Verfügbarkeit: Microstructural characterization of materials

Microstructural characterization of materials:

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Bibliographische Detailangaben
Hauptverfasser:	Brandon, David G. (VerfasserIn), Kaplan, Wayne D. (VerfasserIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	Chichester [u.a.] Wiley 2008
Ausgabe:	2. ed.
Schriftenreihe:	Quantitative software engineering series
Schlagworte:	Materiais Microscopia Materials > Microscopy Microstructure Mikrostruktur Festkörperoberfläche Mikroskopie Strukturanalyse Spektroskopie Röntgenstrukturanalyse Werkstoff Materialcharakterisierung Mikroanalyse
Online-Zugang:	Inhaltsverzeichnis
Beschreibung:	Hier auch später erschienene, unveränderte Nachdrucke
Beschreibung:	XIV, 536 S. zahlr. Ill., graph. Darst.
ISBN:	9780470027851 9780470027844

Internformat

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Datensatz im Suchindex

_version_	1804137334087614464
adam_text	MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS 2ND EDITION DAVID BRANDON AND WAYNE D. KAPLAN TECHNION, ISRAEL INSTITUTE OF TECHNOLOGY, ISRAEL JOHN WILEY & SONS, LTD CONTENTS PREFACE TO THE SECOND EDITION XI PREFACE TO THE FIRST EDITION XIII 1 THE CONCEPT OF MICROSTRUCTURE 1 1.1 MICROSTRUCTURAL FEATURES 7 1.1.1 STRUCTURE-PROPERTY RELATIONSHIPS 7 1.1.2 MICROSTRUCTURAL SCALE 10 1.1.3 MICROSTRUCTURAL PARAMETERS 19 1.2 CRYSTALLOGRAPHY AND CRYSTAL STRUCTURE 24 1.2.1 INTERATOMIC BONDING IN SOLIDS 25 1.2.2 CRYSTALLINE AND AMORPHOUS PHASES 30 1.2.3 THE CRYSTAL LATTICE 30 SUMMARY 42 BIBLIOGRAPHY 46 WORKED EXAMPLES 46 PROBLEMS 51 2 DIFFRACTION ANALYSIS OF CRYSTAL STRUCTURE 55 2.1 SCATTERING OF RADIATION BY CRYSTALS 56 2.1.1 THE LAUE EQUATIONS AND BRAGG S LAW 56 2.1.2 ALLOWED AND FORBIDDEN REFLECTIONS 59 2.2 RECIPROCAL SPACE 60 2.2.1 THE LIMITING SPHERE CONSTRUCTION 60 2.2.2 VECTOR REPRESENTATION OF BRAGG S LAW 61 2.2.3 THE RECIPROCAL LATTICE 61 2.3 X-RAY DIFFRACTION METHODS 63 2.3.1 THE X-RAY DIFFRACTOMETER 67 2.3.2 POWDER DIFFRACTION-PARTICLES AND POLYCRYSTALS 73 2.3.3 SINGLE CRYSTAL LAUE DIFFRACTION 76 2.3.4 ROTATING SINGLE CRYSTAL METHODS 78 2.4 DIFFRACTION ANALYSIS 79 2.4.1 ATOMIC SCATTERING FACTORS 80 2.4.2 SCATTERING BY THE UNIT CELL 81 2.4.3 THE STRUCTURE FACTOR IN THE COMPLEX PLANE 83 2.4.4 INTERPRETATION OF DIFFRACTED INTENSITIES 84 2.4.5 ERRORS AND ASSUMPTIONS 85 2.5 ELECTRON DIFFRACTION 90 2.5.1 WAVE PROPERTIES OF ELECTRONS 91 CONTENTS 2.5.2 RING PATTERNS, SPOT PATTERNS AND LAUE ZONES 2.5.3 KIKUCHI PATTERNS AND THEIR INTERPRETATION SUMMARY BIBLIOGRAPHY WORKED EXAMPLES PROBLEMS OPTICAL MICROSCOPY 3.1 GEOMETRICAL OPTICS 3.1.1 OPTICAL IMAGE FORMATION 3.1.2 RESOLUTION IN THE OPTICAL MICROSCOPE 3.1.3 DEPTH OF FIELD