code="0">(DE-588)4213628-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sinkevitch, V. F.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016293978</subfield></datafield></record></collection> |
| id | DE-604.BV023091114 |
| illustrated | Illustrated |
| index_date | 2024-07-02T19:40:59Z |
| indexdate | 2024-07-09T21:10:48Z |
| institution | BVB |
| isbn | 9780387745138 9780387745145 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016293978 |
| oclc_num | 172979451 |
| open_access_boolean | |
| owner | DE-703 DE-1050 DE-92 |
| owner_facet | DE-703 DE-1050 DE-92 |
| physical | XIII, 330 S. Ill., graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer |
| record_format | marc |
| spelling | Vashchenko, Vladislav A. Verfasser aut Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch New York, NY Springer 2008 XIII, 330 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Versagen (DE-588)4258790-6 gnd rswk-swf Reliabilität (DE-588)4213628-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Versagen (DE-588)4258790-6 s Reliabilität (DE-588)4213628-3 s DE-604 Sinkevitch, V. F. Verfasser aut |
| spellingShingle | Vashchenko, Vladislav A. Sinkevitch, V. F. Physical limitations of semiconductor devices Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement (DE-588)4113826-0 gnd Versagen (DE-588)4258790-6 gnd Reliabilität (DE-588)4213628-3 gnd |
| subject_GND | (DE-588)4113826-0 (DE-588)4258790-6 (DE-588)4213628-3 |
| title | Physical limitations of semiconductor devices |
| title_auth | Physical limitations of semiconductor devices |
| title_exact_search | Physical limitations of semiconductor devices |
| title_exact_search_txtP | Physical limitations of semiconductor devices |
| title_full | Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch |
| title_fullStr | Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch |
| title_full_unstemmed | Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch |
| title_short | Physical limitations of semiconductor devices |
| title_sort | physical limitations of semiconductor devices |
| topic | Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement (DE-588)4113826-0 gnd Versagen (DE-588)4258790-6 gnd Reliabilität (DE-588)4213628-3 gnd |
| topic_facet | Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement Versagen Reliabilität |
| work_keys_str_mv | AT vashchenkovladislava physicallimitationsofsemiconductordevices AT sinkevitchvf physicallimitationsofsemiconductordevices |