Polar oxides: properties, characterization, and imaging
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| Beschreibung: | 387 S. Ill., graph. Darst. 25 cm |
| ISBN: | 3527405321 9783527405329 |
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| 245 | 1 | 0 | |a Polar oxides |b properties, characterization, and imaging |c ed. by R. Waser ... |
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| 300 | |a 387 S. |b Ill., graph. Darst. |c 25 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Ceramic materials |v Congresses | |
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| 700 | 1 | |a Waser, Rainer |d 1955- |0 (DE-588)113442491 |4 edt | |
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Datensatz im Suchindex
| _version_ | 1804137315100000256 |
|---|---|
| adam_text | Contents
1
Dielectric Properties of
Polar Oxides
(U.
Böttger) 11
1.1
Introduction
................................... 11
1.2
Dielectric polarization
............................. 13
1.2.1
Macroscopic and microscopic view
.................. 13
1.2.2
Mechanisms of polarization
...................... 15
1.3
Ferroelectric polarization
............................ 17
1.4
Theory of Ferroelectric Phase Transition
.................... 18
1.4.1
Ginzburg-Landau Theory
........................ 18
1.4.2
Soft Mode Concept
........................... 22
1.5
Ferroelectric Materials
............................. 24
1.5.1
Basic Compositions
.......................... 24
1.5.2
Grain Size effects
............................ 26
1.5.3
Influence of Substitutes and Dopants
.................. 27
1
.6
Ferroelectric Domains
............................. 30
1.6.1
Reversible and Irreversible Polarization Contributions
........ 32
1.6.2
Ferroelectric Switching
......................... 35
Bibliography
..................................... 37
2
Piezoelectric Characterization (S. Trolier-McKinstry)
39
2.
1 Important piezoelectric constants
........................ 39
2.2
Measurements in bulk materials
........................ 43
2.3
Measurements in thin films
........................... 46
2.4
Conclusions
................................... 50
Bibliography
..................................... 52
3
Electrical Characterization of Ferroelectrics
(Κ. Ρ
гите, Т.
Schmitz,
S. Tiedke)
53
3.1
Introduction
................................... 53
3.2
Measurement methods
............................. 53
3.2.1
Sawyer Tower method
......................... 56
3.2.2
Shunt method
.............................. 57
3.2.3
Virtual ground method
......................... 57
3.2.4
Current step method
.......................... 58
3.3
Measurement types
............................... 58
3.3.1
Hysteresis loop and characteristic values
................ 58
3.3.2
Dynamic hysteresis measurement
................... 59
Contents
3.3.3 Pulse
measurement
........................... 61
3.3.4
Static hysteresis measurement
..................... 63
3.3.5
Leakage measurement
......................... 65
3.3.6
Fatigue measurement
.......................... 66
3.3.7
Imprint measurement
.......................... 68
3.3.8
Retention measurement
......................... 71
3.3.9
Small signal measurements
....................... 73
Bibliography
..................................... 74
Optical Characterization of Ferroelectric Materials (C.
Buchal)
77
4.1
Introduction: Light propagation within anisotropic crystals
.......... 77
4.1.1
Huyghens s construction for
uniaxial
crystals
............. 78
4.1.2
The
uniaxial
indicatrix
......................... 80
4.1.3
The biaxial indicatrix
.......................... 83
4.2
The electro-optic effect
............................. 83
4.2.1
Ferroelectrics have anisotropic electronic bonds: Birefringence
. ... 84
4.2.2
Applied fields change the optical pathlength: Phase modulators
... 87
4.2.3
Optical waveguides improve the device efficiency
........... 89
4.3
Non-linear optics
................................ 93
4.3.1
Nonlinear optical media
........................ 94
4.3.2
The nonlinear wave equation
...................... 95
4.3.3
Second order nonlinear optics
..................... 96
Bibliography
..................................... 98
Microwave Properties and Measurement Techniques (N. Klein)
99
5.1
Introduction
................................... 99
5.2
Basic relations defining microwave properties of dielectrics
and normal/superconducting metals
...................... 100
5.3
Surface impedance of normal metals
...................... 101
5.4
Surface impedance of high-temperature superconductor films
......... 101
5.5
Microwave properties of dielectric single crystals, ceramics and thin films
. . 103
5.6
General remarks about microwave material measurements
.......... 108
5.7
Non
resonant microwave measurement techniques
............... 109
5.8
Resonator measurement techniques
....................... 110
5.9
Conclusions
................................... 117
Bibliography
..................................... 117
Advanced X-ray Analysis of Ferroelectrics
(K.