AND DEPTH OF FOCUS 3.2 CONSTRUCTION OF THE MICROSCOPE 3.2.1 LIGHT SOURCES AND CONDENSER SYSTEMS 3.2.2 THE SPECIMEN STAGE 3.2.3 SELECTION OF OBJECTIVE LENSES 3.2.4 IMAGE OBSERVATION AND RECORDING 3.3 SPECIMEN PREPARATION 3.3.1 SAMPLING AND SECTIONING 3.3.2 MOUNTING AND GRINDING 3.3.3 POLISHING AND ETCHING METHODS 3.4 IMAGE CONTRAST 3.4.1 REFLECTION AND ABSORPTION OF LIGHT 3.4.2 BRIGHT-FIELD AND DARK-FIELD IMAGE CONTRAST 3.4.3 CONFOCAL MICROSCOPY 3.4.4 INTERFERENCE CONTRAST AND INTERFERENCE MICROSCOPY 3.4.5 OPTICAL ANISOTROPY AND POLARIZED LIGHT 3.4.6 PHASE CONTRAST MICROSCOPY 3.5 WORKING WITH DIGITAL IMAGES 3.5.1 DATA COLLECTION AND THE OPTICAL SYSTEM 3.5.2 DATA PROCESSING AND ANALYSIS 3.5.3 DATA STORAGE AND PRESENTATION 3.5.4 DYNAMIC RANGE AND DIGITAL STORAGE 3.6 RESOLUTION, CONTRAST AND IMAGE INTERPRETATION SUMMARY BIBLIOGRAPHY WORKED EXAMPLES PROBLEMS TRANSMISSION ELECTRON MICROSCOPY 4.1 BASIC PRINCIPLES 4.1.1 WAVE PROPERTIES OF ELECTRONS 4.1.2 RESOLUTION LIMITATIONS AND LENS ABERRATIONS 4.1.3 COMPARATIVE PERFORMANCE OF TRANSMISSION AND SCANNIN ELECTRON MICROSCOPY CONTENTS VII 4.2 SPECIMEN PREPARATION 194 4.2.1 MECHANICAL THINNING 195 4.2.2 ELECTROCHEMICAL THINNING 198 4.2.3 ION MILLING 199 4.2.4 SPUTTER COATING AND CARBON COATING 201 4.2.5 REPLICA METHODS 202 4.3 THE ORIGIN OF CONTRAST 203 4.3.1 MASS-THICKNESS CONTRAST 205 4.3.2 DIFFRACTION CONTRAST AND CRYSTAL LATTICE DEFECTS 205 4.3.3 PHASE CONTRAST AND LATTICE IMAGING 207 4.4 KINEMATIC INTERPRETATION OF DIFFRACTION CONTRAST 213 4.4.1 KINEMATIC THEORY OF ELECTRON DIFFRACTION 213 4.4.2 THE AMPLITUDE-PHASE DIAGRAM 213 4.4.3 CONTRAST FROM LATTICE DEFECTS 215 4.4.4 STACKING FAULTS AND ANTI-PHASE BOUNDARIES 216 4.4.5 EDGE AND SCREW DISLOCATIONS 218 4.4.6 POINT DILATATIONS AND COHERENCY STRAINS 219 4.5 DYNAMIC DIFFRACTION AND ABSORPTION EFFECTS 221 4.5.1 STACKING FAULTS REVISITED 227 4.5.2 QUANTITATIVE ANALYSIS OF CONTRAST 230 4.6 LATTICE IMAGING AT HIGH RESOLUTION 230 4.6.1 THE LATTICE IMAGE AND THE CONTRAST TRANSFER FUNCTION 230 4.6.2 COMPUTER SIMULATION OF LATTICE IMAGES 231 4.6.3 LATTICE IMAGE INTERPRETATION 232 4.7 SCANNING TRANSMISSION ELECTRON MICROSCOPY 234 SUMMARY 236 BIBLIOGRAPHY 238 WORKED EXAMPLES 238 PROBLEMS 247 SCANNING ELECTRON MICROSCOPY 261 5.1 COMPONENTS OF THE SCANNING ELECTRON MICROSCOPE 262 5.2 ELECTRON BEAM-SPECIMEN INTERACTIONS 264 5.2.1 BEAM-FOCUSING CONDITIONS 265 5.2.2 INELASTIC SCATTERING AND ENERGY LOSSES 266 5.3 ELECTRON EXCITATION OF X-RAYS 269 5.3.1 CHARACTERISTIC X-RAY IMAGES 271 5.4 BACKSCATTERED ELECTRONS 277 5.4.1 IMAGE CONTRAST IN BACKSCATTERED ELECTRON IMAGES 279 5.5 SECONDARY ELECTRON EMISSION 280 5.5.1 FACTORS AFFECTING SECONDARY ELECTRON EMISSION 283 5.5.2 SECONDARY ELECTRON