Physical limitations of semiconductor devices:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Springer
2008
|
| Schlagworte: | |
| Beschreibung: | XIII, 330 S. Ill., graph. Darst. |
| ISBN: | 9780387745138 9780387745145 |
Internformat
MARC
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|---|---|---|---|
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| 020 | |a 9780387745138 |9 978-0-387-74513-8 | ||
| 020 | |a 9780387745145 |9 978-0-387-74514-5 | ||
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| 100 | 1 | |a Vashchenko, Vladislav A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Physical limitations of semiconductor devices |c V. A. Vashchenko ; V. F. Sinkevitch |
| 264 | 1 | |a New York, NY |b Springer |c 2008 | |
| 300 | |a XIII, 330 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Semiconductors | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 650 | 4 | |a Semiconductors |x Reliability | |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Versagen |0 (DE-588)4258790-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Reliabilität |0 (DE-588)4213628-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Versagen |0 (DE-588)4258790-6 |D s |
| 689 | 0 | 2 | |a Reliabilität |0 (DE-588)4213628-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Sinkevitch, V. F. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-016293978 | ||
Datensatz im Suchindex
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| author | Vashchenko, Vladislav A. Sinkevitch, V. F. |
| author_facet | Vashchenko, Vladislav A. Sinkevitch, V. F. |
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| author_sort | Vashchenko, Vladislav A. |
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| building | Verbundindex |
| bvnumber | BV023091114 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
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| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4800 |
| ctrlnum | (OCoLC)172979451 (DE-599)DNB985051418 |
| dewey-full | 621.38152 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38152 |
| dewey-search | 621.38152 |
| dewey-sort | 3621.38152 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV023091114 |
| illustrated | Illustrated |
| index_date | 2024-07-02T19:40:59Z |
| indexdate | 2024-07-09T21:10:48Z |
| institution | BVB |
| isbn | 9780387745138 9780387745145 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016293978 |
| oclc_num | 172979451 |
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| owner_facet | DE-703 DE-1050 DE-92 |
| physical | XIII, 330 S. Ill., graph. Darst. |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer |
| record_format | marc |
| spelling | Vashchenko, Vladislav A. Verfasser aut Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch New York, NY Springer 2008 XIII, 330 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Versagen (DE-588)4258790-6 gnd rswk-swf Reliabilität (DE-588)4213628-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Versagen (DE-588)4258790-6 s Reliabilität (DE-588)4213628-3 s DE-604 Sinkevitch, V. F. Verfasser aut |
| spellingShingle | Vashchenko, Vladislav A. Sinkevitch, V. F. Physical limitations of semiconductor devices Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement (DE-588)4113826-0 gnd Versagen (DE-588)4258790-6 gnd Reliabilität (DE-588)4213628-3 gnd |
| subject_GND | (DE-588)4113826-0 (DE-588)4258790-6 (DE-588)4213628-3 |
| title | Physical limitations of semiconductor devices |
| title_auth | Physical limitations of semiconductor devices |
| title_exact_search | Physical limitations of semiconductor devices |
| title_exact_search_txtP | Physical limitations of semiconductor devices |
| title_full | Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch |
| title_fullStr | Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch |
| title_full_unstemmed | Physical limitations of semiconductor devices V. A. Vashchenko ; V. F. Sinkevitch |
| title_short | Physical limitations of semiconductor devices |
| title_sort | physical limitations of semiconductor devices |
| topic | Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement (DE-588)4113826-0 gnd Versagen (DE-588)4258790-6 gnd Reliabilität (DE-588)4213628-3 gnd |
| topic_facet | Semiconductors Semiconductors Defects Semiconductors Reliability Halbleiterbauelement Versagen Reliabilität |
| work_keys_str_mv | AT vashchenkovladislava physicallimitationsofsemiconductordevices AT sinkevitchvf physicallimitationsofsemiconductordevices |