Saito,
T.
Kurosawa,
T.
Akai,
S. Yokoyama, H.
Morioka,
H.
Funakubo)
119
6.1
Introduction
................................... 119
6.2
Experimental
.................................. 122
6.2.1
X-ray diffractometer
.......................... 122
6.2.2
Method of X-ray diffraction
...................... 122
6.2.3
Sample preparation
........................... 127
6.3
Results and discussion
............................. 127
Contents
5
6.3.1
Structural characterization of PZT
52/48
thin film
........... 127
6.3.2
Distinguishing
S
BTN phase from fluorite-SBTN phase
........ 131
6.3.3
Grazing incidence X-ray diffraction study on PZT
52/48
thin films
. . 132
6.4
Conclusions
................................... 134
Bibliography
..................................... 135
7
Characterization of PZT-Ceramics by High-Resolution
Х
-Ray Analysis
(M. J. Hoffmann, H. Kungl, J.-Th. Reszat, S. Wagner)
137
7.1
Introduction
................................... 137
7.2
Experimental
.................................. 138
7.3
Results and discussion
............................. 139
7.3.1
Quantitative analysis of the FT and
Fu
phase content
........ 139
7.3.2
Temperature induced Fr
<->
Ft phase transition
........... 142
7.3.3
Analysis of intrinsic and extrinsic contributions to the macroscopic
strain
.................................. 145
7.4
Summary
.................................... 149
Bibliography
..................................... 150
8
In-Situ Synchrotron X-ray Studies of Processing and Physics of Ferroelectric
Thin Films
(G. B. Stephenson. S. K. Streiffer, D. D. Fong, M. V.
Ramana
Murty, O. Auciello, P. H.
Fuoss, J. A. Eastman,
A. Munkholm, C.
Thompson)
151
8.1
Introduction
................................... 151
8.2
Growth of ultrathin ferroelectric films
..................... 152
8.3
Observation of nanoscale
180°
stripe domains
................. 154
Bibliography
..................................... 160
9
Characterization of Polar Oxides by Photo-Induced Light Scattering
(M. Imlau, M. Goulkov, M. Fully, Th. Woike)
163
9.1
Introduction
................................... 163
9.2
Fundamentals
.................................. 165
9.2.1
Therelaxor-ferroelectric SrxBai_xNb206
............... 165
9.2.2
Observation of photo-induced light scattering in SBN
......... 167
9.2.3
Description of photo-induced light scattering in SBN
......... 168
9.3
Experimental
.................................. 172
9.3.1
Experimental setup
........................... 172
9.3.2
Spatial distribution of the scattering intensity
............. 173
9.3.3
Investigating the relaxor-kind phase transition
............. 174
9.3.4
Determination of material parameters: gain factor
Г,
effective electro-
optic coefficient (C
·
reff) and effective trap density JV^
....... 177
9.3.5
Investigating ferroelectric properties
.................. 179
9.3.6
Investigating the polar structure
.................... 180
9.4
Summary
.................................... 186
Bibliography
..................................... 187
Contents
10
Ferroelectric Domain Breakdown: Application to Nanodomain Technology
(G. Rosenman,
A. Agwnin, D. Dahan, M. Shvebelman, E.
Weinbrandt,
M. Molotskii,
Y.