IMAGE CONTRAST 286 5.6 ALTERNATIVE IMAGING MODES 288 5.6.1 CATHODOLUMINESCENCE 288 5.6.2 ELECTRON BEAM INDUCED CURRENT 288 5.6.3 ORIENTATION IMAGING MICROSCOPY 289 VIII CONTENTS 5.6.4 ELECTRON BACKSCATTERED DIFFRACTION PATTERNS 289 5.6.5 OIM RESOLUTION AND SENSITIVITY 291 5.6.6 LOCALIZED PREFERRED ORIENTATION AND RESIDUAL STRESS 292 5.7 SPECIMEN PREPARATION AND TOPOLOGY 294 5.7.1 SPUTTER COATING AND CONTRAST ENHANCEMENT 295 5.7.2 FRACTOGRAPHY AND FAILURE ANALYSIS 295 5.7.3 STEREOSCOPIC IMAGING 298 5.7.4 PARALLAX MEASUREMENTS 298 5.8 FOCUSED ION BEAM MICROSCOPY 301 5.8.1 PRINCIPLES OF OPERATION AND MICROSCOPE CONSTRUCTION 302 5.8.2 ION BEAM-SPECIMEN INTERACTIONS 304 5.8.3 DUAL-BEAM FIB SYSTEMS 306 5.8.4 MACHINING AND DEPOSITION 306 5.8.5 TEM SPECIMEN PREPARATION 310 5.8.6 SERIAL SECTIONING 314 SUMMARY 315 BIBLIOGRAPHY 318 WORKED EXAMPLES 318 PROBLEMS 326 6 MICROANALYSIS IN ELECTRON MICROSCOPY 333 6.1 X-RAY MICROANALYSIS 334 6.1.1 EXCITATION OF CHARACTERISTIC X-RAYS 334 6.1.2 DETECTION OF CHARACTERISTIC X-RAYS 338 6.1.3 QUANTITATIVE ANALYSIS OF COMPOSITION 343 6.2 ELECTRON ENERGY LOSS SPECTROSCOPY 357 6.2.1 THE ELECTRON ENERGY-LOSS SPECTRUM 360 6.2.2 LIMITS OF DETECTION AND RESOLUTION IN EELS 361 6.2.3 QUANTITATIVE ELECTRON ENERGY LOSS ANALYSIS 364 6.2.4 NEAR-EDGE FINE STRUCTURE INFORMATION 365 6.2.5 FAR-EDGE FINE STRUCTURE INFORMATION 366 6.2.6 ENERGY-FILTERED TRANSMISSION ELECTRON MICROSCOPY 367 SUMMARY 370 BIBLIOGRAPHY 375 WORKED EXAMPLES 375 PROBLEMS 386 7 SCANNING PROBE MICROSCOPY AND RELATED TECHNIQUES 391 7.1 SURFACE FORCES AND SURFACE MORPHOLOGY 392 7.1.1 SURFACE FORCES AND THEIR ORIGIN 392 7.1.2 SURFACE FORCE MEASUREMENTS 396 7.1.3 SURFACE MORPHOLOGY: ATOMIC AND LATTICE RESOLUTION 397 7.2 SCANNING PROBE MICROSCOPES 400 7.2.1 ATOMIC FORCE MICROSCOPY 403 7.2.2 SCANNING TUNNELLING MICROSCOPY 410 7.3 FIELD-ION MICROSCOPY AND ATOM PROBE TOMOGRAPHY 413 CONTENTS IX 7.3.1 IDENTIFYING ATOMS BY FIELD EVAPORATION 414 7.3.2 THE ATOM PROBE AND ATOM PROBE TOMOGRAPHY 416 SUMMARY 417 BIBLIOGRAPHY 420 PROBLEMS 420 8 CHEMICAL ANALYSIS OF SURFACE COMPOSITION 423 8.1 X-RAY PHOTOELECTRON SPECTROSCOPY 424 8.1.1 DEPTH DISCRIMINATION 426 8.1.2 CHEMICAL BINDING STATES 428 8.1.3 INSTRUMENTAL REQUIREMENTS 429 8.1.4 APPLICATIONS 431 8.2 AUGER ELECTRON SPECTROSCOPY 431 8.2.1 SPATIAL RESOLUTION AND DEPTH DISCRIMINATION 433 8.2.2 RECORDING AND PRESENTATION OF SPECTRA 434 8.2.3 IDENTIFICATION OF CHEMICAL BINDING STATES 435 8.2.4 QUANTITATIVE AUGER ANALYSIS 436 8.2.5 DEPTH PROFILING 437 8.2.6 AUGER IMAGING 438 8.3 SECONDARY-ION MASS SPECTROMETRY 440 8.3.1 SENSITIVITY AND RESOLUTION 442 8.3.2 CALIBRATION AND QUANTITATIVE ANALYSIS 444 8.3.3 SIMS IMAGING 445 SUMMARY 446 BIBLIOGRAPHY 448 WORKED EXAMPLES 