Rosenwaks)
189
10.1
Introduction
................................... 190
10.2
Nanodomain size limitations
.......................... 191
10.2.1
Technological demands for FE domain-based devices
......... 191
10.2.2
Physical limit of domain dimensions in FE
............... 192
10.3
AFM nanodomain tailoring technology
..................... 193
10.3.1
Nanoscale switching electrode
..................... 193
10.3.2
Low and high voltage AFM for nanodomain reversal in FE bulk crystals
195
10.3.3
Indirect electron beam induced ferroelectric domain breakdown
. . . 198
10.4
Ferroelectric domain breakdown
........................ 202
10.4.1
Domain shapes under FD
в
....................... 202
10.4.2
The domain shape invariant
...................... 206
10.4.3
Theory and experimental data of
F
DB
effect
.............. 208
10.4.4
Ferroelectric domain breakdown mechanism
............. 208
10.5
Nanodomain superlattices tailored by multiple tip arrays of HVAFM
...... 210
10.6
Conclusions
................................... 216
Bibliography
..................................... 217
11
Pyroelectric Ceramics and Thin Films:
Characterization, Properties and Selection
(/?.
W. Whatmore)
221
11.1
Introduction
................................... 221
11.2
The physics of pyroelectric detectors
...................... 222
11.2.1
Pyroelectric response
.......................... 222
11.2.2
Comparison of noise and signal
.................... 225
11.2.3
Other sources of noise
......................... 226
11.2.4
The piezoelectric effect in pyroelectric detectors
........... 226
11.3
Measurement of physical parameters
...................... 227
11.3.1
Dielectric properties
.......................... 227
11.3.2
Pyroelectric properties
......................... 228
11.3.3
Electrical resistivity
.......................... 231
11.3.4
Thermal properties
........................... 231
11.3.5
Piezoelectric property determination
.................. 231
11.4
Pyroelectric materials and their selection
.................... 232
11.5
Pyroelectric ceramics and thin films
...................... 234
11.6
Conclusions
................................... 238
Bibliography
..................................... 238
12
Nano-inspection of Dielectric and Polarization Properties at Inner and Outer In¬
terfaces in PZT Thin Films (L. M.
Eng) 241
12.1
Introduction
................................... 241
12.2
Methods
..................................... 242
12.2.1
Piezoresponse force microscopy (PFM)
................ 242
12.2.2
Kelvin Probe Force Microscopy (KPFM)
................ 242
Contents
η
12.2.3
Pull-off force
spectroscopy (PFS).................... 243
12.3
Materials
.................................... 244
12.4
Results
...................................... 244
12.4.1
Polarization profile across the PZT film
................ 244
12.4.2
Relaxation dynamics within the PZT film
............... 247
12.4.3
Local dielectric constant at the PZT surface
.............. 247
12.5
Conlusion
.................................... 248
Bibliography
..................................... 249
13
Piezoelectric Relaxation and Nonlinearity investigated by Optical
Interferometry
and Dynamic Press Technique (D. Damjanovic)
251
13.1
Introduction
................................... 251
13.2
Measurement techniques
............................ 252
13.2.1
Optical techniques for measurements of the converse effect
...... 252
13.2.2
Dynamic press for the measurements of direct effect
......... 254
13.3
Investigation of the piezoelectric nonlinearity in PZT thin films using optical
interferometry
.................................. 255
13.4
Investigation of the piezoelectric relaxation in ferroelectric ceramics using dy¬
namic press
................................... 257
13.4.1
Maxwell-Wagner piezoelectric relaxation and clockwise hysteresis
. . 257
13.4.2
Piezoelectric relaxation and Kramers-Kronig relations in a modified
lead titanate composition
........................ 258
13.4.3
Evidence of creep-like piezoelectric response in soft PZT ceramics
. 259
Bibliography
..................................... 261
14
Chaotic Behavior near the Ferroelectric Phase Transition
(H. Beige, M. Diestelhorsu R.
Habet) 263
14.1
Introduction
................................... 263
14.2
Dielectric nonlinear series-resonance circuit
.................. 263
14.3
Nonlinear nature of the resonant system
.................... 264
14.4
Tools of the nonlinear dynamics
........................ 264
14.5
Experimental representation of phase portraits
................. 265
14.6
Comparison of calculated and experimentally observed phase portraits
.... 266
14.7
Controlling chaos
................................ 269
14.8
Summary
.................................... 273
Bibliography
..................................... 274
15
Relaxor Ferroelectrics
-
from Random Field Models to Glassy Relaxation and
Domain States
(W.
Kleemann,
G.
A. Samara,
J.
Dec)
275
15.1
Introduction
................................... 275
15.2
Polar nanoregions
................................ 279
15.3
Cubic relaxors
.................................. 283
15.4
Role of pressure
................................. 285
15.5
Dynamics of the dipolar slowing-down process
................ 288
8 Contents
15.6
Uniaxial relaxors
................................ 291
15.7 Domain
dynamics
in uniaxial relaxors..................... 292
Bibliography .....................................
299
16
Scanning Nonlinear Dielectric Microscope (Y. Cho)
303
16.1
Introduction
................................... 303
16.2
Nonlinear dielectric imaging with sub-nanometer resolution
......... 304
16.2.1
Principle and theory for SNDM
.................... 304
16.2.2
Nonlinear dielectric imaging
...................... 306
16.2.3
Comparison between SNDM imaging and piezo-response imaging
. . 308
16.2.4
Observation of domain walls in PZT thin film using SNDM
...... 310
16.3
Higher order nonlinear dielectric microscopy
................. 312
16.3.1
Theory for higher order nonlinear dielectric microscopy
....... 313
16.3.2
Experimental details of higher order nonlinear dielectric microscopy
. 314
16.4
Three-dimensional measurement technique
.................. 316
16.4.1
Principle and measurement system
................... 316
16.4.2
Experimental results
.......................... 317
16.5
Ultra High-Density Ferroelectric Data Storage Using Scanning Nonlinear Di¬
electric Microscopy
............................... 319
16.5.1
SNDM domain engineering system
................... 320
16.5.2
Nano-domain formation in LiTaOs single crystal
........... 320
16.6
Conclusions
................................... 324
Bibliography
..................................... 327
17
Electrical Characterization of Ferroelectric Properties in the Sub-Micrometer
Scale (T.
Schmitz,
S.
Tiedke,
К.
Prwne,
К.
Szot, A. Roelofs)
329
17.1
Introduction
................................... 329
1
7.2 Sample
preparation
............................... 330
17.3
Contact problems
................................ 332
17.4
Parasitic capacitance
.............................. 336
17.5
In-situ compensation
.............................. 337
Bibliography
..................................... 341
18
Searching the Ferroelectric Limit by pfm
(A. Roelofs, T.
Schneller,
U.
Böttger, K.
Szot, R.
Weiser) 343
18.1
Introduction
................................... 343
18.2
PolyCrystalline ferroelectric PTO thin films on platinized silicon substrates
. . 344
18.3
Separated lead titanate nano-grains
....................... 348
18.4
Conclusion
................................... 352
Bibliography
..................................... 353
19
Piezoelectric Studies at
Submicron
and
Nano
Scale
(E. L.
Colla,
I. Stolichnov)
355
19.1
Introduction
................................... 355
19.1.1
Fatigue in FeRAM: macroscopic results invoking
nano
scale features
. 355
Contents
9
19.1.2
Piezoelectric characterization at
nano
scale of ferroelectric thin films
. 359
19.2
Investigating cycling induced suppression of switchable polarization in FeCaps
361
19.2.1
Appearance of frozen polarization
nano
domains
........... 361
19.2.2
Nano
scale hysteresis loops of fatigued FeCaps
............ 364
19.3
Size effect on the polarization patterns in //-sized ferroelectric film capacitors
367
19.3.1
Downscaling of ferroelectric capacitors
................ 367
19.3.2
Size induced polarization instability
.................. 368
19.4
Direct observation of inversely-polarized frozen nanodomains in fatigued Fe¬
Caps
....................................... 371
19.4.1
Removable electrodes
......................... 371
19.4.2
Inversely-polarized nanodomains
................... 372
Bibliography
..................................... 377
Authors
379
Index
381
|
| adam_txt |
Contents
1
Dielectric Properties of
Polar Oxides
(U.