448 PROBLEMS 453 9 QUANTITATIVE AND TOMOGRAPHIE ANALYSIS OF MICROSTRUETURE 457 9.1 BASIC STEREOLOGICAL CONCEPTS 458 9.1.1 ISOTROPY AND ANISOTROPY 459 9.1.2 HOMOGENEITY AND INHOMOGENEITY 461 9.1.3 SAMPLING AND SECTIONING 463 9.1.4 STATISTICS AND PROBABILITY 466 9.2 ACCESSIBLE AND INACCESSIBLE PARAMETERS 467 9.2.1 ACCESSIBLE PARAMETERS 468 9.2.2 INACCESSIBLE PARAMETERS 476 9.3 OPTIMIZING ACCURACY 481 9.3.1 SAMPLE SIZE AND COUNTING TIME 483 9.3.2 RESOLUTION AND DETECTION ERRORS 485 9.3.3 SAMPLE THICKNESS CORRECTIONS 487 9.3.4 OBSERVER BIAS 489 9.3.5 DISLOCATION DENSITY REVISITED 490 9.4 AUTOMATED IMAGE ANALYSIS 491 9.4.1 DIGITAL IMAGE RECORDING 494 9.4.2 STATISTICAL SIGNIFICANCE AND MICROSTRUCTURAL RELEVANCE 495 X CONTENTS 9.5 TOMOGRAPHY AND THREE-DIMENSIONAL RECONSTRUCTION 495 9.5.1 PRESENTATION OF TOMOGRAPHIE DATA 496 9.5.2 METHODS OF SERIAL SECTIONING 498 9.5.3 THREE-DIMENSIONAL RECONSTRUCTION 499 SUMMARY 500 BIBLIOGRAPHY 503 WORKED EXAMPLES 503 PROBLEMS 514 APPENDICES 517 APPENDIX 1: USEFUL EQUATIONS 517 INTERPLANAR SPACINGS 517 UNIT CELL VOLUMES 518 INTERPLANAR ANGLES 518 DIRECTION PERPENDICULAR TO A CRYSTAL PLANE 519 HEXAGONAL UNIT CELLS 520. THE ZONE AXIS OF TWO PLANES IN THE HEXAGONAL SYSTEM 521 APPENDIX 2: WAVELENGTHS 521 RELATIVISTIC ELECTRON WAVELENGTHS 521 X-RAY WAVELENGTHS FOR TYPICAL X-RAY SOURCES 521 INDEX 523
adam_txt	MICROSTRUCTURAL CHARACTERIZATION OF MATERIALS 2ND EDITION DAVID BRANDON AND WAYNE D. KAPLAN TECHNION, ISRAEL INSTITUTE OF TECHNOLOGY, ISRAEL JOHN WILEY & SONS, LTD CONTENTS PREFACE TO THE SECOND EDITION XI PREFACE TO THE FIRST EDITION XIII 1 THE CONCEPT OF MICROSTRUCTURE 1 1.1 MICROSTRUCTURAL FEATURES 7 1.1.1 STRUCTURE-PROPERTY RELATIONSHIPS 7 1.1.2 MICROSTRUCTURAL SCALE 10 1.1.3 MICROSTRUCTURAL PARAMETERS 19 1.2 CRYSTALLOGRAPHY AND CRYSTAL STRUCTURE 24 1.2.1 INTERATOMIC BONDING IN SOLIDS 25 1.2.2 CRYSTALLINE AND AMORPHOUS PHASES 30 1.2.3 THE CRYSTAL LATTICE 30 SUMMARY 42 BIBLIOGRAPHY 46 WORKED EXAMPLES 46 PROBLEMS 51 2 DIFFRACTION ANALYSIS OF CRYSTAL STRUCTURE 55 2.1 SCATTERING OF RADIATION BY CRYSTALS 56 2.1.1 THE LAUE EQUATIONS AND BRAGG'S LAW 56 2.1.2 ALLOWED AND FORBIDDEN REFLECTIONS 59 2.2 RECIPROCAL SPACE 60 2.2.1 THE LIMITING SPHERE CONSTRUCTION 60 2.2.2 VECTOR REPRESENTATION OF BRAGG'S LAW 61 2.2.3 THE RECIPROCAL LATTICE 61 2.3 X-RAY DIFFRACTION METHODS 63 2.3.1 THE X-RAY DIFFRACTOMETER 67 2.3.2 POWDER DIFFRACTION-PARTICLES AND POLYCRYSTALS 73 2.3.3 SINGLE CRYSTAL LAUE DIFFRACTION 76 2.3.4 ROTATING SINGLE CRYSTAL METHODS 78 2.4 DIFFRACTION ANALYSIS 79 2.4.1 ATOMIC SCATTERING FACTORS 80 2.4.2 SCATTERING BY THE UNIT CELL 81 2.4.3 THE STRUCTURE FACTOR IN THE COMPLEX PLANE 83 2.4.4 INTERPRETATION OF DIFFRACTED INTENSITIES 84 2.4.5 