Böttger) 11
1.1
Introduction
. 11
1.2
Dielectric polarization
. 13
1.2.1
Macroscopic and microscopic view
. 13
1.2.2
Mechanisms of polarization
. 15
1.3
Ferroelectric polarization
. 17
1.4
Theory of Ferroelectric Phase Transition
. 18
1.4.1
Ginzburg-Landau Theory
. 18
1.4.2
Soft Mode Concept
. 22
1.5
Ferroelectric Materials
. 24
1.5.1
Basic Compositions
. 24
1.5.2
Grain Size effects
. 26
1.5.3
Influence of Substitutes and Dopants
. 27
1
.6
Ferroelectric Domains
. 30
1.6.1
Reversible and Irreversible Polarization Contributions
. 32
1.6.2
Ferroelectric Switching
. 35
Bibliography
. 37
2
Piezoelectric Characterization (S. Trolier-McKinstry)
39
2.
1 Important piezoelectric constants
. 39
2.2
Measurements in bulk materials
. 43
2.3
Measurements in thin films
. 46
2.4
Conclusions
. 50
Bibliography
. 52
3
Electrical Characterization of Ferroelectrics
(Κ. Ρ
гите, Т.
Schmitz,
S. Tiedke)
53
3.1
Introduction
. 53
3.2
Measurement methods
. 53
3.2.1
Sawyer Tower method
. 56
3.2.2
Shunt method
. 57
3.2.3
Virtual ground method
. 57
3.2.4
Current step method
. 58
3.3
Measurement types
. 58
3.3.1
Hysteresis loop and characteristic values
. 58
3.3.2
Dynamic hysteresis measurement
. 59
Contents
3.3.3 Pulse
measurement
. 61
3.3.4
Static hysteresis measurement
. 63
3.3.5
Leakage measurement
. 65
3.3.6
Fatigue measurement
. 66
3.3.7
Imprint measurement
. 68
3.3.8
Retention measurement
. 71
3.3.9
Small signal measurements
. 73
Bibliography
. 74
Optical Characterization of Ferroelectric Materials (C.
Buchal)
77
4.1
Introduction: Light propagation within anisotropic crystals
. 77
4.1.1
Huyghens's construction for
uniaxial
crystals
. 78
4.1.2
The
uniaxial
indicatrix
. 80
4.1.3
The biaxial indicatrix
. 83
4.2
The electro-optic effect
. 83
4.2.1
Ferroelectrics have anisotropic electronic bonds: Birefringence
. . 84
4.2.2
Applied fields change the optical pathlength: Phase modulators
. 87
4.2.3
Optical waveguides improve the device efficiency
. 89
4.3
Non-linear optics
. 93
4.3.1
Nonlinear optical media
. 94
4.3.2
The nonlinear wave equation
. 95
4.3.3
Second order nonlinear optics
. 96
Bibliography
. 98
Microwave Properties and Measurement Techniques (N. Klein)
99
5.1
Introduction
. 99
5.2
Basic relations defining microwave properties of dielectrics
and normal/superconducting metals
. 100
5.3
Surface impedance of normal metals
. 101
5.4
Surface impedance of high-temperature superconductor films
. 101
5.5
Microwave properties of dielectric single crystals, ceramics and thin films
. . 103
5.6
General remarks about microwave material measurements
. 108
5.7
Non
resonant microwave measurement techniques
. 109
5.8
Resonator measurement techniques
. 110
5.9
Conclusions
. 117
Bibliography
. 117
Advanced X-ray Analysis of Ferroelectrics
(K.
Saito,
T.
Kurosawa,
T.
Akai,
S. Yokoyama, H.
Morioka,
H.
Funakubo)
119
6.1
Introduction
. 119
6.2
Experimental
. 122
6.2.1
X-ray diffractometer
. 122
6.2.2
Method of X-ray diffraction
. 122
6.2.3
Sample preparation
. 127
6.3
Results and discussion
. 127
Contents
5
6.3.1
Structural characterization of PZT
52/48
thin film
. 127
6.3.2
Distinguishing
S
BTN phase from fluorite-SBTN phase
. 131
6.3.3
Grazing incidence X-ray diffraction study on PZT
52/48
thin films
. . 132
6.4
Conclusions
. 134
Bibliography
. 135
7
Characterization of PZT-Ceramics by High-Resolution
Х
-Ray Analysis
(M. J. Hoffmann, H. Kungl, J.-Th. Reszat, S. Wagner)
137
7.1
Introduction
. 137
7.2
Experimental
. 138
7.3
Results and discussion
. 139
7.3.1
Quantitative analysis of the FT and
Fu
phase content
. 139
7.3.2
Temperature induced Fr
<->
Ft phase transition
. 142
7.3.3
Analysis of intrinsic and extrinsic contributions to the macroscopic
strain
. 145
7.4
Summary
. 149
Bibliography
. 150
8
In-Situ Synchrotron X-ray Studies of Processing and Physics of Ferroelectric
Thin Films
(G. B. Stephenson. S. K. Streiffer, D. D. Fong, M. V.
Ramana
Murty, O. Auciello, P. H.
Fuoss, J. A. Eastman,
A. Munkholm, C.
Thompson)
151
8.1
Introduction
. 151
8.2
Growth of ultrathin ferroelectric films
. 152
8.3
Observation of nanoscale
180°
stripe domains
. 154
Bibliography
. 160
9
Characterization of Polar Oxides by Photo-Induced Light Scattering
(M. Imlau, M. Goulkov, M. Fully, Th. Woike)
163
9.1
Introduction
. 163
9.2
Fundamentals
. 165
9.2.1
Therelaxor-ferroelectric SrxBai_xNb206
. 165
9.2.2
Observation of photo-induced light scattering in SBN
. 167
9.2.3
Description of photo-induced light scattering in SBN
. 168
9.3
Experimental
. 172
9.3.1
Experimental setup
. 172
9.3.2
Spatial distribution of the scattering intensity
. 173
9.3.3
Investigating the relaxor-kind phase transition
. 174
9.3.4
Determination of material parameters: gain factor
Г,
effective electro-
optic coefficient (C
·
reff) and effective trap density JV^
. 177
9.3.5
Investigating ferroelectric properties
. 179
9.3.6
Investigating the polar structure
. 180
9.4
Summary
. 186
Bibliography
. 187
"
Contents
10
Ferroelectric Domain Breakdown: Application to Nanodomain Technology
(G. Rosenman,
A. Agwnin, D. Dahan, M. Shvebelman, E.
Weinbrandt,
M. Molotskii,
Y.
Rosenwaks)
189
10.1
Introduction
. 190
10.2
Nanodomain size limitations
. 191
10.2.1
Technological demands for FE domain-based devices
. 191
10.2.2
Physical limit of domain dimensions in FE
. 192
10.3
AFM nanodomain tailoring technology
. 193
10.3.1
Nanoscale switching electrode
. 193
10.3.2
Low and high voltage AFM for nanodomain reversal in FE bulk crystals
195
10.3.3
Indirect electron beam induced ferroelectric domain breakdown
. . . 198
10.4
Ferroelectric domain breakdown
. 202
10.4.1
Domain shapes under FD
в
. 202
10.4.2
The domain shape invariant
. 206
10.4.3
Theory and experimental data of
F
DB
effect
. 208
10.4.4
Ferroelectric domain breakdown mechanism
. 208
10.5
Nanodomain superlattices tailored by multiple tip arrays of HVAFM
. 210
10.6
Conclusions
. 216
Bibliography
. 217
11
Pyroelectric Ceramics and Thin Films:
Characterization, Properties and Selection
(/?.
W. Whatmore)
221
11.1
Introduction
. 221
11.2
The physics of pyroelectric detectors
. 222
11.2.1
Pyroelectric response
. 222
11.2.2
Comparison of noise and signal
. 225
11.2.3
Other sources of noise
. 226
11.2.4
The piezoelectric effect in pyroelectric detectors
. 226
11.3
Measurement of physical parameters
. 227
11.3.1
Dielectric properties
. 227
11.3.2
Pyroelectric properties
. 228
11.3.3
Electrical resistivity
. 231
11.3.4
Thermal properties
. 231
11.3.5
Piezoelectric property determination
. 231
11.4
Pyroelectric materials and their selection
. 232
11.5
Pyroelectric ceramics and thin films
. 234
11.6
Conclusions
. 238
Bibliography
. 238
12
Nano-inspection of Dielectric and Polarization Properties at Inner and Outer In¬
terfaces in PZT Thin Films (L. M.