ERRORS AND ASSUMPTIONS 85 2.5 ELECTRON DIFFRACTION 90 2.5.1 WAVE PROPERTIES OF ELECTRONS 91 CONTENTS 2.5.2 RING PATTERNS, SPOT PATTERNS AND LAUE ZONES 2.5.3 KIKUCHI PATTERNS AND THEIR INTERPRETATION SUMMARY BIBLIOGRAPHY WORKED EXAMPLES PROBLEMS OPTICAL MICROSCOPY 3.1 GEOMETRICAL OPTICS 3.1.1 OPTICAL IMAGE FORMATION 3.1.2 RESOLUTION IN THE OPTICAL MICROSCOPE 3.1.3 DEPTH OF FIELD AND DEPTH OF FOCUS 3.2 CONSTRUCTION OF THE MICROSCOPE 3.2.1 LIGHT SOURCES AND CONDENSER SYSTEMS 3.2.2 THE SPECIMEN STAGE 3.2.3 SELECTION OF OBJECTIVE LENSES 3.2.4 IMAGE OBSERVATION AND RECORDING 3.3 SPECIMEN PREPARATION 3.3.1 SAMPLING AND SECTIONING 3.3.2 MOUNTING AND GRINDING 3.3.3 POLISHING AND ETCHING METHODS 3.4 IMAGE CONTRAST 3.4.1 REFLECTION AND ABSORPTION OF LIGHT 3.4.2 BRIGHT-FIELD AND DARK-FIELD IMAGE CONTRAST 3.4.3 CONFOCAL MICROSCOPY 3.4.4 INTERFERENCE CONTRAST AND INTERFERENCE MICROSCOPY 3.4.5 OPTICAL ANISOTROPY AND POLARIZED LIGHT 3.4.6 PHASE CONTRAST MICROSCOPY 3.5 WORKING WITH DIGITAL IMAGES 3.5.1 DATA COLLECTION AND THE OPTICAL SYSTEM 3.5.2 DATA PROCESSING AND ANALYSIS 3.5.3 DATA STORAGE AND PRESENTATION 3.5.4 DYNAMIC RANGE AND DIGITAL STORAGE 3.6 RESOLUTION, CONTRAST AND IMAGE INTERPRETATION SUMMARY BIBLIOGRAPHY WORKED EXAMPLES PROBLEMS TRANSMISSION ELECTRON MICROSCOPY 4.1 BASIC PRINCIPLES 4.1.1 WAVE PROPERTIES OF ELECTRONS 4.1.2 RESOLUTION LIMITATIONS AND LENS ABERRATIONS 4.1.3 COMPARATIVE PERFORMANCE OF TRANSMISSION AND SCANNIN ELECTRON MICROSCOPY CONTENTS VII 4.2 SPECIMEN PREPARATION 194 4.2.1 MECHANICAL THINNING 195 4.2.2 ELECTROCHEMICAL THINNING 198 4.2.3 ION MILLING 199 4.2.4 SPUTTER COATING AND CARBON COATING 201 4.2.5 REPLICA METHODS 202 4.3 THE ORIGIN OF CONTRAST 203 4.3.1 MASS-THICKNESS CONTRAST 205 4.3.2 DIFFRACTION CONTRAST AND CRYSTAL LATTICE DEFECTS 205 4.3.3 PHASE CONTRAST AND LATTICE IMAGING 207 4.4 KINEMATIC INTERPRETATION OF DIFFRACTION CONTRAST 213 4.4.1 KINEMATIC THEORY OF ELECTRON DIFFRACTION 213 4.4.2 THE AMPLITUDE-PHASE DIAGRAM 213 4.4.3 CONTRAST FROM LATTICE DEFECTS 215 4.4.4 STACKING FAULTS AND ANTI-PHASE BOUNDARIES 216 4.4.5 EDGE AND SCREW DISLOCATIONS 218 4.4.6 POINT DILATATIONS AND COHERENCY STRAINS 219 4.5 DYNAMIC DIFFRACTION AND ABSORPTION EFFECTS 221 4.5.1 STACKING FAULTS REVISITED 227 4.5.2 QUANTITATIVE ANALYSIS OF CONTRAST 230 4.6 LATTICE IMAGING AT HIGH RESOLUTION 230 4.6.1 THE LATTICE IMAGE AND THE CONTRAST TRANSFER FUNCTION 230 4.6.2 COMPUTER SIMULATION OF LATTICE IMAGES 231 4.6.3 LATTICE IMAGE INTERPRETATION 232 4.7 SCANNING TRANSMISSION ELECTRON MICROSCOPY 234 SUMMARY 236 BIBLIOGRAPHY 238 WORKED EXAMPLES 238 PROBLEMS 247 SCANNING ELECTRON MICROSCOPY 261 5.1 COMPONENTS OF THE SCANNING ELECTRON MICROSCOPE 262 5.2 ELECTRON BEAM-SPECIMEN INTERACTIONS 264 5.2.1 BEAM-FOCUSING CONDITIONS 265 5.2.2 INELASTIC SCATTERING AND ENERGY LOSSES 266 5.3 ELECTRON EXCITATION OF X-RAYS 269 5.3.1 CHARACTERISTIC X-RAY IMAGES 271 5.4 BACKSCATTERED ELECTRONS 277 5.4.1 IMAGE CONTRAST IN BACKSCATTERED ELECTRON IMAGES 279 5.5 SECONDARY ELECTRON EMISSION 280 5.5.1 FACTORS AFFECTING SECONDARY ELECTRON EMISSION 283 5.5.2 SECONDARY ELECTRON IMAGE CONTRAST 286 5.6 ALTERNATIVE IMAGING MODES 288 5.6.1 CATHODOLUMINESCENCE 288 5.6.2 ELECTRON BEAM INDUCED CURRENT 288 5.6.3 ORIENTATION IMAGING MICROSCOPY 289 VIII CONTENTS 5.6.4 ELECTRON BACKSCATTERED DIFFRACTION PATTERNS 289 5.6.5 OIM RESOLUTION AND SENSITIVITY 291 5.6.6 LOCALIZED PREFERRED ORIENTATION AND RESIDUAL STRESS 292 5.7 SPECIMEN PREPARATION AND TOPOLOGY 294 5.7.1 SPUTTER COATING AND CONTRAST ENHANCEMENT 295 5.7.2 FRACTOGRAPHY AND FAILURE ANALYSIS 295 5.7.3 STEREOSCOPIC IMAGING 298 5.7.4 PARALLAX MEASUREMENTS 298 5.8 FOCUSED ION BEAM MICROSCOPY 301 5.8.1 PRINCIPLES OF OPERATION AND MICROSCOPE CONSTRUCTION 302 5.8.2 ION BEAM-SPECIMEN INTERACTIONS 304 5.8.3 DUAL-BEAM FIB SYSTEMS 306 5.8.4 MACHINING AND DEPOSITION 306 5.8.5 TEM SPECIMEN PREPARATION 310 5.8.6 SERIAL SECTIONING 314 SUMMARY 315 BIBLIOGRAPHY 318 WORKED EXAMPLES 318 PROBLEMS 326 6 MICROANALYSIS IN ELECTRON MICROSCOPY 333 6.1 X-RAY MICROANALYSIS 334 6.1.1 EXCITATION OF CHARACTERISTIC X-RAYS 334 6.1.2 DETECTION OF CHARACTERISTIC X-RAYS 338 6.1.3 QUANTITATIVE ANALYSIS OF COMPOSITION 343 6.2 ELECTRON ENERGY LOSS SPECTROSCOPY 357 6.2.1 THE ELECTRON ENERGY-LOSS SPECTRUM 360 6.2.2 LIMITS OF DETECTION AND RESOLUTION IN EELS 361 6.2.3 QUANTITATIVE ELECTRON ENERGY LOSS ANALYSIS 364 6.2.4 NEAR-EDGE FINE STRUCTURE INFORMATION 365 6.2.5 FAR-EDGE FINE STRUCTURE INFORMATION 366 6.2.6 ENERGY-FILTERED TRANSMISSION ELECTRON MICROSCOPY 367 SUMMARY 370 BIBLIOGRAPHY 375 WORKED EXAMPLES 375 PROBLEMS 386 7 SCANNING PROBE MICROSCOPY AND RELATED TECHNIQUES 391 7.1 SURFACE FORCES AND SURFACE MORPHOLOGY 392 7.1.1 SURFACE FORCES AND THEIR ORIGIN 392 7.1.2 SURFACE FORCE MEASUREMENTS 396 7.1.3 SURFACE MORPHOLOGY: ATOMIC AND LATTICE RESOLUTION 397 7.2 SCANNING PROBE MICROSCOPES 400 7.2.1 ATOMIC FORCE MICROSCOPY 403 7.2.2 SCANNING TUNNELLING MICROSCOPY 410 7.3 FIELD-ION MICROSCOPY AND ATOM PROBE TOMOGRAPHY 413 CONTENTS IX 7.3.1 IDENTIFYING ATOMS BY FIELD EVAPORATION 414 7.3.2 THE ATOM PROBE AND ATOM PROBE TOMOGRAPHY 416 SUMMARY 417 BIBLIOGRAPHY 420 PROBLEMS 420 8 CHEMICAL ANALYSIS OF SURFACE COMPOSITION 423 8.1 X-RAY PHOTOELECTRON SPECTROSCOPY 424 8.1.1 DEPTH DISCRIMINATION 426 8.1.2 CHEMICAL BINDING STATES 428 8.1.3 INSTRUMENTAL REQUIREMENTS 429 8.1.4 APPLICATIONS 431 8.2 AUGER ELECTRON SPECTROSCOPY 431 8.2.1 SPATIAL RESOLUTION AND DEPTH DISCRIMINATION 433 