Eng) 241
12.1
Introduction
. 241
12.2
Methods
. 242
12.2.1
Piezoresponse force microscopy (PFM)
. 242
12.2.2
Kelvin Probe Force Microscopy (KPFM)
. 242
Contents
η
12.2.3
Pull-off force
spectroscopy (PFS). 243
12.3
Materials
. 244
12.4
Results
. 244
12.4.1
Polarization profile across the PZT film
. 244
12.4.2
Relaxation dynamics within the PZT film
. 247
12.4.3
Local dielectric constant at the PZT surface
. 247
12.5
Conlusion
. 248
Bibliography
. 249
13
Piezoelectric Relaxation and Nonlinearity investigated by Optical
Interferometry
and Dynamic Press Technique (D. Damjanovic)
251
13.1
Introduction
. 251
13.2
Measurement techniques
. 252
13.2.1
Optical techniques for measurements of the converse effect
. 252
13.2.2
Dynamic press for the measurements of direct effect
. 254
13.3
Investigation of the piezoelectric nonlinearity in PZT thin films using optical
interferometry
. 255
13.4
Investigation of the piezoelectric relaxation in ferroelectric ceramics using dy¬
namic press
. 257
13.4.1
Maxwell-Wagner piezoelectric relaxation and clockwise hysteresis
. . 257
13.4.2
Piezoelectric relaxation and Kramers-Kronig relations in a modified
lead titanate composition
. 258
13.4.3
Evidence of creep-like piezoelectric response in soft PZT ceramics
. 259
Bibliography
. 261
14
Chaotic Behavior near the Ferroelectric Phase Transition
(H. Beige, M. Diestelhorsu R.
Habet) 263
14.1
Introduction
. 263
14.2
Dielectric nonlinear series-resonance circuit
. 263
14.3
Nonlinear nature of the resonant system
. 264
14.4
Tools of the nonlinear dynamics
. 264
14.5
Experimental representation of phase portraits
. 265
14.6
Comparison of calculated and experimentally observed phase portraits
. 266
14.7
Controlling chaos
. 269
14.8
Summary
. 273
Bibliography
. 274
15
Relaxor Ferroelectrics
-
from Random Field Models to Glassy Relaxation and
Domain States
(W.
Kleemann,
G.
A. Samara,
J.
Dec)
275
15.1
Introduction
. 275
15.2
Polar nanoregions
. 279
15.3
Cubic relaxors
. 283
15.4
Role of pressure
. 285
15.5
Dynamics of the dipolar slowing-down process
. 288
8 Contents
15.6
Uniaxial relaxors
. 291
15.7 Domain
dynamics
in uniaxial relaxors. 292
Bibliography .
299
16
Scanning Nonlinear Dielectric Microscope (Y. Cho)
303
16.1
Introduction
. 303
16.2
Nonlinear dielectric imaging with sub-nanometer resolution
. 304
16.2.1
Principle and theory for SNDM
. 304
16.2.2
Nonlinear dielectric imaging
. 306
16.2.3
Comparison between SNDM imaging and piezo-response imaging
. . 308
16.2.4
Observation of domain walls in PZT thin film using SNDM
. 310
16.3
Higher order nonlinear dielectric microscopy
. 312
16.3.1
Theory for higher order nonlinear dielectric microscopy
. 313
16.3.2
Experimental details of higher order nonlinear dielectric microscopy
. 314
16.4
Three-dimensional measurement technique
. 316
16.4.1
Principle and measurement system
. 316
16.4.2
Experimental results
. 317
16.5
Ultra High-Density Ferroelectric Data Storage Using Scanning Nonlinear Di¬
electric Microscopy
. 319
16.5.1
SNDM domain engineering system
. 320
16.5.2
Nano-domain formation in LiTaOs single crystal
. 320
16.6
Conclusions
. 324
Bibliography
. 327
17
Electrical Characterization of Ferroelectric Properties in the Sub-Micrometer
Scale (T.
Schmitz,
S.
Tiedke,
К.
Prwne,
К.