8.2.2 RECORDING AND PRESENTATION OF SPECTRA 434 8.2.3 IDENTIFICATION OF CHEMICAL BINDING STATES 435 8.2.4 QUANTITATIVE AUGER ANALYSIS 436 8.2.5 DEPTH PROFILING 437 8.2.6 AUGER IMAGING 438 8.3 SECONDARY-ION MASS SPECTROMETRY 440 8.3.1 SENSITIVITY AND RESOLUTION 442 8.3.2 CALIBRATION AND QUANTITATIVE ANALYSIS 444 8.3.3 SIMS IMAGING 445 SUMMARY 446 BIBLIOGRAPHY 448 WORKED EXAMPLES 448 PROBLEMS 453 9 QUANTITATIVE AND TOMOGRAPHIE ANALYSIS OF MICROSTRUETURE 457 9.1 BASIC STEREOLOGICAL CONCEPTS 458 9.1.1 ISOTROPY AND ANISOTROPY 459 9.1.2 HOMOGENEITY AND INHOMOGENEITY 461 9.1.3 SAMPLING AND SECTIONING 463 9.1.4 STATISTICS AND PROBABILITY 466 9.2 ACCESSIBLE AND INACCESSIBLE PARAMETERS 467 9.2.1 ACCESSIBLE PARAMETERS 468 9.2.2 INACCESSIBLE PARAMETERS 476 9.3 OPTIMIZING ACCURACY 481 9.3.1 SAMPLE SIZE AND COUNTING TIME 483 9.3.2 RESOLUTION AND DETECTION ERRORS 485 9.3.3 SAMPLE THICKNESS CORRECTIONS 487 9.3.4 OBSERVER BIAS 489 9.3.5 DISLOCATION DENSITY REVISITED 490 9.4 AUTOMATED IMAGE ANALYSIS 491 9.4.1 DIGITAL IMAGE RECORDING 494 9.4.2 STATISTICAL SIGNIFICANCE AND MICROSTRUCTURAL RELEVANCE 495 X CONTENTS 9.5 TOMOGRAPHY AND THREE-DIMENSIONAL RECONSTRUCTION 495 9.5.1 PRESENTATION OF TOMOGRAPHIE DATA 496 9.5.2 METHODS OF SERIAL SECTIONING 498 9.5.3 THREE-DIMENSIONAL RECONSTRUCTION 499 SUMMARY 500 BIBLIOGRAPHY 503 WORKED EXAMPLES 503 PROBLEMS 514 APPENDICES 517 APPENDIX 1: USEFUL EQUATIONS 517 INTERPLANAR SPACINGS 517 UNIT CELL VOLUMES 518 INTERPLANAR ANGLES 518 DIRECTION PERPENDICULAR TO A CRYSTAL PLANE 519 HEXAGONAL UNIT CELLS 520. THE ZONE AXIS OF TWO PLANES IN THE HEXAGONAL SYSTEM 521 APPENDIX 2: WAVELENGTHS 521 RELATIVISTIC ELECTRON WAVELENGTHS 521 X-RAY WAVELENGTHS FOR TYPICAL X-RAY SOURCES 521 INDEX 523
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illustrated	Illustrated
index_date	2024-07-02T19:38:41Z
indexdate	2024-07-09T21:10:38Z
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language	English
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spelling	Brandon, David G. Verfasser aut Microstructural characterization of materials David Brandon and Wayne D. Kaplan 2. ed. Chichester [u.a.] Wiley 2008 XIV, 536 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Quantitative software engineering series Hier auch später erschienene, unveränderte Nachdrucke Materiais larpcal Microscopia larpcal Materials Microscopy Microstructure Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Strukturanalyse (DE-588)4183787-3 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Materialcharakterisierung (DE-588)4720368-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Materialcharakterisierung (DE-588)4720368-7 s Mikrostruktur (DE-588)4131028-7 s DE-604 Werkstoff (DE-588)4065579-9 s Strukturanalyse (DE-588)4183787-3 s 1\p DE-604 Festkörperoberfläche (DE-588)4127823-9 s 2\p DE-604 Mikroskopie (DE-588)4039238-7 s 3\p DE-604 Mikroanalyse (DE-588)4169804-6 s 4\p DE-604 Spektroskopie (DE-588)4056138-0 s 5\p DE-604 Röntgenstrukturanalyse (DE-588)4137203-7 s 6\p DE-604 Kaplan, Wayne D. Verfasser aut GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016287623&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Brandon, David G. Kaplan, Wayne D. Microstructural characterization of materials Materiais larpcal Microscopia larpcal Materials Microscopy Microstructure Mikrostruktur (DE-588)4131028-7 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Mikroskopie (DE-588)4039238-7 gnd Strukturanalyse (DE-588)4183787-3 gnd Spektroskopie (DE-588)4056138-0 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Werkstoff (DE-588)4065579-9 gnd Materialcharakterisierung (DE-588)4720368-7 gnd Mikroanalyse (DE-588)4169804-6 gnd
subject_GND	(DE-588)4131028-7 (DE-588)4127823-9 (DE-588)4039238-7 (DE-588)4183787-3 (DE-588)4056138-0 (DE-588)4137203-7 (DE-588)4065579-9 (DE-588)4720368-7 (DE-588)4169804-6
title	Microstructural characterization of materials
title_auth	Microstructural characterization of materials
title_exact_search	Microstructural characterization of materials
title_exact_search_txtP	Microstructural characterization of materials
title_full	Microstructural characterization of materials David Brandon and Wayne D. Kaplan
title_fullStr	Microstructural characterization of materials David Brandon and Wayne D. Kaplan
title_full_unstemmed	Microstructural characterization of materials David Brandon and Wayne D. Kaplan
title_short	Microstructural characterization of materials
title_sort	microstructural characterization of materials
topic	Materiais larpcal Microscopia larpcal Materials Microscopy Microstructure Mikrostruktur (DE-588)4131028-7 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Mikroskopie (DE-588)4039238-7 gnd Strukturanalyse (DE-588)4183787-3 gnd Spektroskopie (DE-588)4056138-0 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Werkstoff (DE-588)4065579-9 gnd Materialcharakterisierung (DE-588)4720368-7 gnd Mikroanalyse (DE-588)4169804-6 gnd
topic_facet	Materiais Microscopia Materials Microscopy Microstructure Mikrostruktur Festkörperoberfläche Mikroskopie Strukturanalyse Spektroskopie Röntgenstrukturanalyse Werkstoff Materialcharakterisierung Mikroanalyse
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016287623&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT brandondavidg microstructuralcharacterizationofmaterials AT kaplanwayned microstructuralcharacterizationofmaterials

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