Szot, A. Roelofs)
329
17.1
Introduction
. 329
1
7.2 Sample
preparation
. 330
17.3
Contact problems
. 332
17.4
Parasitic capacitance
. 336
17.5
In-situ compensation
. 337
Bibliography
. 341
18
Searching the Ferroelectric Limit by pfm
(A. Roelofs, T.
Schneller,
U.
Böttger, K.
Szot, R.
Weiser) 343
18.1
Introduction
. 343
18.2
PolyCrystalline ferroelectric PTO thin films on platinized silicon substrates
. . 344
18.3
Separated lead titanate nano-grains
. 348
18.4
Conclusion
. 352
Bibliography
. 353
19
Piezoelectric Studies at
Submicron
and
Nano
Scale
(E. L.
Colla,
I. Stolichnov)
355
19.1
Introduction
. 355
19.1.1
Fatigue in FeRAM: macroscopic results invoking
nano
scale features
. 355
Contents
9
19.1.2
Piezoelectric characterization at
nano
scale of ferroelectric thin films
. 359
19.2
Investigating cycling induced suppression of switchable polarization in FeCaps
361
19.2.1
Appearance of frozen polarization
nano
domains
. 361
19.2.2
Nano
scale hysteresis loops of fatigued FeCaps
. 364
19.3
Size effect on the polarization patterns in //-sized ferroelectric film capacitors
367
19.3.1
Downscaling of ferroelectric capacitors
. 367
19.3.2
Size induced polarization instability
. 368
19.4
Direct observation of inversely-polarized frozen nanodomains in fatigued Fe¬
Caps
. 371
19.4.1
Removable electrodes
. 371
19.4.2
Inversely-polarized nanodomains
. 372
Bibliography
. 377
Authors
379
Index
381 |
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| discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
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| illustrated | Illustrated |
| index_date | 2024-07-02T19:33:14Z |
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| spelling | Polar oxides properties, characterization, and imaging ed. by R. Waser ... Weinheim Wiley-VCH-Verl. 2005 387 S. Ill., graph. Darst. 25 cm txt rdacontent n rdamedia nc rdacarrier Literaturangaben Ceramic materials Congresses Ferroelektrikum (DE-588)4154121-2 gnd rswk-swf Oxidkeramik (DE-588)4173025-2 gnd rswk-swf Elektrische Polarisation (DE-588)4281432-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2003 Capri gnd-content Ferroelektrikum (DE-588)4154121-2 s Oxidkeramik (DE-588)4173025-2 s Elektrische Polarisation (DE-588)4281432-7 s DE-604 Waser, Rainer 1955- (DE-588)113442491 edt Digitalisierung UB Augsburg application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016274776&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Polar oxides properties, characterization, and imaging Ceramic materials Congresses Ferroelektrikum (DE-588)4154121-2 gnd Oxidkeramik (DE-588)4173025-2 gnd Elektrische Polarisation (DE-588)4281432-7 gnd |
| subject_GND | (DE-588)4154121-2 (DE-588)4173025-2 (DE-588)4281432-7 (DE-588)1071861417 |
| title | Polar oxides properties, characterization, and imaging |
| title_auth | Polar oxides properties, characterization, and imaging |
| title_exact_search | Polar oxides properties, characterization, and imaging |
| title_exact_search_txtP | Polar oxides properties, characterization, and imaging |
| title_full | Polar oxides properties, characterization, and imaging ed. by R. Waser ... |
| title_fullStr | Polar oxides properties, characterization, and imaging ed. by R. Waser ... |
| title_full_unstemmed | Polar oxides properties, characterization, and imaging ed. by R. Waser ... |
| title_short | Polar oxides |
| title_sort | polar oxides properties characterization and imaging |
| title_sub | properties, characterization, and imaging |
| topic | Ceramic materials Congresses Ferroelektrikum (DE-588)4154121-2 gnd Oxidkeramik (DE-588)4173025-2 gnd Elektrische Polarisation (DE-588)4281432-7 gnd |
| topic_facet | Ceramic materials Congresses Ferroelektrikum Oxidkeramik Elektrische Polarisation Konferenzschrift 2003 Capri |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016274776&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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